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    Software behavior modeling device, software behavior modeling method, software behavior verification device, and software behavior verification method
    9.
    发明授权
    Software behavior modeling device, software behavior modeling method, software behavior verification device, and software behavior verification method 失效
    软件行为建模设备，软件行为建模方法，软件行为验证设备和软件行为验证方法

    公开(公告)号：US08407799B2

    公开(公告)日：2013-03-26

    申请号：US12593376

    申请日：2008-03-28

    申请人： Takehiro Nakayama ,  Yuka Ikebe ,  Atsushi Takeshita ,  Kazuhiko Kato ,  Hirotake Abe ,  Katsuhiro Suzuki

    发明人： Takehiro Nakayama ,  Yuka Ikebe ,  Atsushi Takeshita ,  Kazuhiko Kato ,  Hirotake Abe ,  Katsuhiro Suzuki

    IPC分类号： H04L29/06

    CPC分类号： G06F11/3612 ,  G06F21/52

    摘要： A software behavior modeling device which forms a model of a behavior of software includes; an event information acquisition unit configured to acquire event information indicating a specific event which occurs during execution of the software; a stack information acquisition unit configured to acquire stack information stored in a call stack at a time of occurrence of the specific event; a score setting unit configured to set a score in accordance with a storage location in which each element included in the stack information is stored in the call stack; and a model generating unit configured to form a model of a relationship between the specific event and the element by using the score, and to generate a behavior model of the software.

    摘要翻译： 形成软件行为模型的软件行为建模设备包括： 事件信息获取单元，被配置为获取表示软件执行期间发生的特定事件的事件信息; 堆栈信息获取单元，被配置为在特定事件发生时获取存储在呼叫栈中的堆栈信息; 乐谱设定单元，被配置为根据包含在所述音箱信息中的每个元素存储在所述呼叫栈中的存储位置来设定乐谱; 以及模型生成单元，被配置为通过使用得分来形成特定事件和元素之间的关系的模型，并且生成软件的行为模型。

    THIN FILM FORMING APPARATUS, THIN FILM FORMING METHOD, AND SHIELD COMPONENT
    10.
    发明申请
    THIN FILM FORMING APPARATUS, THIN FILM FORMING METHOD, AND SHIELD COMPONENT 有权
    薄膜成型装置，薄膜​​成型方法和屏蔽部件

    公开(公告)号：US20110155059A1

    公开(公告)日：2011-06-30

    申请号：US12974245

    申请日：2010-12-21

    申请人： Akihiro Egami ,  Toshikazu Nakazawa ,  Katsuhiro Suzuki ,  Shinya Hasegawa

    发明人： Akihiro Egami ,  Toshikazu Nakazawa ,  Katsuhiro Suzuki ,  Shinya Hasegawa

    IPC分类号： C23C16/50 ,  C23C16/00

    CPC分类号： C23C14/564 ,  C23C14/0036 ,  C23C14/34 ,  C23C16/4401 ,  C23C16/45591 ,  C23C16/4585 ,  H01J37/32477 ,  H01J37/32651 ,  H01J37/3405 ,  H01J37/3411 ,  H01J37/3441 ,  H01J2237/026 ,  H01J2237/0268

    摘要： The inventors of this invention conducted a test and found out that to prevent peel-off of an adherent film, it is not of essential importance to set the radius of curvature equal to or larger than a predetermined threshold. The inventors of the present invention also found out that peel-off of an adherent film occurs in the region in which the curvature of a shield changes and is less likely to occur when the change in curvature of the shield is small. Accordingly, the key to the problem is the magnitude of a change in curvature of the shield, so changing the curvature stepwise makes it possible to suppress a large change in curvature, and thus to prevent peel-off of an adherent film free from any disadvantages such as deterioration in film thickness distribution, which may occur due to an increase in size of the shield.

    摘要翻译： 本发明人进行了测试，发现为了防止粘附膜的剥离，将曲率半径设定为等于或大于预定阈值不是重要的。 本发明的发明人还发现，粘合膜的剥离发生在屏蔽的曲率变化的区域中，并且当屏蔽的曲率变化小时不太可能发生。 因此，问题的关键在于屏蔽体的曲率变化的大小，因此逐渐改变曲率使得可以抑制曲率的大的变化，从而防止粘附膜的剥离没有任何缺点 例如由于屏蔽件的尺寸增加而可能发生的膜厚分布的劣化。