公开(公告)号：US20100244714A1

公开(公告)日：2010-09-30

申请号：US12742103

申请日：2007-11-13

申请人： Kamel Abouda ,  Murielle Delage ,  Erwan Hemon ,  Pierre Turpin

发明人： Kamel Abouda ,  Murielle Delage ,  Erwan Hemon ,  Pierre Turpin

IPC分类号： H05B37/02 ,  H03H11/26

CPC分类号： H03K17/166 ,  H03K17/145 ,  H03K2217/0027

摘要： A circuit for improving the control of a change in state of a signal in an electronic device between a first state and a second state, wherein a first change in state occurs when the state changes from the second state to the first state and a second change in state occurs when the state changes from the first state to the second state and wherein the first and second changes in state have associated therewith a first and a second time delay over which the or each change in state occurs, characterized in that said circuit comprises a determining unit for measuring the first time delay and a calculator for calculating a common delay to replace one or more of the first and second delays to thereby improve the control of the change in state of the signal

摘要翻译： 一种用于改善在第一状态和第二状态之间对电子设备中的信号状态变化的控制的电路，其中当状态从第二状态变为第一状态时发生第一状态变化，并且第二变化 当状态从第一状态改变到第二状态时，发生状态，并且其中第一和第二状态改变已经与第一和第二时间延迟相关联，其中状态或每种状态发生变化，其特征在于，所述电路包括 用于测量第一时间延迟的确定单元和用于计算用于替换第一和第二延迟中的一个或多个的公共延迟的计算器，从而改善信号状态变化的控制

公开(公告)号：US08384313B2

公开(公告)日：2013-02-26

申请号：US12742103

申请日：2007-11-13

申请人： Kamel Abouda ,  Murielle Delage ,  Erwan Hemon ,  Pierre Turpin

发明人： Kamel Abouda ,  Murielle Delage ,  Erwan Hemon ,  Pierre Turpin

IPC分类号： H05B37/02

CPC分类号： H03K17/166 ,  H03K17/145 ,  H03K2217/0027

摘要： A circuit for improving the control of a change in state of a signal in an electronic device between a first state and a second state, wherein a first change in state occurs when the state changes from the second state to the first state and a second change in state occurs when the state changes from the first state to the second state and wherein the first and second changes in state have associated therewith a first and a second time delay over which each change in state occurs, characterized in that said circuit comprises a determining unit for measuring the first time delay and a calculator for calculating a common delay to replace one or more of the first and second delays to thereby improve the control of the change in state of the signal.

摘要翻译： 一种用于改善在第一状态和第二状态之间对电子设备中的信号状态变化的控制的电路，其中当状态从第二状态变为第一状态时发生第一状态变化，并且第二变化 当状态从第一状态改变到第二状态时，发生状态，并且其中状态的第一和第二变化与其相关联地产生每个状态变化的第一和第二时间延迟，其特征在于，所述电路包括确定 用于测量第一时间延迟的单元和用于计算用于替换第一和第二延迟中的一个或多个的公共延迟的计算器，从而改善对信号状态变化的控制。

公开(公告)号：US08598886B2

公开(公告)日：2013-12-03

申请号：US12920600

申请日：2008-03-20

申请人： Kamel Abouda ,  Stephanie Creveau-Boury ,  Murielle Delage ,  Pierre Turpin

发明人： Kamel Abouda ,  Stephanie Creveau-Boury ,  Murielle Delage ,  Pierre Turpin

IPC分类号： G01R31/08

CPC分类号： G01R31/025 ,  G01R31/007 ,  G01R31/024

摘要： Apparatus for detecting faults in the delivery of electrical power to electrical loads, includes a plurality of load electrical connections arranged to deliver electrical power from an electrical power source to each of a plurality of electrical loads, a plurality of electrical switches, each connected to an associated one of the load connections, and a diagnostic device operable to detect a short circuit fault in the apparatus, wherein the diagnostic device is operable to apply a diagnostic procedure to detect a short circuit connection between at least two of the load electrical connections and includes a control logic unit operable to apply to each of the electrical switches in turn a test control signal causing operation of the switch to apply a test electrical signal to each of the load electrical connections in turn; and detector means connected to the load electrical connections and operable, while the test electrical signal is applied in turn to each load electrical connection, to detect whether a corresponding electrical output is produced in response on any of the other load electrical connections. Also described is a method of operation in the apparatus.

摘要翻译： 用于检测向电力负载递送电力中的故障的装置包括多个负载电连接，其被布置为将电力从电源传送到多个电负载中的每一个，多个电开关，每个电连接到 相关联的负载连接之一，以及可操作以检测装置中的短路故障的诊断装置，其中诊断装置可操作以应用诊断程序来检测至少两个负载电连接之间的短路连接，并且包括 控制逻辑单元，可操作以依次向每个电开关施加测试控制信号，使得开关的操作依次对每个负载电连接施加测试电信号; 以及检测器装置，其连接到负载电连接并且可操作，同时将测试电信号依次施加到每个负载电连接，以检测在任何其它负载电连接上是否响应地产生相应的电输出。 还描述了该装置中的操作方法。

公开(公告)号：US09482711B2

公开(公告)日：2016-11-01

申请号：US14094097

申请日：2013-12-02

申请人： Kamel Abouda ,  Stephanie Creveau-Boury ,  Murielle Delage ,  Pierre Turpin

发明人： Kamel Abouda ,  Stephanie Creveau-Boury ,  Murielle Delage ,  Pierre Turpin

IPC分类号： G01R31/08 ,  G01R31/02 ,  G01R31/00

CPC分类号： G01R31/025 ,  G01R31/007 ,  G01R31/024

摘要： A method of and apparatus for fault detection utilizing a diagnostic procedure by a diagnostic device to detect a short circuit between at least two of a plurality of load electrical connections, the diagnostic procedure comprising applying a test electrical signal to each of the load electrical connections in turn and while applying the test electrical signal to a first one of the load electrical connections, detecting whether an electrical output is present, in response, on any other of the load electrical connections, wherein the detecting by the diagnostic device includes applying the test electrical signal to the first one of the load electrical connections in an operational mode of the apparatus when an electrically controlled switch connected to the first one of the load electrical connections is in an off state.

摘要翻译： 一种用于故障检测的方法和装置，利用诊断装置的诊断程序来检测多个负载电连接中的至少两个之间的短路，所述诊断程序包括将测试电信号施加到每个负载电连接中 并且在将所述测试电信号应用于所述负载电连接中的第一负载电连接的同时，检测电输出是否存在于任何另外的所述负载电连接上，其中所述诊断装置的检测包括施加所述测试电气 当连接到第一负载电连接的电控开关处于断开状态时，在装置的操作模式下，向第一负载电连接信号。

公开(公告)号：US20110001486A1

公开(公告)日：2011-01-06

申请号：US12920600

申请日：2008-03-20

申请人： Kamel Abouda ,  Stephanie Creveau-Boury ,  Murielle Delage ,  Pierre Turpin

发明人： Kamel Abouda ,  Stephanie Creveau-Boury ,  Murielle Delage ,  Pierre Turpin

IPC分类号： G01R31/02

CPC分类号： G01R31/025 ,  G01R31/007 ,  G01R31/024

摘要： Apparatus for detecting faults in the delivery of electrical power to electrical loads, includes a plurality of load electrical connections arranged to deliver electrical power from an electrical power source to each of a plurality of electrical loads, a plurality of electrical switches, each connected to an associated one of the load connections, and a diagnostic device operable to detect a short circuit fault in the apparatus, wherein the diagnostic device is operable to apply a diagnostic procedure to detect a short circuit connection between at least two of the load electrical connections and includes a control logic unit operable to apply to each of the electrical switches in turn a test control signal causing operation of the switch to apply a test electrical signal to each of the load electrical connections in turn; and detector means connected to the load electrical connections and operable, whilst the test electrical signal is applied in turn to each load electrical connection, to detect whether a corresponding electrical output is produced in response on any of the other load electrical connections. Also described is a method of operation in the apparatus.

摘要翻译： 用于检测向电力负载递送电力中的故障的装置包括多个负载电连接，其被布置为将电力从电源传送到多个电负载中的每一个，多个电开关，每个电连接到 相关联的负载连接之一，以及可操作以检测装置中的短路故障的诊断装置，其中诊断装置可操作以应用诊断程序来检测至少两个负载电连接之间的短路连接，并且包括 控制逻辑单元，可操作以依次向每个电开关施加测试控制信号，使得开关的操作依次对每个负载电连接施加测试电信号; 以及连接到负载电连接并且可操作的检测器装置，同时将测试电信号依次施加到每个负载电连接，以检测是否响应于任何其它负载电连接而产生相应的电输出。 还描述了该装置中的操作方法。

公开(公告)号：US09461639B2

公开(公告)日：2016-10-04

申请号：US14556365

申请日：2014-12-01

申请人： Christelle Franchini ,  Murielle Delage ,  Alexis Nathanaël Huot-Marchand

发明人： Christelle Franchini ,  Murielle Delage ,  Alexis Nathanaël Huot-Marchand

IPC分类号： G05F1/00 ,  H03K17/687 ,  H01L27/02 ,  H01L29/78 ,  H01L29/06 ,  H01L25/16 ,  H01L21/8234 ,  H01L27/088 ,  G05F3/02 ,  H02M3/156 ,  G05F1/565

CPC分类号： H03K17/687 ,  G05F1/565 ,  G05F3/02 ,  H01L21/761 ,  H01L21/823418 ,  H01L25/16 ,  H01L27/0266 ,  H01L27/088 ,  H01L29/0642 ,  H01L29/78 ,  H01L29/7817 ,  H01L29/7826 ,  H01L29/7835 ,  H01L2924/0002 ,  H02M3/156 ,  H03K2217/0027 ,  H01L2924/00

摘要： A semiconductor device comprises a power transistor and a sense transistor. The power transistor conducts a power transistor current. The sense transistor conducts a sense transistor current substantially proportional to of the power transistor current. The power transistor and the sense transistor have drain source and a gate terminals, of which those of the sense transistor are arranged to be biased to those of the power transistor, respectively. The power transistor and the sense transistor each comprise: an inner region of type P−; an N-type buried layer; an N-type isolating barrier surrounding the inner region partially; an N-type source region in the inner region; an N-type drain region in the inner region. A barrier-to-drain connector connects the isolating barrier to the drain region, the one of the sense transistor has an electrical resistance which is higher than the resistance of the barrier-to-drain connector of the power transistor.

摘要翻译： 半导体器件包括功率晶体管和检测晶体管。 功率晶体管导通功率晶体管电流。 感测晶体管传导基本上与功率晶体管电流成比例的检测晶体管电流。 功率晶体管和感测晶体管具有漏极源和栅极端子，其中感测晶体管的漏极源极和漏极分别被布置成偏置到功率晶体管的栅极端子。 功率晶体管和感测晶体管各自包括：P型的内部区域; N型埋层; 部分地包围内部区域的N型隔离屏障; 在内部区域中的N型源极区域; 在内部区域中的N型漏极区域。 隔离漏极连接器将隔离栅连接到漏极区，感测晶体管中的一个具有高于功率晶体管的栅极 - 漏极连接器的电阻的电阻。