公开(公告)号：US11028454B2

公开(公告)日：2021-06-08

申请号：US13120908

申请日：2009-09-24

申请人： Johan Mertens ,  Lynda Beladjal ,  Frank Devlieghere ,  Sam Verbrugghe ,  Benedikt Sas ,  Filip Du Prez ,  Tom Anthierens ,  Assia Ouchchen

发明人： Johan Mertens ,  Lynda Beladjal ,  Frank Devlieghere ,  Sam Verbrugghe ,  Benedikt Sas ,  Filip Du Prez ,  Tom Anthierens ,  Assia Ouchchen

IPC分类号： C12N11/08 ,  C12R1/07

摘要： The present application relates to methods for producing materials having viable micro-organisms incorporated therein. More particularly, the materials are produced under high temperature and/or high pressure conditions, and the micro-organisms are incorporated in the material before or during these conditions. Also provided are micro-organisms that remain viable under these conditions and have different applications, depending on the nature of the material.

公开(公告)号：US20110217758A1

公开(公告)日：2011-09-08

申请号：US13120908

申请日：2009-09-24

申请人： Johan Mertens ,  Lynda Beladjal ,  Frank Devlieghere ,  Sam Verbrugghe ,  Benedikt Sas ,  Filip Du Prez ,  Tom Anthierens ,  Assia Ouchchen

发明人： Johan Mertens ,  Lynda Beladjal ,  Frank Devlieghere ,  Sam Verbrugghe ,  Benedikt Sas ,  Filip Du Prez ,  Tom Anthierens ,  Assia Ouchchen

IPC分类号： C12N1/20 ,  B29C45/00

CPC分类号： C12R1/07 ,  C12N11/08

摘要： The present application relates to methods for producing materials having viable micro-organisms incorporated therein. More particularly, the materials are produced under high temperature and/or high pressure conditions, and the microganisms are incorporated in the material before or during these conditions. Also provided are micro-organisms that remain viable under these conditions and have different applications, depending on the nature of the material.

摘要翻译： 本申请涉及用于生产具有并入其中的活微生物的材料的方法。 更具体地说，材料是在高温和/或高压条件下生产的，并且在这些条件之前或期间将微生物并入材料中。 还提供了在这些条件下保持存活并且具有不同应用的微生物，这取决于材料的性质。

公开(公告)号：US20070207190A1

公开(公告)日：2007-09-06

申请号：US11714385

申请日：2007-03-05

申请人： William Dierickx ,  Dirk De Cuyper ,  Yvan Dierickx ,  Dirk Mertens ,  Johan Mertens ,  Lynda Beladjal

发明人： William Dierickx ,  Dirk De Cuyper ,  Yvan Dierickx ,  Dirk Mertens ,  Johan Mertens ,  Lynda Beladjal

IPC分类号： A61K35/12 ,  A61K9/70

CPC分类号： C12P7/625 ,  B29C49/221 ,  B29K2029/04 ,  B29K2077/00 ,  B29K2995/0055 ,  B29K2995/0056 ,  B29K2995/0067 ,  B29K2995/0093 ,  C12P7/00

摘要： Method for producing hydrophobic polymers, wherein a hydrophobic polymer is selected; a set of organisms is selected from among cells and/or cell products; aggregates are formed by working said cells and/or cell products in said polymers resulting in the formation of a so-called polymer-bio aggregate, wherein there is performed a new function of the thus polymer product. This invention further relates to the use of a so-called P.B.A. obtained therewith in specific applications.

摘要翻译： 制备疏水性聚合物的方法，其中选择疏水性聚合物; 从细胞和/或细胞产物中选择一组生物; 聚集体通过在所述聚合物中加工所述细胞和/或细胞产物而形成，导致所谓的聚合物 - 生物聚集体的形成，其中进行如此聚合物产物的新功能。 本发明还涉及使用所谓的P.B.A. 在具体应用中获得。

公开(公告)号：US20090207404A1

公开(公告)日：2009-08-20

申请号：US11988737

申请日：2006-07-13

申请人： Francisco Javier Tamayo De Miguel ,  Johan Mertens ,  Montserrat Calleja Gomez

发明人： Francisco Javier Tamayo De Miguel ,  Johan Mertens ,  Montserrat Calleja Gomez

IPC分类号： G01C3/00

CPC分类号： G01Q10/06 ,  G01Q20/02 ,  G01Q70/06

摘要： The system for surface inspection is arranged to detect relative displacement and/or vibration features of a plurality of points of a plurality of elements (51) forming part of a mechanical structure (5), such as a micro- or nanomechanical structure. A light beam is displaced along the mechanical structure along a first trajectory (A), so as to detect a plurality of subsequent reference positions (C) along said first trajectory (A), and the light beam is further displaced along the mechanical structure along a plurality of second trajectories (B), each of said second trajectories (B) being associated with one of said reference positions (C).The invention further relates to a corresponding method and to a program for carrying out the method.

摘要翻译： 用于表面检查的系统被布置成检测形成机械结构（5）的一部分的多个元件（51）的多个点的相对位移和/或振动特征，诸如微机械结构或纳米机械结构。 沿着机械结构沿着第一轨迹（A）移动光束，以沿着所述第一轨迹（A）检测多个随后的参考位置（C），并且光束沿机械结构进一步移位 多个第二轨迹（B），每个所述第二轨迹（B）与所述参考位置（C）中的一个相关联。 本发明还涉及相应的方法和用于执行该方法的程序。

公开(公告)号：US07978344B2

公开(公告)日：2011-07-12

申请号：US11988737

申请日：2006-07-13

申请人： Francisco Javier Tamayo De Miguel ,  Johan Mertens ,  Montserrat Calleja Gómez

发明人： Francisco Javier Tamayo De Miguel ,  Johan Mertens ,  Montserrat Calleja Gómez

IPC分类号： G01B11/14

CPC分类号： G01Q10/06 ,  G01Q20/02 ,  G01Q70/06

摘要： The system for surface inspection is arranged to detect relative displacement and/or vibration features of a plurality of points of a plurality of elements (51) forming part of a mechanical structure (5), such as a micro- or nanomechanical structure. A light beam is displaced along the mechanical structure along a first trajectory (A), so as to detect a plurality of subsequent reference positions (C) along said first trajectory (A), and the light beam is further displaced along the mechanical structure along a plurality of second trajectories (B), each of said second trajectories (B) being associated with one of said reference positions (C).The invention further relates to a corresponding method and to a program for carrying out the method.

摘要翻译： 用于表面检查的系统被布置成检测形成机械结构（5）的一部分的多个元件（51）的多个点的相对位移和/或振动特征，诸如微机械结构或纳米机械结构。 沿着机械结构沿着第一轨迹（A）移动光束，以沿着所述第一轨迹（A）检测多个随后的参考位置（C），并且光束沿机械结构进一步移位 多个第二轨迹（B），每个所述第二轨迹（B）与所述参考位置（C）中的一个相关联。 本发明还涉及相应的方法和用于执行该方法的程序。