APPARATUS AND METHOD FOR PROFILING A DEPTH OF A SURFACE OF A TARGET OBJECT
    2.
    发明申请
    APPARATUS AND METHOD FOR PROFILING A DEPTH OF A SURFACE OF A TARGET OBJECT 有权
    用于分析目标对象表面深度的装置和方法

    公开(公告)号:US20150130932A1

    公开(公告)日:2015-05-14

    申请号:US14400580

    申请日:2013-05-03

    Abstract: An apparatus (1) for profiling the depth of a surface of a target object (30), having a two-dimensional array of lasers (5), an optical device (15) for projecting a two-dimensional illumination pattern (31) onto an area of the surface of the target object, an image capture device (10) arranged to capture an image of the two-dimensional illumination pattern projected onto the area of the surface of the target object and a processor (25) configured to process the captured image in order to reconstruct a depth profile of the two-dimensional area of the surface of the target object from the image captured by the image capture device.

    Abstract translation: 一种用于对具有二维激光阵列(5)的目标物体(30)的表面的深度进行分析的装置(1),用于将二维照明图案(31)投影到其上的光学装置(15) 目标对象的表面的区域,被配置为捕获投影到目标对象的表面的区域上的二维照明图案的图像的图像捕获装置(10),以及处理器 捕获图像,以便从由图像捕获装置拍摄的图像重建目标对象的表面的二维区域的深度轮廓。

Patent Agency Ranking