Probe apparatus for measuring an electron state on a sample surface
    6.
    发明授权
    Probe apparatus for measuring an electron state on a sample surface 失效
    用于测量样品表面上的电子状态的探针装置

    公开(公告)号:US07487667B2

    公开(公告)日:2009-02-10

    申请号:US11616241

    申请日:2006-12-26

    IPC分类号: G01B5/28 G21K7/00

    CPC分类号: G01Q60/32 G01Q20/02 G01Q20/04

    摘要: In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to self-excited vibration at a predetermined frequency, the sample is irradiated with the excitation light at a predetermined timing when a distance between the probe and the sample is not greater than a predetermined distance.

    摘要翻译: 在用激发光间歇地照射样品以观察样品的探针装置中,同时使包括布置在样品表面上的探针的悬臂以预定频率进行自激振动,将样品用激发光照射 当探针和样品之间的距离不大于预定距离时的预定定时。

    PROBE APPARATUS
    7.
    发明申请
    PROBE APPARATUS 失效
    探测器

    公开(公告)号:US20070113630A1

    公开(公告)日:2007-05-24

    申请号:US11616241

    申请日:2006-12-26

    IPC分类号: G01B5/28

    CPC分类号: G01Q60/32 G01Q20/02 G01Q20/04

    摘要: In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to self-excited vibration at a predetermined frequency, the sample is irradiated with the excitation light at a predetermined timing when a distance between the probe and the sample is not greater than a predetermined distance.

    摘要翻译: 在用激发光间歇地照射样品以观察样品的探针装置中,同时使包括布置在样品表面上的探针的悬臂以预定频率进行自激振动,将样品用激发光照射 当探针和样品之间的距离不大于预定距离时的预定定时。

    Probe device and method of controlling the same
    8.
    发明申请
    Probe device and method of controlling the same 有权
    探头装置及其控制方法

    公开(公告)号:US20050140387A1

    公开(公告)日:2005-06-30

    申请号:US11065025

    申请日:2005-02-25

    CPC分类号: G01Q60/34

    摘要: A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, and means for carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.

    摘要翻译: 探针装置包括悬臂,其包括被分配为与样品的表面相对的探针,以及用于在以预定周期切换两个操作模式时进行样品的测量的装置,用于测量样品的表面结构的攻丝模式 同时振动悬臂和点接触模式,用于测量样品的电特性,同时使探针与样品接触。

    Probe apparatus for measuring an electron state on a sample surface
    9.
    发明授权
    Probe apparatus for measuring an electron state on a sample surface 有权
    用于测量样品表面上的电子状态的探针装置

    公开(公告)号:US07874202B2

    公开(公告)日:2011-01-25

    申请号:US12346379

    申请日:2008-12-30

    IPC分类号: G01B5/28

    CPC分类号: G01Q60/32 G01Q20/02 G01Q20/04

    摘要: In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to self-excited vibration at a predetermined frequency, the sample is irradiated with the excitation light at a predetermined timing when a distance between the probe and the sample is not greater than a predetermined distance.

    摘要翻译: 在用激发光间歇地照射样品以观察样品的探针装置中,同时使包括布置在样品表面上的探针的悬臂以预定频率进行自激振动,将样品用激发光照射 当探针和样品之间的距离不大于预定距离时的预定定时。

    Probe device
    10.
    发明申请
    Probe device 失效
    探头设备

    公开(公告)号:US20050139770A1

    公开(公告)日:2005-06-30

    申请号:US11065273

    申请日:2005-02-25

    IPC分类号: G01Q60/34 G21K7/00 G01N23/00

    CPC分类号: G01Q60/34

    摘要: A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, means for feeding back a vibration amplitude value of the cantilever, thereby self-exciting and vibrating the cantilever at a predetermined frequency, means for applying a bias to the sample or the probe, and means for measuring a frequency shift caused by a charge-transfer force which acts between the cantilever and the sample.

    摘要翻译: 探针装置包括悬臂,其包括分配为与样品的表面相对的探针,用于反馈悬臂的振幅值的装置,从而以预定频率自激励和振动悬臂,用于施加偏压的装置 到样品或探针,以及用于测量由在悬臂和样品之间作用的电荷转移力引起的频移的装置。