Abstract:
An apparatus for determining alternating current (AC) delay variation of a transistor device under test includes a ring oscillator, the ring oscillator having the transistor device under test configured within a feedback path of the ring oscillator; and circuitry configured to measure a difference between a first signal delay path and a second signal delay path, the first signal delay path being between a gate terminal and a drain terminal of the transistor device under test, and the second signal delay path being between a source terminal and the drain terminal of the transistor device under test.
Abstract:
An apparatus for determining alternating current (AC) delay variation of a transistor device under test includes a ring oscillator, the ring oscillator having the transistor device under test configured within a feedback path of the ring oscillator; and circuitry configured to measure a difference between a first signal delay path and a second signal delay path, the first signal delay path being between a gate terminal and a drain terminal of the transistor device under test, and the second signal delay path being between a source terminal and the drain terminal of the transistor device under test.
Abstract:
An apparatus for determining alternating current (AC) delay variation of a transistor device under test includes a ring oscillator, the ring oscillator having the transistor device under test configured within a feedback path of the ring oscillator; and circuitry configured to measure a difference between a first signal delay path and a second signal delay path, the first signal delay path being between a gate terminal and a drain terminal of the transistor device under test, and the second signal delay path being between a source terminal and the drain terminal of the transistor device under test.
Abstract:
An apparatus for determining alternating current (AC) delay variation of a transistor device under test includes a ring oscillator, the ring oscillator having the transistor device under test configured within a feedback path of the ring oscillator; and circuitry configured to measure a difference between a first signal delay path and a second signal delay path, the first signal delay path being between a gate terminal and a drain terminal of the transistor device under test, and the second signal delay path being between a source terminal and the drain terminal of the transistor device under test.
Abstract:
Systems and methods are provided for determining the size of particles within a fluidized bed reactor for use with thermally decomposable silicon-containing gas. The pressure of gas adjacent a gas inlet and adjacent a gas outlet of the reactor are measured with pressure sensors. An algorithm is applied to at least one of the pressure measurements to determine the size of particles within the reactor. The determined size of the particles can be used to control the operation of the reactor.
Abstract:
The present invention relates to a polymer composition comprising a transparent polymer blend. The polymer blend comprises a first resin and a second resin. The first resin comprises polyarylate structural units of formula I, wherein R1 is independently at each occurrence a C1–C2 alkyl group, or a halogen atom, and p is 0 to 3. The second resin is selected from the group consisting of polycarbonates, polyarylates and copolyestercarbonates. The first resin and the second resin are further characterized by a difference in polyarylate structural unit content, said difference being less than about 40 mole percent.
Abstract:
Systems and methods are provided for determining the size of particles within a fluidized bed reactor for use with thermally decomposable silicon-containing gas. The pressure of gas adjacent a gas inlet and adjacent a gas outlet of the reactor are measured with pressure sensors. An algorithm is applied to at least one of the pressure measurements to determine the size of particles within the reactor. The determined size of the particles can be used to control the operation of the reactor.
Abstract:
A copolycarbonate-polyester, comprising units of formula wherein at least 60 percent of the total number of R1 groups are divalent aromatic organic radicals and the balance thereof are divalent aliphatic or alicyclic radicals; units of formula wherein T is a C7-20 divalent alkyl aromatic radical or a C6-20 divalent aromatic radical, and D is a divalent C6-20 aromatic radical; and units of the formula wherein R2 and R3 are each independently a halogen or a C1-6 alkyl group, R4 is a methyl or phenyl group, each c is independently 0 to 4, and T is as described above. A method of making a copolycarbonate-polyester is also disclosed.
Abstract:
A copolycarbonate-polyester, comprising units of formula wherein at least 60 percent of the total number of R1 groups are divalent aromatic organic radicals and the balance thereof are divalent aliphatic or alicyclic radicals; units of formula wherein T is a C7-20 divalent alkyl aromatic radical or a C6-20 divalent aromatic radical, and D is a divalent C6-20 aromatic radical; and units of the formula wherein R2 and R3 are each independently a halogen or a C1-6 alkyl group, R4 is a methyl or phenyl group, each c is independently 0 to 4, and T is as described above. A method of making a copolycarbonate-polyester is also disclosed.
Abstract:
A copolycarbonate-polyester, comprising units of formula wherein at least 60 percent of the total number of R1 groups are divalent aromatic organic radicals and the balance thereof are divalent aliphatic or alicyclic radicals; units of formula wherein T is a C7-20 divalent alkyl aromatic radical or a C6-20 divalent aromatic radical, and D is a divalent C6-20 aromatic radical; and units of the formula wherein R2 and R3 are each independently a halogen or a C1-6 alkyl group, R4 is a methyl or phenyl group, each c is independently 0 to 4, and T is as described above. A method of making a copolycarbonate-polyester is also disclosed.