Pin coupler for an integrated circuit tester
    1.
    发明授权
    Pin coupler for an integrated circuit tester 有权
    针式耦合器用于集成电路测试仪

    公开(公告)号:US07240259B2

    公开(公告)日:2007-07-03

    申请号:US11117968

    申请日:2005-04-29

    CPC classification number: G01R31/31905

    Abstract: A coupling unit that couples at least two pins of an ATE (Automated Test Equipment) to a pin of a device under test includes an ATE interface for receiving a plurality of first stimulus signals from selected ATE-pins and/or for sending a plurality of first response signals to the selected ATE-pins, a DUT interface for sending a second stimulus signal to the DUT-pin and/or for receiving a second response signal from the DUT-pin, and a multiplexer circuit for serializing data of the plurality of first stimulus signals into the second stimulus signal and/or a de-multiplexer circuit adapted for parallelizing data of the second response signal into the plurality of first response signals.

    Abstract translation: 将ATE(自动测试设备)的至少两个引脚耦合到被测器件的引脚的耦合单元包括ATE接口,用于从所选择的ATE引脚接收多个第一激励信号和/或用于发送多个 对所选择的ATE引脚的第一响应信号,用于向DUT引脚发送第二激励信号和/或用于从DUT引脚接收第二响应信号的DUT接口以及用于串行化多个 第一激励信号进入第二刺激信号和/或解复用器电路,适于将第二响应信号的数据并行化成多个第一响应信号。

    Pin coupler for an integrated circuit tester
    2.
    发明申请
    Pin coupler for an integrated circuit tester 有权
    针式耦合器用于集成电路测试仪

    公开(公告)号:US20050246603A1

    公开(公告)日:2005-11-03

    申请号:US11117968

    申请日:2005-04-29

    CPC classification number: G01R31/31905

    Abstract: A coupling unit that couples at least two pins of an ATE (Automated Test Equipment) to a pin of a device under test includes an ATE interface for receiving a plurality of first stimulus signals from selected ATE-pins and/or for sending a plurality of first response signals to the selected ATE-pins, a DUT interface for sending a second stimulus signal to the DUT-pin and/or for receiving a second response signal from the DUT-pin, and a multiplexer circuit for serializing data of the plurality of first stimulus signals into the second stimulus signal and/or a de-multiplexer circuit adapted for parallelizing data of the second response signal into the plurality of first response signals.

    Abstract translation: 将ATE(自动测试设备)的至少两个引脚耦合到被测器件的引脚的耦合单元包括ATE接口,用于从所选择的ATE引脚接收多个第一激励信号和/或用于发送多个 对所选择的ATE引脚的第一响应信号,用于向DUT引脚发送第二激励信号和/或用于从DUT引脚接收第二响应信号的DUT接口以及用于串行化多个 第一激励信号进入第二刺激信号和/或解复用器电路,适于将第二响应信号的数据并行化成多个第一响应信号。

    Source synchronous sampling
    3.
    发明授权
    Source synchronous sampling 有权
    源同步采样

    公开(公告)号:US07355378B2

    公开(公告)日:2008-04-08

    申请号:US11234447

    申请日:2005-09-23

    CPC classification number: H04L7/0012 G01R31/31922 G01R31/31937 H04L7/0033

    Abstract: There is provided a method of source synchronous sampling, where a first clock signal of a first unit is synchronized to a second signal received from a second unit. The method includes determining a timing control signal on the base of the first clock signal and the second signal, generating an adjusted clock signal by adjusting the timing of the first clock signal corresponding to the timing control signal, and using the adjusted clock signal for sampling a signal received from the second unit. The second signal is a clock signal received from the second unit, the adjusted clock signal is used for sampling this clock signal itself, and a corresponding sampled clock signal is supervised to show proper clock functionality.

    Abstract translation: 提供了一种源同步采样方法,其中第一单元的第一时钟信号与从第二单元接收的第二信号同步。 该方法包括基于第一时钟信号和第二信号确定定时控制信号,通过调整对应于定时控制信号的第一时钟信号的定时并使用经调整的时钟信号进行采样来产生经调整的时钟信号 从第二单元接收的信号。 第二信号是从第二单元接收的时钟信号,调整后的时钟信号用于对该时钟信号本身进行采样,并且对相应的采样时钟信号进行监控以显示适当的时钟功能。

    System and method for electronic testing of devices
    4.
    发明授权
    System and method for electronic testing of devices 有权
    设备电子测试系统和方法

    公开(公告)号:US08264236B2

    公开(公告)日:2012-09-11

    申请号:US11998024

    申请日:2007-11-28

    CPC classification number: G06F11/24 G01R31/31709

    Abstract: A method for testing electronic devices involves receiving a stimulus signal for testing a device; changing an operating temperature of at least a component of an electrical filter while maintaining settings of the electrical filter, thereby altering the stimulus signal as the stimulus signal passes through the electrical filter, to create an altered stimulus signal; and outputting the altered stimulus signal.

    Abstract translation: 一种用于测试电子设备的方法包括接收用于测试设备的刺激信号; 在保持电滤波器的设置的同时改变至少电滤波器的部件的工作温度,从而当刺激信号通过电过滤器时改变刺激信号,以产生改变的刺激信号; 并输出改变的刺激信号。

    APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMIT PATHS AND A PLURALITY OF RECEIVE PATHS OF AN ELECTRONIC DEVICE
    7.
    发明申请
    APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMIT PATHS AND A PLURALITY OF RECEIVE PATHS OF AN ELECTRONIC DEVICE 有权
    无线电测试传输模式和电子设备接收数据的多样性的装置和方法

    公开(公告)号:US20120232826A1

    公开(公告)日:2012-09-13

    申请号:US13392500

    申请日:2009-08-28

    Abstract: An apparatus for wireless testing, the apparatus comprising: a test interface, a test generator, a test module, and an analysis module. The test interface is coupled to an electronic device and is configured to transmit data to the electronic device and to receive data from the electronic device. The test generator drives the electronic device through the test interface to vary the beam direction. The test module determines a plurality of transmit values of a transmit parameter based on the test signal wirelessly received from the electronic device using at least one static antenna for receiving the test signal. Each transmit value of the transmit parameter is associated with a different beam direction. The analysis module provides an assessment of the plurality of transmit paths of the electronic device based on the plurality of transmit values.

    Abstract translation: 一种用于无线测试的装置,所述装置包括:测试接口,测试发生器,测试模块和分析模块。 测试接口耦合到电子设备,并被配置为向电子设备发送数据并从电子设备接收数据。 测试发电机通过测试接口驱动电子设备,以改变光束方向。 测试模块基于使用至少一个用于接收测试信号的静态天线从电子设备无线地接收的测试信号来确定发射参数的多个发射值。 发射参数的每个发射值与不同的波束方向相关联。 分析模块基于多个发送值提供对电子设备的多个发送路径的评估。

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