公开(公告)号：US08396998B2

公开(公告)日：2013-03-12

申请号：US12965699

申请日：2010-12-10

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G06F3/00 ,  G06F5/00

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US20120151287A1

公开(公告)日：2012-06-14

申请号：US12965699

申请日：2010-12-10

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G11C29/00 ,  G11C29/56

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US20130151904A1

公开(公告)日：2013-06-13

申请号：US13760948

申请日：2013-02-06

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G06F11/273

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US08738819B2

公开(公告)日：2014-05-27

申请号：US13760948

申请日：2013-02-06

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G06F3/00

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US07783447B2

公开(公告)日：2010-08-24

申请号：US11944614

申请日：2007-11-24

申请人： Ramon S. Co ,  Tat Leung Lai ,  Calvin G. Leong

发明人： Ramon S. Co ,  Tat Leung Lai ,  Calvin G. Leong

IPC分类号： G06F19/00 ,  G06F17/40

CPC分类号： B25J9/1666 ,  B25J9/16 ,  G05B19/4182 ,  Y02P90/083

摘要： Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.

摘要翻译： 两个机器人臂在测试台的分开的，不重叠的区域漫游，避免碰撞。 移动缓冲器沿着前方位置和后方位置之间的x轨道移动。 在前置位置，第一机器臂将IC芯片从输入托盘或堆叠器装载到行进缓冲器中的缓冲腔中。 移动缓冲器然后沿x轨道移动到后部位置，其中第二机器人臂将芯片从行进缓冲器移动到测试板进行测试。 在测试之后，第二机器人臂将芯片移动到第二行进缓冲器，然后第二移动缓冲器沿着轨道移动到前部位置，以由第一机器人臂卸载。 两个移动缓冲器可以在循环中的相同轨道上移动。 移动缓冲器中的缓冲腔在内部轨道上移动以在前后位置之间扩展和收缩间距和间距，以匹配测试板间距。

公开(公告)号：US20090138119A1

公开(公告)日：2009-05-28

申请号：US11944614

申请日：2007-11-24

申请人： Ramon S. Co ,  Tat Leung Lai ,  Calvin G. Leong

发明人： Ramon S. Co ,  Tat Leung Lai ,  Calvin G. Leong

IPC分类号： G06F19/00

CPC分类号： B25J9/1666 ,  B25J9/16 ,  G05B19/4182 ,  Y02P90/083

摘要： Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.

摘要翻译： 两个机器人臂在测试台的分开的，不重叠的区域漫游，避免碰撞。 移动缓冲器沿着前方位置和后方位置之间的x轨道移动。 在前置位置，第一机器臂将IC芯片从输入托盘或堆叠器装载到行进缓冲器中的缓冲腔中。 移动缓冲器然后沿x轨道移动到后部位置，其中第二机器人臂将芯片从行进缓冲器移动到测试板进行测试。 在测试之后，第二机器人臂将芯片移动到第二行进缓冲器，然后第二移动缓冲器沿着轨道移动到前部位置，以由第一机器人臂卸载。 两个移动缓冲器可以在循环中的相同轨道上移动。 移动缓冲器中的缓冲腔在内部轨道上移动以在前后位置之间扩展和收缩间距和间距，以匹配测试板间距。

公开(公告)号：US07117405B2

公开(公告)日：2006-10-03

申请号：US10249648

申请日：2003-04-28

申请人： Ramon S. Co ,  Tat Leung Lai ,  David Da-Wei Sun

发明人： Ramon S. Co ,  Tat Leung Lai ,  David Da-Wei Sun

IPC分类号： G11C29/00 ,  G06F11/00

CPC分类号： G11C29/48 ,  G11C16/04

摘要： An extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module under test. The extender card has an intercepting EEPROM chip that receives device-select lines from the motherboard. One of the device-select lines from the motherboard to a module EEPROM chip on the memory module is blocked by the extender card and altered so that the intercepting EEPROM chip is read by the motherboard rather than the module EEPROM chip. A memory configuration is read from the intercepting EEPROM chip. The memory module is tested by the motherboard using the configuration from the intercepting EEPROM chip on the extender card. The module EEPROM chip is then programmed with the configuration by altering the intercepted device-select address to select the module EEPROM chip and not the intercepting EEPROM chip.

摘要翻译： 扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收被测内存模块的测试插槽。 扩展卡具有从主板接收设备选择线的截取EEPROM芯片。 从主板到存储器模块上的模块EEPROM芯片的一个设备选择线被扩展卡阻挡，并被改变，从而拦截EEPROM芯片被主板而不是模块EEPROM芯片读取。 从截取的EEPROM芯片读取存储器配置。 内存模块由主板使用扩展卡上拦截EEPROM芯片的配置进行测试。 然后通过更改截取的器件选择地址来选择模块EEPROM芯片，而不是拦截EEPROM芯片，将模块EEPROM芯片编程为配置。

公开(公告)号：US07197676B2

公开(公告)日：2007-03-27

申请号：US10908716

申请日：2005-05-24

申请人： Ramon S. Co ,  Tat Leung Lai

发明人： Ramon S. Co ,  Tat Leung Lai

IPC分类号： G11C29/00 ,  G06F11/00

CPC分类号： G11C29/56 ,  G11C5/04 ,  G11C2029/3602 ,  G11C2029/5602

摘要： A loop-back extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module under test. An Advanced Memory Buffer (AMB) on the memory module fully buffers DRAM chips on the memory module. The AMB inputs from and outputs to the test socket differential northbound lanes (toward a processor) and southbound lanes (away from the processor). The extender card has northbound loopback traces that connect northbound lane outputs from the memory module back to northbound-lane inputs to the memory module. Southbound loopback traces connect southbound lane outputs from the memory module back to southbound-lane inputs to the memory module. The loop-back extender card allows the AMB to perform loopback testing without modifying the PC motherboard. Series/shunt resistors can be placed on the loopback traces, or serpentine traces can be used to increase loopback delays.

摘要翻译： 环回延长卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收被测内存模块的测试插槽。 存储器模块上的高级存储器缓冲器（AMB）完全缓冲存储器模块上的DRAM芯片。 AMB从测试插座差分北行车道（朝向处理器）和南行车道（远离处理器）输入和输出。 扩展卡具有北向环回路线，将来自存储模块的北行车道输出连接回北行车道输入至存储模块。 南向环回路线将内存模块的南行通道输出连接回内行模块的南行通道输入。 环回延长卡允许AMB在不修改PC主板的情况下进行环回测试。 串联/并联电阻可以放置在回送轨迹上，也可以使用蛇形轨迹来增加环回延迟。

公开(公告)号：US07111211B1

公开(公告)日：2006-09-19

申请号：US11306753

申请日：2006-01-10

申请人： Ramon S. Co ,  Tat Leung Lai ,  David Sun

发明人： Ramon S. Co ,  Tat Leung Lai ,  David Sun

IPC分类号： G11C29/00 ,  G01R31/28 ,  G01R31/02

CPC分类号： G01R31/2855 ,  G01R31/2863 ,  G01R31/31905 ,  G11C29/56 ,  G11C29/56004 ,  G11C29/56016 ,  G11C2029/2602

摘要： Two heat chambers are placed side-by-side. Heated air is blown upward through a first chamber and downward through a second heat chamber. An upper heating unit has a blower and heater that heat air exiting the first chamber and blows the heated air into the top of the second chamber. A lower heating unit has a blower and heater that heat air exiting the second chamber and blows the heated air into the top of the first chamber. Air is circulated in a loop through the two heat chambers by the two heating units. Inefficiencies from return pipes are eliminated by using the second chamber. The heated air is blown past memory modules under test in a heat chamber that has an insulated backplane. Pattern-generator cards outside the heat chamber exercise the memory modules and are cooled while memory modules in the heat chamber are heated.

摘要翻译： 两个热室并排放置。 加热空气向上穿过第一室并向下通过第二加热室。 上加热单元具有鼓风机和加热器，其加热从第一室排出的空气并将加热的空气吹入第二室的顶部。 下加热单元具有鼓风机和加热器，其加热从第二室排出的空气并将加热的空气吹入第一室的顶部。 空气通过两个加热单元通过两个加热室循环循环。 通过使用第二室来消除回流管的低效率。 被加热的空气在具有绝缘背板的加热室中被吹过被测试的存储器模块。 加热室外的图案发生器卡锻炼存储器模块，并在加热室中的存储器模块被加热时被冷却。

公开(公告)号：US06774662B2

公开(公告)日：2004-08-10

申请号：US10707639

申请日：2003-12-29

申请人： Ramon S. Co ,  Tat Leung Lai

发明人： Ramon S. Co ,  Tat Leung Lai

IPC分类号： G01R3102

CPC分类号： G11C29/48 ,  G01R31/318505 ,  G01R31/318555 ,  G11C29/02 ,  G11C2029/2602 ,  G11C2029/4402 ,  G11C2029/5006

摘要： A production test machine pre-screens panels of memory modules for shorts and leakage and other D.C. parameters. Memory modules are constructed as part of a panel of 6 or so modules formed on the same substrate. The modules are connected together by links of the substrate. The D.C. tests are performed on memory modules before separation from the panel (de-panelization), while the modules are still connected together by the panel links. Using parallel testing, a whole panel of modules can be D.C. tested at the same time. Failing modules can then be marked or noted, and the good modules separated from the panel links and sent to a more expensive A.C. tester for functional testing. The spacing or pitch of test heads on the D.C. tester can be adjusted for different sizes of panels.