Isolation method of defining active fins, method of fabricating semiconductor device using the same and semiconductor device fabricated thereby
    1.
    发明申请
    Isolation method of defining active fins, method of fabricating semiconductor device using the same and semiconductor device fabricated thereby 审中-公开
    限定活性鳍片的隔离方法,使用其制造半导体器件的方法以及由此制造的半导体器件

    公开(公告)号:US20070134884A1

    公开(公告)日:2007-06-14

    申请号:US11488584

    申请日:2006-07-18

    摘要: An isolation method of defining active fins, a method of fabricating a semiconductor device using the same, and a semiconductor device fabricated thereby are provided. The method of fabricating a semiconductor device includes: preparing a semiconductor substrate; and forming a plurality of active fins having major and minor axes and two-dimensionally arrayed on the semiconductor substrate in directions of the major and minor axes. A liner pattern is formed on lower sidewalls of the active fins. An isolation layer is formed on the semiconductor substrate having the liner pattern, and the isolation layer exposes top surfaces of the active fins and a part of the active fins' sidewalls substantially parallel to the major axis. Parallel gate lines are formed to cover the top surfaces and the exposed sidewalls of the active fins, cross over the active fins, and run on the isolation layer.

    摘要翻译: 提供了限定有源散热片的隔离方法,制造使用其的半导体器件的方法以及由此制造的半导体器件。 制造半导体器件的方法包括:制备半导体衬底; 并且在所述主轴和短轴的方向上形成具有主轴和短轴的多个有源散热片,并且二维排列在所述半导体基板上。 衬垫图案形成在活动鳍片的下侧壁上。 在具有衬垫图案的半导体衬底上形成隔离层,并且隔离层暴露活性鳍片的顶表面和基本上平行于长轴的活性鳍片侧壁的一部分。 形成平行栅极线以覆盖活性鳍片的顶表面和暴露的侧壁,跨过活性鳍片并且在隔离层上运行。

    Semiconductor Devices Including Transistors Having Three Dimensional Channels
    2.
    发明申请
    Semiconductor Devices Including Transistors Having Three Dimensional Channels 审中-公开
    包括具有三维通道的晶体管的半导体器件

    公开(公告)号:US20080315282A1

    公开(公告)日:2008-12-25

    申请号:US12199237

    申请日:2008-08-27

    申请人: Eun-Suk Cho Chul Lee

    发明人: Eun-Suk Cho Chul Lee

    IPC分类号: H01L29/788

    摘要: Semiconductor devices including a gate electrode crossing over a semiconductor fin on a semiconductor substrate are provided. A gate insulating layer is provided between the gate electrode and the semiconductor fin. A channel region having a three-dimensional structure defined at the semiconductor fin under the gate electrode is also provided. Doped region is provided in the semiconductor fin at either side of the gate electrode and an interlayer insulating layer is provided on a surface of the semiconductor substrate. A connector region is coupled to the doped region and provided in an opening, which penetrates the interlayer insulating layer. A recess region is provided in the doped region and is coupled to the connector region. The connector region contacts an inner surface of the recess region. Related methods of fabricating semiconductor devices are also provided herein.

    摘要翻译: 提供包括在半导体衬底上与半导体鳍状物交叉的栅电极的半导体器件。 栅极绝缘层设置在栅电极和半导体鳍之间。 还提供了在栅电极下方的半导体鳍片处限定的具有三维结构的沟道区域。 掺杂区域设置在栅电极的任一侧的半导体鳍片中,并且在半导体衬底的表面上设置层间绝缘层。 连接器区域耦合到掺杂区域并且设置在穿过层间绝缘层的开口中。 在掺杂区域中提供凹陷区域并且耦合到连接器区域。 连接器区域接触凹部区域的内表面。 本文还提供了制造半导体器件的相关方法。

    Semiconductor devices having buried bit lines and methods of manufacturing semiconductor devices having buried bit lines
    3.
    发明授权
    Semiconductor devices having buried bit lines and methods of manufacturing semiconductor devices having buried bit lines 失效
    具有掩埋位线的半导体器件和具有掩埋位线的半导体器件的制造方法

    公开(公告)号:US07227220B2

    公开(公告)日:2007-06-05

    申请号:US11240544

    申请日:2005-09-30

    IPC分类号: H01L29/792

    CPC分类号: H01L27/115 H01L27/11568

    摘要: A semiconductor device includes a semiconductor substrate having a first conductivity type and having an upper portion, a pair of bit lines extending in a first direction and doped with an impurity of a second conductivity type opposite to the first conductivity type and spaced from one another in the upper portion of the semiconductor substrate, a first line formed between the pair of bit lines having a plurality of alternating recessed device isolation regions and channel regions, with each of the channel regions contacting each bit line of the at least one pair of bit lines, and word lines formed at right angles to the first lines and covering the channel regions.

    摘要翻译: 半导体器件包括具有第一导电类型并具有上部的半导体衬底,一对位线沿着第一方向延伸并且掺杂有与第一导电类型相反并且彼此间隔开的第二导电类型的杂质 所述半导体衬底的上部,形成在所述一对位线之间的第一线,所述第一线具有多个交替的凹陷器件隔离区域和沟道区域,其中每个沟道区域与所述至少一对位线的每个位线接触 以及与第一线成直角形成并覆盖沟道区的字线。

    Semiconductor devices having buried bit lines and methods of manufacturing semiconductor devices having buried bit lines
    4.
    发明申请
    Semiconductor devices having buried bit lines and methods of manufacturing semiconductor devices having buried bit lines 失效
    具有掩埋位线的半导体器件和具有掩埋位线的半导体器件的制造方法

    公开(公告)号:US20060131613A1

    公开(公告)日:2006-06-22

    申请号:US11240544

    申请日:2005-09-30

    IPC分类号: H01L27/10

    CPC分类号: H01L27/115 H01L27/11568

    摘要: A semiconductor device includes a semiconductor substrate having a first conductivity type and having an upper portion, a pair of bit lines extending in a first direction and doped with an impurity of a second conductivity type opposite to the first conductivity type and spaced from one another in the upper portion of the semiconductor substrate, a first line formed between the pair of bit lines having a plurality of alternating recessed device isolation regions and channel regions, with each of the channel regions contacting each bit line of the at least one pair of bit lines, and word lines formed at right angles to the first lines and covering the channel regions.

    摘要翻译: 半导体器件包括具有第一导电类型并具有上部的半导体衬底,一对位线沿着第一方向延伸并且掺杂有与第一导电类型相反并且彼此间隔开的第二导电类型的杂质 所述半导体衬底的上部,形成在所述一对位线之间的第一线,所述第一线具有多个交替的凹陷器件隔离区域和沟道区域,其中每个沟道区域与所述至少一对位线的每个位线接触 以及与第一线成直角形成并覆盖沟道区的字线。

    Semiconductor devices including transistors having three dimensional channels and methods of fabricating the same
    5.
    发明授权
    Semiconductor devices including transistors having three dimensional channels and methods of fabricating the same 有权
    包括具有三维通道的晶体管的半导体器件及其制造方法

    公开(公告)号:US07432160B2

    公开(公告)日:2008-10-07

    申请号:US11699301

    申请日:2007-01-29

    申请人: Eun-Suk Cho Chul Lee

    发明人: Eun-Suk Cho Chul Lee

    IPC分类号: H01L21/336 H01L21/8234

    摘要: Semiconductor devices including a gate electrode crossing over a semiconductor fin on a semiconductor substrate are provided. A gate insulating layer is provided between the gate electrode and the semiconductor fin. A channel region having a three-dimensional structure defined at the semiconductor fin under the gate electrode is also provided. Doped region is provided in the semiconductor fin at either side of the gate electrode and an interlayer insulating layer is provided on a surface of the semiconductor substrate. A connector region is coupled to the doped region and provided in an opening, which penetrates the interlayer insulating layer. A recess region is provided in the doped region and is coupled to the connector region. The connector region contacts an inner surface of the recess region. Related methods of fabricating semiconductor devices are also provided herein.

    摘要翻译: 提供包括在半导体衬底上与半导体鳍状物交叉的栅电极的半导体器件。 栅极绝缘层设置在栅电极和半导体鳍之间。 还提供了在栅电极下方的半导体鳍片处限定的具有三维结构的沟道区域。 掺杂区域设置在栅电极的任一侧的半导体鳍片中,并且在半导体衬底的表面上设置层间绝缘层。 连接器区域耦合到掺杂区域并且设置在穿过层间绝缘层的开口中。 在掺杂区域中提供凹陷区域并且耦合到连接器区域。 连接器区域接触凹部区域的内表面。 本文还提供了制造半导体器件的相关方法。

    Semiconductor devices including transistors having three dimensional channels and methods of fabricating the same
    6.
    发明申请
    Semiconductor devices including transistors having three dimensional channels and methods of fabricating the same 有权
    包括具有三维通道的晶体管的半导体器件及其制造方法

    公开(公告)号:US20070184627A1

    公开(公告)日:2007-08-09

    申请号:US11699301

    申请日:2007-01-29

    申请人: Eun-Suk Cho Chul Lee

    发明人: Eun-Suk Cho Chul Lee

    IPC分类号: H01L21/20

    摘要: Semiconductor devices including a gate electrode crossing over a semiconductor fin on a semiconductor substrate are provided. A gate insulating layer is provided between the gate electrode and the semiconductor fin. A channel region having a three-dimensional structure defined at the semiconductor fin under the gate electrode is also provided. Doped region is provided in the semiconductor fin at either side of the gate electrode and an interlayer insulating layer is provided on a surface of the semiconductor substrate. A connector region is coupled to the doped region and provided in an opening, which penetrates the interlayer insulating layer. A recess region is provided in the doped region and is coupled to the connector region. The connector region contacts an inner surface of the recess region. Related methods of fabricating semiconductor devices are also provided herein.

    摘要翻译: 提供包括在半导体衬底上与半导体鳍状物交叉的栅电极的半导体器件。 栅极绝缘层设置在栅电极和半导体鳍之间。 还提供了在栅电极下方的半导体鳍片处限定的具有三维结构的沟道区域。 掺杂区域设置在栅电极的任一侧的半导体鳍片中,并且在半导体衬底的表面上设置层间绝缘层。 连接器区域耦合到掺杂区域并且设置在穿过层间绝缘层的开口中。 在掺杂区域中提供凹陷区域并且耦合到连接器区域。 连接器区域接触凹部区域的内表面。 本文还提供了制造半导体器件的相关方法。

    Methods of Manufacturing Semiconductor devices Having Buried Bit Lines
    7.
    发明申请
    Methods of Manufacturing Semiconductor devices Having Buried Bit Lines 审中-公开
    制造埋置位线的半导体器件的方法

    公开(公告)号:US20070190725A1

    公开(公告)日:2007-08-16

    申请号:US11740525

    申请日:2007-04-26

    IPC分类号: H01L21/336

    CPC分类号: H01L27/115 H01L27/11568

    摘要: A semiconductor device includes a semiconductor substrate having a first conductivity type and having an upper portion, a pair of bit lines extending in a first direction and doped with an impurity of a second conductivity type opposite to the first conductivity type and spaced from one another in the upper portion of the semiconductor substrate, a first line formed between the pair of bit lines having a plurality of alternating recessed device isolation regions and channel regions, with each of the channel regions contacting each bit line of the at least one pair of bit lines, and word lines formed at right angles to the first lines and covering the channel regions.

    摘要翻译: 半导体器件包括具有第一导电类型并具有上部的半导体衬底,一对位线沿着第一方向延伸并且掺杂有与第一导电类型相反并且彼此间隔开的第二导电类型的杂质 所述半导体衬底的上部,形成在所述一对位线之间的第一线,所述第一线具有多个交替的凹陷器件隔离区域和沟道区域,其中每个沟道区域与所述至少一对位线的每个位线接触 以及与第一线成直角形成并覆盖沟道区的字线。

    Recessed transistor and method of manufacturing the same
    8.
    发明授权
    Recessed transistor and method of manufacturing the same 有权
    嵌入式晶体管及其制造方法

    公开(公告)号:US09012982B2

    公开(公告)日:2015-04-21

    申请号:US12068179

    申请日:2008-02-04

    IPC分类号: H01L29/66 H01L29/78

    摘要: A recessed transistor and a method of manufacturing the same are provided. The recessed transistor may include a substrate, an active pin, a gate pattern and source and drain regions. The substrate may include an isolation layer that establishes an active region and a field region of the substrate. The substrate may include a recessed structure having an upper recess formed in the active region and a lower recess in communication with the upper recess. An active pin may be formed in a region between side surfaces of the isolation layer and the lower recess and an interface between the active region and the field region. The gate pattern may include a gate insulation layer formed on an inner surface of the recessed structure and a gate electrode formed on the gate insulation layer in the recessed structure. The source/drain regions may be formed adjacent to the active region and the gate electrode.

    摘要翻译: 提供凹陷晶体管及其制造方法。 凹陷的晶体管可以包括衬底,有源引脚,栅极图案以及源极和漏极区域。 衬底可以包括建立衬底的有源区和场区的隔离层。 衬底可以包括具有形成在有源区域中的上凹部的凹陷结构和与上凹部连通的下凹部。 有源销可以形成在隔离层和下凹部的侧表面之间的区域中以及有源区域和场区域之间的界面。 栅极图案可以包括形成在凹陷结构的内表面上的栅极绝缘层和形成在凹陷结构中的栅极绝缘层上的栅电极。 源/漏区可以与有源区和栅电极相邻形成。

    Method for fabricating multiple FETs of different types
    9.
    发明申请
    Method for fabricating multiple FETs of different types 有权
    制造不同类型多个FET的方法

    公开(公告)号:US20070298599A1

    公开(公告)日:2007-12-27

    申请号:US11804875

    申请日:2007-05-21

    IPC分类号: H01L21/8232

    CPC分类号: H01L21/823412

    摘要: For fabricating multiple field effect transistors (FETs), a first conductive layer is deposited over first and second active regions of a semiconductor substrate. The first conductive layer is patterned over the second active region to form mold structures. Mask structures are formed between the mold structures. The second active region is patterned using the mask structures or using spacers formed at sidewalls of the mold structures to form multiple fins of a field effect transistor of a fin type. The first conductive layer is patterned over the first active region to form a gate of another field effect transistor of a different type.

    摘要翻译: 为了制造多个场效应晶体管(FET),第一导电层沉积在半导体衬底的第一和第二有源区上。 在第二有源区上形成第一导电层以形成模具结构。 在模具结构之间形成掩模结构。 使用掩模结构或使用形成在模具结构的侧壁处的间隔来形成第二有源区,以形成翅片型场效应晶体管的多个鳍。 在第一有源区上图案化第一导电层以形成不同类型的另一场效应晶体管的栅极。

    Recessed transistor and method of manufacturing the same
    10.
    发明申请
    Recessed transistor and method of manufacturing the same 有权
    嵌入式晶体管及其制造方法

    公开(公告)号:US20080185641A1

    公开(公告)日:2008-08-07

    申请号:US12068179

    申请日:2008-02-04

    IPC分类号: H01L29/78 H01L21/336

    摘要: A recessed transistor and a method of manufacturing the same are provided. The recessed transistor may include a substrate, an active pin, a gate pattern and source and drain regions. The substrate may include an isolation layer that establishes an active region and a field region of the substrate. The substrate may include a recessed structure having an upper recess formed in the active region and a lower recess in communication with the upper recess. An active pin may be formed in a region between side surfaces of the isolation layer and the lower recess and an interface between the active region and the field region. The gate pattern may include a gate insulation layer formed on an inner surface of the recessed structure and a gate electrode formed on the gate insulation layer in the recessed structure. The source/drain regions may be formed adjacent to the active region and the gate electrode.

    摘要翻译: 提供凹陷晶体管及其制造方法。 凹陷的晶体管可以包括衬底,有源引脚,栅极图案以及源极和漏极区域。 衬底可以包括建立衬底的有源区和场区的隔离层。 衬底可以包括具有形成在有源区域中的上凹部的凹陷结构和与上凹部连通的下凹部。 有源销可以形成在隔离层和下凹部的侧表面之间的区域中以及有源区域和场区域之间的界面。 栅极图案可以包括形成在凹陷结构的内表面上的栅极绝缘层和形成在凹陷结构中的栅极绝缘层上的栅电极。 源/漏区可以与有源区和栅电极相邻形成。