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公开(公告)号:US20190355875A1
公开(公告)日:2019-11-21
申请号:US16474197
申请日:2017-12-27
Applicant: LG INNOTEK CO., LTD.
Inventor: Woong Sun YUM , Hyun Ju KIM , Jin Soo PARK , Seung Il LEE , Jae Young IM
Abstract: An embodiment discloses a semiconductor device comprising: a light-emitting structure having a first conductive semiconductor layer, a second conductive semiconductor layer and an active layer disposed between the first conductive semiconductor layer and the second conductive semiconductor layer; a first electrode disposed on the first conductive semiconductor layer; a second electrode disposed below the second conductive semiconductor layer; and a current blocking layer disposed between the second conductive semiconductor layer and the second electrode, wherein the first conductive semiconductor layer includes a first region in which the first electrode is disposed and a second region, the thickness of which is less than the thickness of the first region, and the current blocking layer is disposed in a region corresponding to the first region in the thickness direction.
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公开(公告)号:US20170125638A1
公开(公告)日:2017-05-04
申请号:US15301166
申请日:2015-04-02
Applicant: LG INNOTEK CO., LTD.
Inventor: Woong Sun YUM , Ji Hyun KOO , Hyun Ju KIM , Kyung Wook PARK , Sung Ho CHOO
CPC classification number: H01L33/405 , H01L33/0008 , H01L33/0075 , H01L33/0079 , H01L33/0095 , H01L33/22 , H01L33/32 , H01L33/382 , H01L33/62 , H01L2224/48091 , H01L2924/181 , H01L2933/0016 , H01L2924/00014 , H01L2924/00012
Abstract: A light-emitting device discloses a light emitting structure layer including an active layer between first and second conductive semiconductor layers, a first electrode electrically connected to the first conductive semiconductor layer, a contact layer disposed under the second conductive semiconductor layer, a reflective layer disposed under the contact layer, a capping layer disposed under the reflective layer, and a conductive supporting member disposed under the capping layer. The reflective layer comprises a thickness that is greater than the thickness of the second conductive semiconductor layer and 90 or more times greater than the thickness of the contact layer.
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