WAFER TESTING PROBE CARD
    1.
    发明申请
    WAFER TESTING PROBE CARD 有权
    波形测试探头卡

    公开(公告)号:US20140210505A1

    公开(公告)日:2014-07-31

    申请号:US14162766

    申请日:2014-01-24

    CPC classification number: G01R1/0735 G01R1/06733 G01R1/07314

    Abstract: A wafer testing probe card includes a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. The flexible circuit board is electrically connected to the printed circuit board. The elastic piece is disposed between the printed circuit board and the flexible circuit board. The probe unit includes a probe head and a plurality of probes. The probe head is fixed on the printed circuit board and has a plurality of through holes. The probes respectively pass through the through holes and move up and down relative to the probe head.

    Abstract translation: 晶片测试探针卡包括印刷电路板,柔性电路板,弹性片和探针单元。 柔性电路板电连接到印刷电路板。 弹性片设置在印刷电路板和柔性电路板之间。 探针单元包括探针头和多个探针。 探针头固定在印刷电路板上并具有多个通孔。 探针分别穿过通孔并相对于探针头上下移动。

    Probe Needle and Probe Module Using the Same
    2.
    发明申请
    Probe Needle and Probe Module Using the Same 有权
    探针和探头模块使用相同

    公开(公告)号:US20140352460A1

    公开(公告)日:2014-12-04

    申请号:US14294958

    申请日:2014-06-03

    CPC classification number: G01R1/07357 G01R1/0675

    Abstract: A probe needle includes a head, a tail and a body connected between the head and the tail and provided with a first flat section curvedly extending from the head towards the tail for providing sufficient deformation when the tail is pressed on a device under test, and a second flat section neighbored to the first flat section for supporting the probe needle in between upper and lower dies. When the probe needles are used in a probe module, the probe needles can be arranged with a pitch same as that of the conventional probe needles even though the probe needles are formed from posts having a relatively greater diameter than that of the posts for making the conventional probe needles, such that the probe needles may have enhanced current withstanding capacity and prolonged lifespan.

    Abstract translation: 探针包括头部,尾部和连接在头部和尾部之间的主体,并且设置有从头部向尾部弯曲延伸的第一平坦部分,用于当尾部被按压在被测设备上时提供足够的变形,以及 靠近第一平坦部分的第二平坦部分,用于将探针支撑在上模和下模之间。 当探头针头用于探针模块时,探针可以布置成与传统探针相同的间距,即使探针由具有比柱的直径相对更大的直径的柱形成, 传统的探针,使得探针可以具有增强的电流承受能力和延长的寿命。

    PROBE DEVICE HAVING SPRING PROBE
    3.
    发明申请
    PROBE DEVICE HAVING SPRING PROBE 有权
    具有弹簧探头的探头装置

    公开(公告)号:US20150276807A1

    公开(公告)日:2015-10-01

    申请号:US14628658

    申请日:2015-02-23

    CPC classification number: G01R1/06722 G01R1/06705 G01R1/07342 G01R3/00

    Abstract: A probe device includes a spring probe having a spring sleeve with at least a spring section and a connection segment fixed to a needle and having a convex portion protruding over an outer cylinder surface of the spring section, and a probe seat having stacked dies and at least a guiding hole through which the probe is inserted. The dies includes a lower die, a supporting die above the lower die and a non-circular supporting hole at the supporting die. The distance between a supporting surface and a center of the supporting hole is greater than the radius of the outer cylinder surface and smaller than the distance between a guiding surface of the supporting hole and the center, which is greater than the maximum distance between the convex portion and a needle center, thereby preventing the probe receiving external force from exceeding deflection and bending.

    Abstract translation: 探针装置包括:弹簧探针,其具有至少弹簧部分的弹簧套筒和固定到针头的连接部分,并且具有突出在弹簧部分的外筒表面上的凸出部分,以及具有堆叠模具的探针座 至少一个引导孔,探针插入该引导孔。 模具包括下模,下模上方的支撑模和在支撑模处的非圆形支撑孔。 支撑面和支撑孔的中心之间的距离大于外筒表面的半径,并且小于支撑孔的引导表面和中心之间的距离,该距离大于凸起 部分和针中心,从而防止探头接收外力超过偏转和弯曲。

    ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE
    4.
    发明申请
    ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE 有权
    用于垂直探针装置的组装方法和维护方法

    公开(公告)号:US20150253358A1

    公开(公告)日:2015-09-10

    申请号:US14643780

    申请日:2015-03-10

    Abstract: An assembling method for a vertical probe device includes steps of disposing a lower die on a jig by inserting supporting columns through jig holes of the lower die, fastening a positioning film on the supporting columns, installing probe needles and an upper die in a way that the positioning film is located between the upper and lower dies without contacting the upper die, unfastening the positioning film, and removing the jig so that the upper and lower dies, positioning film and probe needles constitute the device. A maintaining method for the device includes steps of inserting the supporting columns through the jig holes, fastening the positioning film to the jig, and removing the upper die. The probe needles and upper die are easily removed and installed and the probe needles are reliable. The vertical probe device is applicable for accommodating electronic components on the top thereof.

    Abstract translation: 垂直探针装置的组装方法包括以下步骤:通过将支撑柱插入下模的夹具孔,将下模设置在夹具上,将定位膜紧固在支撑柱上,安装探针和上模, 定位膜位于上模和下模之间,不接触上模,松开定位膜,并移除夹具,使上,下模,定位膜和探针构成装置。 该装置的保持方法包括以下步骤:将支撑柱插入夹具孔中,将定位膜紧固到夹具上,并移除上模。 探头针和上模容易拆卸和安装,探针可靠。 垂直探针装置适用于在其顶部容纳电子部件。

    SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAME

    公开(公告)号:US20170097376A1

    公开(公告)日:2017-04-06

    申请号:US15282330

    申请日:2016-09-30

    CPC classification number: G01R1/06722 G01R1/0675

    Abstract: A spring probe includes a needle, a spring sleeve sleeved onto and fixed to the needle and having non-spring sections and at least one spring section, and an outer sleeve sleeved onto the spring sleeve and covering the at least one spring section. A part of the outer sleeve is connected with the spring sleeve. A probe device includes the spring probe, and a probe seat having dies piled on one another, including upper and lower dies. The spring probe is inserted through the dies in a way that a bottom end of the spring sleeve is abutted on the lower die.

    PROBE HEAD
    6.
    发明申请
    PROBE HEAD 审中-公开

    公开(公告)号:US20170122978A1

    公开(公告)日:2017-05-04

    申请号:US15260326

    申请日:2016-09-09

    CPC classification number: G01R1/06722

    Abstract: A probe head includes a probe base, a film, and a probe assembly. The probe base includes first, second, and third guiding boards. The second guiding board is fixed between the first and third guiding boards. The film is fixed to the probe base and has a hole. The probe assembly passes through the first, second, and third guiding boards and the hole, and includes a probe and an outer spring sleeve. The probe has a tip passing out through the third guiding board. The outer spring sleeve is sleeved at the exterior of the probe and has a spring area and a plurality of non-spring areas. The spring area is disposed between adjacent two of the non-spring areas. One of the non-spring areas has a bonding section mounted to the probe and retained between the third guiding board and the film.

    VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME
    7.
    发明申请
    VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME 审中-公开
    垂直探针装置和支持器

    公开(公告)号:US20150276800A1

    公开(公告)日:2015-10-01

    申请号:US14668374

    申请日:2015-03-25

    Abstract: A vertical probe device includes a lower die having engaging holes and needle holes, a positioning film having limiting holes and needle holes, probe needles inserted through the needle holes, and supporters having at least an upper stopping surface and at least a lower stopping surface for moveably limiting the positioning film therebetween. Each supporter has a head, a neck passing through the limiting hole and having a length longer than the thickness of the positioning film, a body, and a tail inserted into the engaging hole, which are connected in order, and at least one of the upper and lower stopping surfaces. The supporters can prevent the positioning film from being lifted and flipped over and enables the positioning film to move so that the probe needles are reliable.

    Abstract translation: 垂直探针装置包括具有接合孔和针孔的下模具,具有限制孔和针孔的定位膜,穿过针孔插入的探针,以及至少具有上止动面和至少下停止面的支撑件, 可动地限制其间的定位膜。 每个支撑件具有头部,颈部穿过限制孔并且具有长于定位膜的厚度,插入到接合孔中的主体和尾部的长度,所述定位膜的主体和尾部按顺序连接,并且至少一个 上下止动面。 支持者可以防止定位胶片被提起并翻转,并使定位胶片移动,使得探针是可靠的。

    SPRING PROBE
    8.
    发明申请
    SPRING PROBE 有权
    弹簧探头

    公开(公告)号:US20150253356A1

    公开(公告)日:2015-09-10

    申请号:US14605776

    申请日:2015-01-26

    CPC classification number: G01R1/06722 G01R1/07307

    Abstract: A spring probe includes a needle, a spring sleeve sleeved onto the needle, and a protrusion. The spring sleeve has upper and lower non-spring sections, and at least a spring section therebetween. The needle has a bottom end portion protruding out from the lower non-spring section, and a top end portion located in the upper non-spring section. The protrusion is located at one of the top end portion and the upper non-spring section. The needle is movable relative to the upper non-spring section from an initial position to a connected position where the upper non-spring section is electrically connected with the needle through the protrusion when receiving an external force. As a result, the spring probe effectively prevents signals from being transmitted through the spring section, thereby improving stability of signal transmission and preventing the spring section from fracture.

    Abstract translation: 弹簧探针包括针,套在针上的弹簧套和突起。 弹簧套筒具有上下非弹簧部分,并且至少在其间具有弹簧部分。 针具有从下部非弹簧部分突出的底端部分和位于上部非弹簧部分中的顶端部分。 突起位于顶端部分和上部非弹性部分中的一个处。 针可以相对于上部非弹簧部分从初始位置移动到连接位置,在接收外部力时上部非弹簧部分通过突起与针体电连接。 结果,弹簧探针有效地防止信号通过弹簧部分传递,从而提高信号传输的稳定性并防止弹簧部分断裂。

Patent Agency Ranking