Abstract:
Provided is a positioning adjustment apparatus for a mobile device in scanning and photography, including a main body and a lifting unit. An object to be scanned is placed on the main body, and the mobile device placed on a carrier platform of the lifting unit can move up and down along with the lifting unit to adjust a distance between the mobile device and the object to be scanned. After scanning, a document is sent directly to a shredder. The invention also provides a wireless signal transmission to operate the mobile device for scanning or photography to meet various demands of the users.
Abstract:
Fans. A fan comprises a hub, a ring and a plurality of flat blades. The ring surrounds the hub without substantial contact therewith and is connected to the hub by at least one connecting arm. The flat blades are disposed on the ring and comprise active surface which extending lines of the active surfaces are tangent to a circle.
Abstract:
A method and a system are provided for calibrating metrological tools used to measure features of a semiconductor device. A critical dimension (CD) ruler defines a known pitch plus a pitch offset. A photoresist layer is measured to determine a measured pitch whereupon the measured pitch is compared to the known pitch. From the comparison, appropriate calibration steps can be taken to reduce the difference between the known pitch and the measured pitch.
Abstract:
An impeller is applied to a centrifugal fan and includes fan blades and a hub. Each fan blade includes a first portion and a second portion. The first portion is located relatively close to the hub and the first portion is coupled to the second portion. The first portion has a windward side and a leeward side, and the windward side is parallel to the leeward side. The second portion is located relatively far away from the hub. The second portion has a windward side and a leeward side, and the windward side and the leeward side are two curved surfaces with different specific curvatures.
Abstract:
A method and a system are provided for calibrating metrological tools used to measure features of a semiconductor device. A critical dimension (CD) ruler defines a known pitch plus a pitch offset. A photoresist layer is measured to determine a measured pitch whereupon the measured pitch is compared to the known pitch. From the comparison, appropriate calibration steps can be taken to reduce the difference between the known pitch and the measured pitch.
Abstract:
A transformer insulation film structure mainly comprises a winding roll for insulation film and coils. The insulation film is cut at both sides to form a number of flaps, which dimensions depend on the transformer specifications. Due to restraint by the width of the winding roll, the side flaps of the insulation film stand up and overlap after repeated winding to achieve the required insulation thickness. Through insulation film winding and overlapping, we can achieve the required surface distance on both sides of the winding roll. By this means, we can achieve the target surface distance without the need of a complicated structure in the traditional technology, so we will benefit from the simplified structure.
Abstract:
A backplane structure is capable of being mounted with two interface cards for being used in an industrial computer. The backplane structure includes a backplane capable of being connected to a mother board of the industrial computer and having a first side, a second side and a height of 1U (1.75″). A first peripheral component interconnection (PCI) port is provided on an upper portion of said first side, an industry standard architecture (ISA) port having a plurality of terminals on two ends thereof is provided on the lower portion of the second side by soldering so as to form a terminal-less region on the first side. In addition, a second peripheral component interconnection (PCI) port is provided on the terminal-less region on the first side.
Abstract:
The invention discloses a compute system which may detect the state of a power supply. The system includes a power supply and a motherboard. The power supply has a detecting unit for detecting a power state of the power supply. The detected information is converted to a high-frequency signal and outputted to the motherboard via a “power good” pin in an ATX power connector. The motherboard may obtain a voltage, current, power, temperature and other values inside the power supply via the ATX power connector and allow the values to be displayed on the screen to provide a real-time monitoring function for the users.
Abstract:
The invention discloses a compute system which may detect the state of a power supply. The system includes a power supply and a motherboard. The power supply has a detecting unit for detecting a power state of the power supply. The detected information is converted to a high-frequency signal and outputted to the motherboard via a “power good” pin in an ATX power connector. The motherboard may obtain a voltage, current, power, temperature and other values inside the power supply via the ATX power connector and allow the values to be displayed on the screen to provide a real-time monitoring function for the users.
Abstract:
An exhaust monitoring cup which measures exhaust gas flowing through a top opening in a coater cup of a spin coating apparatus used in the deposition of photoresist coatings on semiconductor wafers. The exhaust monitoring cup includes a gas flow cup which is positioned in fluid communication with the top opening of the coater cup. The exhaust gas flows through a gas flow opening in the gas flow cup, and a flow rate measuring apparatus at the gas flow opening receives the exhaust gas and measures the flow rate thereof. The flow rate of the gas leaving the gas flow cup can be compared to the flow rate of the gas flowing from an exhaust conduit leading from the bottom of the coater cup, to facilitate detection of abnormal conditions in the coater cup or exhaust conduit.