RESPONDING TO POWER LOSS
    1.
    发明申请

    公开(公告)号:US20210104284A1

    公开(公告)日:2021-04-08

    申请号:US17123396

    申请日:2020-12-16

    Abstract: Memories including an array of memory cells, a local access line connected to a plurality of memory cells of the array of memory cells, a global access line, a transistor connected between the global access line and the local access line, and an energy store either selectively connected to a control gate of the transistor, or selectively connected to a control gate of a different transistor connected between the control gate of the transistor and a voltage node configured to receive a reference potential.

    Memory devices with controlled wordline ramp rates, and associated systems and methods

    公开(公告)号:US10546641B1

    公开(公告)日:2020-01-28

    申请号:US16214007

    申请日:2018-12-07

    Abstract: Memory devices with controlled wordline ramp rates and associated systems and methods are disclosed herein. In one embodiment, a memory device includes at least one voltage regulator and a plurality of wordlines. The memory device is configured, during a programming operation of the memory region, to ramp a selected wordline to a desired programming voltage while ramping one or more adjacent, unselected wordlines electrically coupled to the selected wordline to desired inhibit voltage(s) using the at least one voltage regulator. In some embodiments, the memory device ramps the selected wordline and the one or more adjacent, unselected wordlines such that the one or more adjacent, unselected wordlines reach the desired inhibit voltage(s) when the selected wordline reaches the desired programming voltage. In these and other embodiments, the memory device ramps the selected wordline to the desired programming voltage without floating the selected wordline.

    Responding to power loss
    3.
    发明授权

    公开(公告)号:US11205492B2

    公开(公告)日:2021-12-21

    申请号:US17123396

    申请日:2020-12-16

    Abstract: Memories including an array of memory cells, a local access line connected to a plurality of memory cells of the array of memory cells, a global access line, a transistor connected between the global access line and the local access line, and an energy store either selectively connected to a control gate of the transistor, or selectively connected to a control gate of a different transistor connected between the control gate of the transistor and a voltage node configured to receive a reference potential.

    BOOSTED CHANNEL PROGRAMMING OF MEMORY
    4.
    发明申请

    公开(公告)号:US20180308551A1

    公开(公告)日:2018-10-25

    申请号:US15928856

    申请日:2018-03-22

    Abstract: Methods of operating a memory include boosting a channel voltage of a memory cell selected for programming to a particular voltage level for a particular programming pulse, boosting the channel voltage of the memory cell selected for programming to a second voltage level, greater than the particular voltage level, for a subsequent programming pulse, and boosting the channel voltage of the memory cell selected for programming to a third voltage level, greater than the second voltage level, for a next subsequent programming pulse.

    Boosted channel programming of memory

    公开(公告)号:US11183247B2

    公开(公告)日:2021-11-23

    申请号:US16546417

    申请日:2019-08-21

    Abstract: Methods of operating a memory include boosting a channel voltage of a memory cell selected for programming to a particular voltage level for a particular programming pulse, boosting the channel voltage of the memory cell selected for programming to a second voltage level, greater than the particular voltage level, for a subsequent programming pulse, and boosting the channel voltage of the memory cell selected for programming to a third voltage level, greater than the second voltage level, for a next subsequent programming pulse.

    MEMORY DEVICES INCLUDING VOLTAGE GENERATION SYSTEMS

    公开(公告)号:US20210272635A1

    公开(公告)日:2021-09-02

    申请号:US17321569

    申请日:2021-05-17

    Abstract: A memory device includes a memory array comprising a plurality of planes, a plurality of voltage generation systems, and a controller. Each voltage generation system is electrically coupled to a corresponding plane. The controller is configured to turn on and warm up each voltage generation system of the plurality of voltage generation systems in response to a first command to access any plane of the plurality of planes and turn off and slowly discharge each voltage generation system of the plurality of voltage generation systems into an idle state in response to no commands being processed. In response to receiving a subsequent command to access any plane of the plurality of planes prior to the voltage generation systems reaching the idle state, a warm up period of the plurality of voltage generation systems is reduced.

    Memory devices with controlled wordline ramp rates, and associated systems and methods

    公开(公告)号:US11004513B2

    公开(公告)日:2021-05-11

    申请号:US16752981

    申请日:2020-01-27

    Abstract: Memory devices with controlled wordline ramp rates and associated systems and methods are disclosed herein. In one embodiment, a memory device includes at least one voltage regulator and a plurality of wordlines. The memory device is configured, during a programming operation of the memory region, to ramp a selected wordline to a desired programming voltage while ramping one or more adjacent, unselected wordlines electrically coupled to the selected wordline to desired inhibit voltage(s) using the at least one voltage regulator. In some embodiments, the memory device ramps the selected wordline and the one or more adjacent, unselected wordlines such that the one or more adjacent, unselected wordlines reach the desired inhibit voltage(s) when the selected wordline reaches the desired programming voltage. In these and other embodiments, the memory device ramps the selected wordline to the desired programming voltage without floating the selected wordline.

    Responding to power loss
    8.
    发明授权

    公开(公告)号:US10892022B1

    公开(公告)日:2021-01-12

    申请号:US16553449

    申请日:2019-08-28

    Abstract: Methods of operating a memory, and memories configured to perform similar methods, might include initiating discharge of a global access line that is connected to a local access line through a transistor, and electrically floating a control gate of the transistor, in response to a supply voltage decreasing to a first threshold, and initiating discharge of the control gate of the transistor in response to the supply voltage decreasing to a second threshold lower than the first threshold.

    Boosted channel programming of memory

    公开(公告)号:US10431310B2

    公开(公告)日:2019-10-01

    申请号:US15928856

    申请日:2018-03-22

    Abstract: Methods of operating a memory include boosting a channel voltage of a memory cell selected for programming to a particular voltage level for a particular programming pulse, boosting the channel voltage of the memory cell selected for programming to a second voltage level, greater than the particular voltage level, for a subsequent programming pulse, and boosting the channel voltage of the memory cell selected for programming to a third voltage level, greater than the second voltage level, for a next subsequent programming pulse.

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