公开(公告)号：US09885083B2

公开(公告)日：2018-02-06

申请号：US14410886

申请日：2013-06-25

Applicant: LIFE TECHNOLOGIES CORPORATION

Inventor： Scott Conradson ,  David Dinauer ,  Bin Zhao ,  Dmitriy Gremyachinskiy ,  Jason Myers ,  Jeffrey Rossio ,  Victoria Singer ,  Kristina Giorda

IPC: C12Q1/68 ,  G01N33/543 ,  G01N33/569 ,  G01N33/68

CPC classification number: C12Q1/6876 ,  G01N33/543 ,  G01N33/54326 ,  G01N33/54373 ,  G01N33/56977 ,  G01N33/6854 ,  G01N2333/4703

Abstract: Accordingly, in some embodiments methods for detecting an analyte or analytes in one or more sample(s) are provided. The methods encompass providing a solid support with an addressable marker and an associated ligand, contacting the solid substrate to a sample, thereby forming a contacted solid support, associating the contacted solid support with a FET array and detecting the electrical properties of the FET array and thereby detecting an analyte or analytes in one or more samples. In other embodiments, the sample encompasses a second addressable marker.

公开(公告)号：US10914735B2

公开(公告)日：2021-02-09

申请号：US15846035

申请日：2017-12-18

Applicant: LIFE TECHNOLOGIES CORPORATION

Inventor： Scott Conradson ,  David Dinauer ,  Bin Zhao ,  Dmitriy Gremyachinskiy ,  Jason Myers ,  Jeffrey Rossio ,  Victoria Singer ,  Kristina Giorda

IPC: G01N33/543 ,  G01N33/569 ,  G01N35/00 ,  C12Q1/6876 ,  G01N33/68

Abstract: Accordingly, in some embodiments methods for detecting an analyte or analytes in one or more sample(s) are provided. The methods encompass providing a solid support with an addressable marker and an associated ligand, contacting the solid substrate to a sample, thereby forming a contacted solid support, associating the contacted solid support with a FET array and detecting the electrical properties of the FET array and thereby detecting an analyte or analytes in one or more samples. In other embodiments, the sample encompasses a second addressable marker.

公开(公告)号：US20180100194A1

公开(公告)日：2018-04-12

申请号：US15846035

申请日：2017-12-18

Applicant: LIFE TECHNOLOGIES CORPORATION

Inventor： Scott Conradson ,  David Dinauer ,  Bin Zhao ,  Dmitriy Gremyachinskiy ,  Jason Myers ,  Jeffrey Rossio ,  Victoria Singer ,  Kristina Giorda

IPC: C12Q1/6876 ,  G01N33/543 ,  G01N33/569 ,  G01N33/68

CPC classification number: C12Q1/6876 ,  G01N33/543 ,  G01N33/54326 ,  G01N33/54373 ,  G01N33/56977 ,  G01N33/6854 ,  G01N2333/4703

Abstract: Accordingly, in some embodiments methods for detecting an analyte or analytes in one or more sample(s) are provided. The methods encompass providing a solid support with an addressable marker and an associated ligand, contacting the solid substrate to a sample, thereby forming a contacted solid support, associating the contacted solid support with a FET array and detecting the electrical properties of the FET array and thereby detecting an analyte or analytes in one or more samples. In other embodiments, the sample encompasses a second addressable marker.

公开(公告)号：US20150203912A1

公开(公告)日：2015-07-23

申请号：US14410886

申请日：2013-06-25

Applicant: LIFE TECHNOLOGIES CORPORATION

Inventor： Scott Conradson ,  David Dinauer ,  Bin Zhao ,  Dmitriy Gremyachinskiy ,  Jason Myers ,  Jeffrey Rossio ,  Victoria Singer ,  Kristina Glorda

IPC: C12Q1/68 ,  G01N33/68

CPC classification number: C12Q1/6876 ,  G01N33/543 ,  G01N33/54326 ,  G01N33/54373 ,  G01N33/56977 ,  G01N33/6854 ,  G01N2333/4703

Abstract: Accordingly, in some embodiments methods for detecting an analyte or analytes in one or more sample(s) are provided. The methods encompass providing a solid support with an addressable marker and an associated ligand, contacting the solid substrate to a sample, thereby forming a contacted solid support, associating the contacted solid support with a FET array and detecting the electrical properties of the FET array and thereby detecting an analyte or analytes in one or more samples. In other embodiments, the sample encompasses a second addressable marker.

Abstract translation: 因此，在一些实施例中，提供了用于检测一个或多个样品中的分析物或分析物的方法。 所述方法包括提供具有可寻址标记和相关配体的固体支持物，使固体基质接触样品，从而形成接触的固体支持物，将接触的固体支持物与FET阵列相关联并检测FET阵列的电特性， 从而检测一个或多个样品中的分析物或分析物。 在其他实施例中，样本包含第二可寻址标记。