公开(公告)号：US20110076519A1

公开(公告)日：2011-03-31

申请号：US12679554

申请日：2008-10-06

申请人： Kartik Chandran ,  Timothy Chang

发明人： Kartik Chandran ,  Timothy Chang

IPC分类号： H01M8/16

CPC分类号： C02F3/005 ,  C02F2001/46133 ,  C02F2305/06 ,  H01M8/16 ,  Y02E60/527

摘要： Methods of sustainable wastewater and biosolids treatment using a bioreactor including a microbial fuel cell are disclosed. In some embodiments, the methods include the following: enriching an anode of the microbial fuel cell in the bioreactor with a substantially soluble electron acceptor; growing the bacteria in the presence of the anode enriched with a substantially soluble electron acceptor; oxidizing a substrate using the bacteria to produce free electrons; channeling the free electrons away from a terminal electron acceptor and to the enriched anode, the enriched anode serving as an electron acceptor; and carrying the free electrons from the enriched anode to a cathode of the microbial fuel cell to generate electricity.

摘要翻译： 公开了使用包括微生物燃料电池的生物反应器的可持续废水和生物固体处理方法。 在一些实施方案中，所述方法包括以下：用基本上可溶的电子受体富集生物反应器中微生物燃料电池的阳极; 在富含基本上可溶的电子受体的阳极存在下生长细菌; 使用细菌氧化底物以产生自由电子; 将自由电子引导离开终端电子受体和富集的阳极，富集的阳极用作电子受体; 并将自由电子从富集阳极运送到微生物燃料电池的阴极以发电。

公开(公告)号：US07032578B2

公开(公告)日：2006-04-25

申请号：US10945618

申请日：2004-09-21

申请人： Zhengbai Liu ,  Laura M. Ricart-Ugaz ,  Timothy Chang ,  Yuanxian Zhu

发明人： Zhengbai Liu ,  Laura M. Ricart-Ugaz ,  Timothy Chang ,  Yuanxian Zhu

IPC分类号： F02B47/08

CPC分类号： F02M35/10118 ,  F02M26/10 ,  F02M26/19 ,  F02M35/10157 ,  F02M35/10222

摘要： A venturi mixing system mixes intake air with exhaust gases for exhaust gas recirculation (EGR) in an internal combustion engine. The venturi mixing system has a venturi disposed in a mixing conduit. The venturi is connected to an intake air conduit and a supply conduit. The venturi and mixing conduit form an annular cavity connected to an EGR conduit. The venturi forms a mixing chamber. One or more inset conduits connect to the venturi and extend into the mixing chamber. Each inset conduit has an end outlet and one or more side outlets. The venturi generates a lower pressure region in the intake air. The inset conduits generate a turbulence field in the lower pressure region. The inset conduits direct intake air into the turbulence field. The inset conduits direct exhaust gases through the end and side outlets into the turbulence field. The exhaust gases mix with the intake air in the turbulence field to form a combustion gas for combustion of fuel in the engine. The venturi provides the combustion gas to the supply conduit.

摘要翻译： 文丘里混合系统将进气和废气混合在内燃机中用于废气再循环（EGR）。 文丘里混合系统具有布置在混合管道中的文氏管。 文丘里管连接到进气管道和供应管道。 文丘里管和混合管道形成连接到EGR管道的环形空腔。 文氏管形成混合室。 一个或多个插入管道连接到文丘里管并延伸到混合室中。 每个插入导管都有一个端口和一个或多个侧插口。 文氏管在进气中产生较低的压力区域。 插入管道在较低压力区域产生湍流场。 插入管道将进气直接引入湍流场。 插入管道将废气直接通过端部和侧面出口进入湍流场。 废气与湍流场中的进气混合形成用于燃料在发动机中燃烧的燃烧气体。 文氏管将燃烧气体提供给供应管道。

公开(公告)号：US20090322370A1

公开(公告)日：2009-12-31

申请号：US12554840

申请日：2009-09-04

申请人： Frederick Ware ,  Scott Best ,  Timothy Chang ,  Richard Perego ,  Ely Tsern ,  Jeff Mitchell

发明人： Frederick Ware ,  Scott Best ,  Timothy Chang ,  Richard Perego ,  Ely Tsern ,  Jeff Mitchell

IPC分类号： G01R31/02

CPC分类号： G11C29/56004 ,  G01R31/31707 ,  G06F11/24 ,  G11C2029/5602

摘要： A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

摘要翻译： 提供了用于测试和表征电路的方法和装置。 在一个实施例中，半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中，高速测试电路包括测试图形生成电路和各种差分比较器，用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中，包括测试电路的接口可以测试自身或另一接口。 在一个实施例中，定时参考信号使彼此测试的两个接口的各个参数解耦，以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级，元件级和系统中执行。

公开(公告)号：US07097810B2

公开(公告)日：2006-08-29

申请号：US10184502

申请日：2002-06-26

申请人： Timothy Chang ,  Peter Tolias

发明人： Timothy Chang ,  Peter Tolias

IPC分类号： B01L3/02

CPC分类号： G01N35/1074 ,  B01J2219/00387 ,  B01L2400/028 ,  C40B60/14 ,  G01N35/1002 ,  G01N35/1016 ,  G01N2035/1037 ,  G01N2035/1039 ,  Y10T436/2575

摘要： Techniques for the delivery of metered amounts of liquid material include the use of a pin, such as an optical fiber. A sample of the liquid material may be placed on the tip of the pin for delivery to a target area, such as a specific location on a microarray, in a contactless manner. Light transmitted through the pin may be detected to facilitate accurate measuring of the pin's position.

公开(公告)号：US20060016272A1

公开(公告)日：2006-01-26

申请号：US11189338

申请日：2005-07-26

申请人： Timothy Chang ,  Biao Cheng

发明人： Timothy Chang ,  Biao Cheng

IPC分类号： G01N3/08

CPC分类号： G01N3/08 ,  G01N2203/0623 ,  G01N2203/0676 ,  G01N2203/0682

摘要： Simultaneous pressure and position information is accurately measured in a sensor realized by utilizing first and second sensor elements that each exhibit a decreasing width over the length of the sensor element and that are arranged overlapping each other and in a substantially complementary orientation to one another with respect to the width so that the point of narrowest width of the first sensor element overlaps the point of the widest width of the second sensor element. Pressure applied to the sensor causes each sensor element to generate an electrical signal that is proportional to both the applied pressure and the surface area at the location of the applied pressure. As a result of the complementary orientation and overlapping for these sensor elements, the first and second sensor elements generate an asymmetric pair of signals that uniquely define the applied pressure by position and magnitude.

摘要翻译： 在通过利用第一和第二传感器元件实现的传感器中精确地测量同时压力和位置信息，所述第一和第二传感器元件在传感器元件的长度上表现出减小的宽度，并且彼此重叠并且基本上互补的取向相对于 使得第一传感器元件的最窄宽度的点与第二传感器元件的最宽宽度的点重叠。 施加到传感器的压力导致每个传感器元件产生与施加的压力和施加压力的位置处的表面积成正比的电信号。 作为这些传感器元件的互补取向和重叠的结果，第一和第二传感器元件产生不对称的信号对，其通过位置和幅度唯一地限定施加的压力。

公开(公告)号：US08278964B2

公开(公告)日：2012-10-02

申请号：US12554840

申请日：2009-09-04

申请人： Frederick Ware ,  Scott Best ,  Timothy Chang ,  Richard Perego ,  Ely Tsern ,  Jeff Mitchell

发明人： Frederick Ware ,  Scott Best ,  Timothy Chang ,  Richard Perego ,  Ely Tsern ,  Jeff Mitchell

IPC分类号： G01R31/28

CPC分类号： G11C29/56004 ,  G01R31/31707 ,  G06F11/24 ,  G11C2029/5602

摘要： A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

摘要翻译： 提供了用于测试和表征电路的方法和装置。 在一个实施例中，半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中，高速测试电路包括测试图形生成电路和各种差分比较器，用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中，包括测试电路的接口可以测试自身或另一接口。 在一个实施例中，定时参考信号使彼此测试的两个接口的各个参数解耦，以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级，元件级和系统中执行。

公开(公告)号：US20060060172A1

公开(公告)日：2006-03-23

申请号：US10945618

申请日：2004-09-21

申请人： Zhengbai Liu ,  Laura Ricart-Ugaz ,  Timothy Chang ,  Yuanxian Zhu

发明人： Zhengbai Liu ,  Laura Ricart-Ugaz ,  Timothy Chang ,  Yuanxian Zhu

IPC分类号： F02M25/07

CPC分类号： F02M35/10118 ,  F02M26/10 ,  F02M26/19 ,  F02M35/10157 ,  F02M35/10222

摘要： A venturi mixing system mixes intake air with exhaust gases for exhaust gas recirculation (EGR) in an internal combustion engine. The venturi mixing system has a venturi disposed in a mixing conduit. The venturi is connected to an intake air conduit and a supply conduit. The venturi and mixing conduit form an annular cavity connected to an EGR conduit. The venturi forms a mixing chamber. One or more inset conduits connect to the venturi and extend into the mixing chamber. Each inset conduit has an end outlet and one or more side outlets. The venturi generates a lower pressure region in the intake air. The inset conduits generate a turbulence field in the lower pressure region. The inset conduits direct intake air into the turbulence field. The inset conduits direct exhaust gases through the end and side outlets into the turbulence field. The exhaust gases mix with the intake air in the turbulence field to form a combustion gas for combustion of fuel in the engine. The venturi provides the combustion gas to the supply conduit.

摘要翻译： 文丘里混合系统将进气和废气混合在内燃机中用于废气再循环（EGR）。 文丘里混合系统具有布置在混合管道中的文氏管。 文丘里管连接到进气管道和供应管道。 文丘里管和混合管道形成连接到EGR管道的环形空腔。 文氏管形成混合室。 一个或多个插入管道连接到文丘里管并延伸到混合室中。 每个插入导管都有一个端口和一个或多个侧插口。 文氏管在进气中产生较低的压力区域。 插入管道在较低压力区域产生湍流场。 插入管道将进气直接引入湍流场。 插入管道将废气直接通过端部和侧面出口进入湍流场。 废气与湍流场中的进气混合形成用于燃料在发动机中燃烧的燃烧气体。 文氏管将燃烧气体提供给供应管道。

公开(公告)号：US20050268196A1

公开(公告)日：2005-12-01

申请号：US11201609

申请日：2005-08-10

申请人： Timothy Chang ,  Donald Stark

发明人： Timothy Chang ,  Donald Stark

IPC分类号： G01R31/319 ,  G01R31/3193 ,  G01R31/28 ,  G06F11/00

CPC分类号： G01R31/31919 ,  G01R31/31935

摘要： An efficient method and apparatus for characterizing circuit devices is disclosed. In one embodiment, multiple test patterns for testing a circuit device are stored in a tester. Each test pattern includes both test data and control data that defines at least in part a sweep point at which the circuit device is tested. Thus, the tester can generate stimulus vectors for multiple sweep points without requiring control system intervention. Pass/fail indicators, each of which represents pass/fail results associated with a sweep point, are derived from the test results and stored in a Fail Capture Memory. A pass/fail boundary of the DUT can be determined from the contents of the Fail Capture Memory.

摘要翻译： 公开了一种用于表征电路装置的有效方法和装置。 在一个实施例中，用于测试电路设备的多个测试图案被存储在测试器中。 每个测试模式包括测试数据和至少部分地定义电路设备被测试的扫描点的控制数据。 因此，测试者可以产生多个扫描点的刺激向量，而不需要控制系统干预。 通过/失败指示器，每个都表示与扫描点相关联的通过/失败结果，从测试结果中导出并存储在故障捕获内存中。 DUT的通过/失败边界可以根据故障捕获存储器的内容来确定。

公开(公告)号：US07592824B2

公开(公告)日：2009-09-22

申请号：US10768443

申请日：2004-01-30

申请人： Frederick Ware ,  Scott Best ,  Timothy Chang ,  Richard Perego ,  Ely Tsern ,  Jeff Mitchell

发明人： Frederick Ware ,  Scott Best ,  Timothy Chang ,  Richard Perego ,  Ely Tsern ,  Jeff Mitchell

IPC分类号： G01R31/02 ,  G01R31/28

CPC分类号： G11C29/56004 ,  G01R31/31707 ,  G06F11/24 ,  G11C2029/5602

摘要： A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

摘要翻译： 提供了用于测试和表征电路的方法和装置。 在一个实施例中，半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中，高速测试电路包括测试图形生成电路和各种差分比较器，用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中，包括测试电路的接口可以测试自身或另一接口。 在一个实施例中，定时参考信号使彼此测试的两个接口的各个参数解耦，以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级，元件级和系统中执行。

公开(公告)号：US07492668B2

公开(公告)日：2009-02-17

申请号：US11833484

申请日：2007-08-03

申请人： Timothy Chang ,  Biao Cheng

发明人： Timothy Chang ,  Biao Cheng

IPC分类号： H04B1/02

CPC分类号： G01S7/524 ,  G01S7/52004 ,  G01S7/539

摘要： A system and method for measurement are disclosed which may include providing an input command signal; convolving the input command signal with a plurality of impulse signals to produce a transducer drive signal; and activating a first pressure transducer with the drive signal to transmit a pressure wave output from the transducer.

摘要翻译： 公开了一种用于测量的系统和方法，其可以包括提供输入命令信号; 用多个脉冲信号卷积输入命令信号以产生换能器驱动信号; 以及用所述驱动信号激活第一压力换能器以传送从所述换能器输出的压力波。