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    Probe device
    1.
    发明申请
    Probe device 失效
    探头设备

    公开(公告)号：US20050139770A1

    公开(公告)日：2005-06-30

    申请号：US11065273

    申请日：2005-02-25

    申请人： Takuya Matsumoto ,  Yasuhisa Naitoh ,  Tomoji Kawai

    发明人： Takuya Matsumoto ,  Yasuhisa Naitoh ,  Tomoji Kawai

    IPC分类号： G01Q60/34 ,  G21K7/00 ,  G01N23/00

    CPC分类号： G01Q60/34

    摘要： A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, means for feeding back a vibration amplitude value of the cantilever, thereby self-exciting and vibrating the cantilever at a predetermined frequency, means for applying a bias to the sample or the probe, and means for measuring a frequency shift caused by a charge-transfer force which acts between the cantilever and the sample.

    摘要翻译： 探针装置包括悬臂，其包括分配为与样品的表面相对的探针，用于反馈悬臂的振幅值的装置，从而以预定频率自激励和振动悬臂，用于施加偏压的装置 到样品或探针，以及用于测量由在悬臂和样品之间作用的电荷转移力引起的频移的装置。

    Probe device
    2.
    发明授权
    Probe device 失效
    探头设备

    公开(公告)号：US07250602B2

    公开(公告)日：2007-07-31

    申请号：US11065273

    申请日：2005-02-25

    申请人： Takuya Matsumoto ,  Yasuhisa Naitoh ,  Tomoji Kawai

    发明人： Takuya Matsumoto ,  Yasuhisa Naitoh ,  Tomoji Kawai

    IPC分类号： G21K27/00 ,  G01N23/00 ,  G01N21/00 ,  G01B5/28

    CPC分类号： G01Q60/34

    摘要： A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, means for feeding back a vibration amplitude value of the cantilever, thereby self-exciting and vibrating the cantilever at a predetermined frequency, means for applying a bias to the sample or the probe, and means for measuring a frequency shift caused by a charge-transfer force which acts between the cantilever and the sample.

    摘要翻译： 探针装置包括悬臂，其包括分配为与样品的表面相对的探针，用于反馈悬臂的振幅值的装置，从而以预定频率自激励和振动悬臂，用于施加偏压的装置 到样品或探针，以及用于测量由在悬臂和样品之间作用的电荷转移力引起的频移的装置。

    Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure
    3.
    发明授权
    Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure 有权
    用于测量和评估具有纳米级结构的样品的局部电特性的方法和装置

    公开(公告)号：US07088120B2

    公开(公告)日：2006-08-08

    申请号：US11065025

    申请日：2005-02-25

    申请人： Takuya Matsumoto ,  Yoicho Otsuka ,  Yasuhisa Naitoh ,  Tomoji Kawai

    发明人： Takuya Matsumoto ,  Yoicho Otsuka ,  Yasuhisa Naitoh ,  Tomoji Kawai

    IPC分类号： G01R31/02 ,  G01R27/08

    CPC分类号： G01Q60/34

    摘要： A probe device including a cantilever. A probe is attached to the cantilever and is allocated to be opposed to a surface of a sample attached thereto. An apparatus is provided with the probe device, which is capable of carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.

    摘要翻译： 包括悬臂的探针装置。 将探针连接到悬臂并被分配成与附接到其上的样品的表面相对。 一种装置设置有探针装置，其能够在以预定周期切换两个操作模式的同时进行样品的测量，用于在振动悬臂时测量样品的表面结构的敲击模式和点接触模式 在使探针与样品接触的同时测量样品的电特性。

    Probe device and method of controlling the same
    4.
    发明申请
    Probe device and method of controlling the same 有权
    探头装置及其控制方法

    公开(公告)号：US20050140387A1

    公开(公告)日：2005-06-30

    申请号：US11065025

    申请日：2005-02-25

    申请人： Takuya Matsumoto ,  Yoichi Otsuka ,  Yasuhisa Naitoh ,  Tomoji Kawai

    发明人： Takuya Matsumoto ,  Yoichi Otsuka ,  Yasuhisa Naitoh ,  Tomoji Kawai

    IPC分类号： G01Q60/00 ,  G01Q60/34 ,  G01Q60/38 ,  G01Q60/40 ,  G01R31/02

    CPC分类号： G01Q60/34

    摘要： A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, and means for carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.

    摘要翻译： 探针装置包括悬臂，其包括被分配为与样品的表面相对的探针，以及用于在以预定周期切换两个操作模式时进行样品的测量的装置，用于测量样品的表面结构的攻丝模式 同时振动悬臂和点接触模式，用于测量样品的电特性，同时使探针与样品接触。

    METHOD FOR MANUFACTURING MICROELECTRODE AND MICROELECTRODE MANUFACTURED BY THE SAME
    7.
    发明申请
    METHOD FOR MANUFACTURING MICROELECTRODE AND MICROELECTRODE MANUFACTURED BY THE SAME 审中-公开
    制造微电子的方法及其制造的微电子

    公开(公告)号：US20070169881A1

    公开(公告)日：2007-07-26

    申请号：US11692350

    申请日：2007-03-28

    申请人： Takuya MATSUMOTO ,  Sinji Matsui ,  Kenichiro Nakamatsu ,  Kaoru Ojima ,  Tomoji Kawai

    发明人： Takuya MATSUMOTO ,  Sinji Matsui ,  Kenichiro Nakamatsu ,  Kaoru Ojima ,  Tomoji Kawai

    IPC分类号： B32B37/00

    CPC分类号： H01L51/0022 ,  B82Y30/00

    摘要： A method for manufacturing a microelectrode includes one of allocating organic molecules or forming an organic molecular layer on a first substrate, applying a release agent onto a desired pattern formed on a second substrate, attaching an electrode material to the release agent, and bonding a surface of the second substrate to which the electrode material is attached and a surface of the first substrate on which the organic molecules are allocated or the organic molecular layer is formed to transfer the electrode material to the first substrate.

    摘要翻译： 微电极的制造方法包括在第一基板上分配有机分子或形成有机分子层之一，将剥离剂施加到形成在第二基板上的期望图案上，将电极材料附着到剥离剂上， 的电极材料所附着的第二基板和其上分配有机分子的第一基板的表面或形成有机分子层以将电极材料转移到第一基板。

    Probe apparatus for measuring an electron state on a sample surface
    9.
    发明授权
    Probe apparatus for measuring an electron state on a sample surface 有权
    用于测量样品表面上的电子状态的探针装置

    公开(公告)号：US07874202B2

    公开(公告)日：2011-01-25

    申请号：US12346379

    申请日：2008-12-30

    申请人： Takuya Matsumoto ,  Tomoji Kawai

    发明人： Takuya Matsumoto ,  Tomoji Kawai

    IPC分类号： G01B5/28

    CPC分类号： G01Q60/32 ,  G01Q20/02 ,  G01Q20/04

    摘要： In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to self-excited vibration at a predetermined frequency, the sample is irradiated with the excitation light at a predetermined timing when a distance between the probe and the sample is not greater than a predetermined distance.

    摘要翻译： 在用激发光间歇地照射样品以观察样品的探针装置中，同时使包括布置在样品表面上的探针的悬臂以预定频率进行自激振动，将样品用激发光照射 当探针和样品之间的距离不大于预定距离时的预定定时。