公开(公告)号：US20050285047A1

公开(公告)日：2005-12-29

申请号：US11159978

申请日：2005-06-22

申请人： John Elmer ,  Todd Palmer ,  Alan Teruya

发明人： John Elmer ,  Todd Palmer ,  Alan Teruya

IPC分类号： G01R19/00 ,  H01J3/14 ,  H01J37/244

CPC分类号： G01R19/0061 ,  H01J37/244 ,  H01J2237/24405 ,  H01J2237/30433 ,  H01J2237/31

摘要： A system for characterizing high power electron beams at power levels of 10 kW and above is described. This system is comprised of a slit disk assembly having a multitude of radial slits, a conducting disk with the same number of radial slits located below the slit disk assembly, a Faraday cup assembly located below the conducting disk, and a start-stop target located proximate the slit disk assembly. In order to keep the system from over-heating during use, a heat sink is placed in close proximity to the components discussed above, and an active cooling system, using water, for example, can be integrated into the heat sink. During use, the high power beam is initially directed onto a start-stop target and after reaching its full power is translated around the slit disk assembly, wherein the beam enters the radial slits and the conducting disk radial slits and is detected at the Faraday cup assembly. A trigger probe assembly can also be integrated into the system in order to aid in the determination of the proper orientation of the beam during reconstruction. After passing over each of the slits, the beam is then rapidly translated back to the start-stop target to minimize the amount of time that the high power beam comes in contact with the slit disk assembly. The data obtained by the system is then transferred into a computer system, where a computer tomography algorithm is used to reconstruct the power density distribution of the beam.

摘要翻译： 描述了用于表征功率水平为10kW及以上的高功率电子束的系统。 该系统由具有多个径向狭缝的狭缝盘组件，位于狭缝盘组件下方的相同数量的径向狭缝的导电盘，位于导电盘下方的法拉第杯组件和位于 靠近狭缝盘组件。 为了在使用过程中保持系统过热，将散热器放置在紧邻上述部件的位置，并且使用例如水的主动冷却系统可以集成到散热器中。 在使用期间，高功率光束最初被引导到起停目标上，并且在达到其全部功率之后，围绕狭缝盘组件平移，其中光束进入径向狭缝和导电盘径向狭缝，并在法拉第杯 部件。 触发探针组件也可以集成到系统中，以帮助确定重建过程中光束的正确定向。 在通过每个狭缝之后，光束然后迅速地转回到启动 - 停止目标，以最小化高功率光束与狭缝盘组件接触的时间量。 然后将由系统获得的数据传送到计算机系统中，其中使用计算机断层摄影算法来重建光束的功率密度分布。

公开(公告)号：US20070210041A1

公开(公告)日：2007-09-13

申请号：US11367846

申请日：2006-03-02

申请人： John Elmer ,  Todd Palmer ,  Alan Teruya

发明人： John Elmer ,  Todd Palmer ,  Alan Teruya

IPC分类号： B23K26/00 ,  H01J3/14

CPC分类号： B23K15/0046 ,  B23K15/0013 ,  B23K15/0026 ,  H01J37/21 ,  H01J37/315 ,  H01J2237/21 ,  H01J2237/213

摘要： The present invention relates to a method and system for automatically focusing an electron beam. Such an invention is based on a Faraday Cup diagnostic system, often a Modified Faraday Cup (MFC) system that enables tomographic reconstruction of the beam so as to measure beam parameters. Such a reconstruction method and system is automated using a servo-feedback loop to determine, for example, power distributions of the beam so as to provide appropriate adjustments to system controls to enable desired beam focus conditions.

摘要翻译： 本发明涉及一种自动聚焦电子束的方法和系统。 这样的发明是基于法拉第杯诊断系统，通常是修改法拉第杯（MFC）系统，其能够进行光束的层析成像重建，以便测量光束参数。 这种重建方法和系统使用伺服反馈回路自动化来确定例如光束的功率分布，以便对系统控制提供适当的调整以实现期望的光束聚焦条件。

公开(公告)号：US20060196853A1

公开(公告)日：2006-09-07

申请号：US11173849

申请日：2005-06-30

申请人： John Elmer ,  Todd Palmer ,  Alan Teruya

发明人： John Elmer ,  Todd Palmer ,  Alan Teruya

IPC分类号： B23K15/02

CPC分类号： B23K10/00

摘要： A low power electron beam system can be utilized for micro welding, brazing, or heating a workpiece and as an imaging system for precise positioning of a micro electron beam with regard to a workpiece. A filament system produces a micro electron beam, which is then focused onto the workpiece. In the welding mode, the micro electron beam is used to melt the workpiece and produce a weld. When switched to the imaging mode, the backscattered or secondary electrons produced by the interaction between the micro electron beam and the work piece are captured and converted into an image of the workpiece. The resulting image formed from these captured electrons is used as an aid in the precise positioning of the micro electron beam and inspection of the workpiece.

摘要翻译： 低功率电子束系统可用于微焊接，钎焊或加热工件，并且可用作用于相对于工件精确定位微电子束的成像系统。 灯丝系统产生微电子束，然后将其聚焦到工件上。 在焊接模式中，微电子束用于熔化工件并产生焊缝。 当切换到成像模式时，由微电子束和工件之间的相互作用产生的背散射或二次电子被捕获并转换为工件的图像。 由这些捕获的电子形成的所得图像用于微电子束的精确定位和工件的检查。

公开(公告)号：US20060038139A1

公开(公告)日：2006-02-23

申请号：US11158481

申请日：2005-06-21

申请人： John Elmer ,  Todd Palmer ,  Alan Teruya

发明人： John Elmer ,  Todd Palmer ,  Alan Teruya

IPC分类号： G01N23/00 ,  G21K5/10

CPC分类号： H01J37/244 ,  B23K15/0026 ,  H01J2237/24405 ,  H01J2237/24475 ,  H01J2237/2448 ,  H01J2237/24507 ,  H01J2237/3104 ,  H01J2237/3175

摘要： The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.

摘要翻译： 本发明涉及一种用于确定异型电子束取向的探针。 为了精确地计时电子束的位置，探针被设计成仅从狭窄的区域接受电子。 然后将由探头产生的信号用作可操作耦合的数据采集系统的定时或触发基准。 这种布置消除了狭缝几何形状的变化，焊接室壁中的附加信号馈通和数据采集系统上的第二定时或触发通道。 结果，本发明通过最小化当前狭缝触发方法的不利影响，从而精确地重建电子或离子束来提高所得数据的精度。

公开(公告)号：US20050242299A1

公开(公告)日：2005-11-03

申请号：US11116697

申请日：2005-04-27

申请人： John Elmer ,  Todd Palmer ,  Alan Teruya ,  Chris Walton

发明人： John Elmer ,  Todd Palmer ,  Alan Teruya ,  Chris Walton

IPC分类号： G01J1/00 ,  G01R19/00 ,  G03C5/00 ,  H01J37/304 ,  H01J37/305 ,  H01J37/315

CPC分类号： H01J37/315 ,  H01J37/304 ,  H01J37/3056 ,  H01J2237/153 ,  H01J2237/30433 ,  H01J2237/317

摘要： An apparatus for characterization of a micro beam comprising a micro modified Faraday cup assembly including a first layer of material, a second layer of material operatively connected to the first layer of material, a third layer of material operatively connected to the second layer of material, and a fourth layer of material operatively connected to the third layer of material. The first layer of material comprises an electrical conducting material and has at least one first layer radial slit extending through the first layer. An electrical ground is connected to the first layer. The second layer of material comprises an insulating material and has at least one second layer radial slit corresponding to the first layer radial slit in the first layer of material. The second layer radial slit extends through the second layer. The third layer of material comprises a conducting material and has at least one third layer radial slit corresponding to the second layer radial slit in the second layer of material. The third layer radial slit extends through the third layer. The fourth layer of material comprises an electrical conducting material but does not have slits. An electrical measuring device is connected to the fourth layer. The micro modified Faraday cup assembly is positioned to be swept by the micro beam.

摘要翻译： 一种用于表征微束的装置，包括微修改的法拉第杯组件，其包括第一材料层，可操作地连接到第一材料层的第二材料层，与第二材料层可操作地连接的第三层材料， 以及可操作地连接到第三层材料的第四层材料。 第一层材料包括导电材料，并且具有延伸穿过第一层的至少一个第一层径向狭缝。 电接地连接到第一层。 第二层材料包括绝缘材料，并且具有至少一个与第一层材料中的第一层径向狭缝相对应的第二层径向狭缝。 第二层径向狭缝延伸穿过第二层。 第三层材料包括导电材料，并且具有与第二层材料中的第二层径向狭缝相对应的至少一个第三层径向狭缝。 第三层径向狭缝延伸穿过第三层。 第四层材料包括导电材料，但不具有狭缝。 电测量装置连接到第四层。 微改装的法拉第杯组件定位成被微梁扫过。

公开(公告)号：US20070265109A1

公开(公告)日：2007-11-15

申请号：US11575191

申请日：2005-09-29

申请人： John Elmer

发明人： John Elmer

IPC分类号： A63B53/06

CPC分类号： A63B53/065 ,  A63B60/50 ,  A63B2053/0416

摘要： The invention relates to a putter head for a golf putter and to a golf putter that includes the putter head and a putter shaft secured to the putter head. The putter head includes a first head part, that defines the striking face of the putter, and a second head part that is located operatively rearwardly of the first head part and that is displaceable on guide rods with respect to the first head part along a line extending substantially perpendicularly to the striking face defined by the first head part. Securing screws displaceable within the second head part can engage the respective guide rods for securing the location of the head parts with respect to one another. A shaft securing formation is associated with the first head part and permits securing of a putter shaft to the putter head in different angular configurations with respect thereto

摘要翻译： 本发明涉及一种用于高尔夫推杆的推杆头和高尔夫推杆，其包括推杆头和固定在推杆头上的推杆轴。 所述推杆头包括限定所述推杆的击打面的第一头部，以及第二头部，所述第一头部可操作地位于所述第一头部的后方，并且可相对于所述第一头部沿着线在所述导杆上移位 大致垂直于由第一头部限定的打击面延伸。 在第二头部部件内可移位的固定螺钉可接合相应的导杆，用于相对于彼此固定头部部件的位置。 轴固定结构与第一头部相关联，并且允许将推杆轴相对于其以不同的角度构造固定到推杆头