MEMORY SYSTEM AND METHOD
    1.
    发明公开

    公开(公告)号:US20230298685A1

    公开(公告)日:2023-09-21

    申请号:US17896887

    申请日:2022-08-26

    CPC classification number: G11C29/52 G11C29/021 G11C8/08 H03M13/1125

    Abstract: A memory system includes a semiconductor memory device including a plurality of memory cells each configured to store data in a non-volatile manner according to a threshold voltage thereof and connected to a word line, and a controller configured to perform an error correction based on hard bit data and soft bit data read from the plurality of memory cells, generate a first table based on corrected data, determine a voltage difference between a first voltage and a second voltage, the first voltage being a voltage applied to the word line when the data being corrected is read, and correct the first table based on the voltage difference.

    MEMORY SYSTEM AND METHOD
    2.
    发明申请

    公开(公告)号:US20250157564A1

    公开(公告)日:2025-05-15

    申请号:US19021029

    申请日:2025-01-14

    Abstract: A memory system includes a semiconductor memory device including a plurality of memory cells each configured to store data in a non-volatile manner according to a threshold voltage thereof and connected to a word line, and a controller configured to perform an error correction based on hard bit data and soft bit data read from the plurality of memory cells, generate a first table based on corrected data, determine a voltage difference between a first voltage and a second voltage, the first voltage being a voltage applied to the word line when the data being corrected is read, and correct the first table based on the voltage difference.

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