Abstract:
A difference measurement circuit including a first port and a second port for connection to a first set of nodes and a second set of nodes of a sensor unit. The circuit further includes switching units for switching excitation signals emanating from excitation nodes from being applied to the first set of nodes via the first port to being applied to the second set of nodes via the second port and for switching differential measurement signals measured at sensing nodes from being obtained from the second set of nodes via the second port to being obtained from the first set of nodes via the first port. A corresponding method is described. The circuit further includes redundancy testing circuitry for evaluating the similarity or deviation between measurement signals obtained in different states of the switching units.
Abstract:
A method for reading out a sensor unit having a first set of nodes and a second set of nodes and a symmetry which allows different configurations of excitation and sensing lead to a same readout. The method includes changing the readout configuration of the sensor unit by exchanging excitation and sensing between the first set of nodes and the second set of nodes, evaluating the similarity or deviation between measurement signals obtained in different readout configurations of the sensor unit, raising an error if the measurement signals differ more from one another than a predetermined value.
Abstract:
A difference measurement circuit having a first port and a second port for connection to a first set of nodes and a second set of nodes of a sensor unit. The circuit further has switching units for switching excitation signals emanating from excitation nodes from being applied to the first set of nodes (A, B) via the first port to being applied to the second set of nodes via the second port and for switching differential measurement signals measured at sensing nodes from being obtained from the second set of nodes via the second port to being obtained from the first set of nodes via the first port. The circuit further includes redundancy testing circuitry for evaluating the similarity or deviation between measurement signals obtained in different states of the switching units.
Abstract:
Circuit and method for biasing a plate-shaped sensor element (2) made of doped semiconductor material and having a first resp. second excitation contact (C, A) connected to a first resp. second excitation node (Cn, An), and a first resp. second sense contact (B, D) connected to a first resp. second sense node (Bn, Dn). The plate-shaped sensor element is electrically isolated from a substrate or well (5) by means of a first PN-junction. The method comprises: a) applying to the first excitation node (Cn) a predefined first current (Iex) generated by a first current source (11); b) applying to the second excitation node (An) a second current (I′ex) generated by a controllable second source (12); c) controlling the second source (12) by means of a negative feedback loop based on a comparison between a value representative for a common mode voltage (Vcm) of the voltages (VB, VD) of the sense nodes (Bn, Dn) and a predefined reference voltage (Vref), such that the common mode voltage (Vcm) is substantially equal to the reference voltage (Vref).