公开(公告)号：US07187444B2

公开(公告)日：2007-03-06

申请号：US10291566

申请日：2002-11-12

申请人： Masayuki Naya ,  Mitsuru Sawano ,  Shu Sato ,  Toshihito Kimura ,  Hitoshi Shimizu

发明人： Masayuki Naya ,  Mitsuru Sawano ,  Shu Sato ,  Toshihito Kimura ,  Hitoshi Shimizu

IPC分类号： G01N21/55

CPC分类号： G01N21/553

摘要： In a measuring method utilizing the phenomenon of attenuation in total internal reflection in which a light beam is caused to enter a dielectric block provided with a film layer to be brought into contact with a sample so that total internal reflection conditions are satisfied at the interface of the dielectric block and the film layer and various angles of incidence of the light beam to the interface of the dielectric block and the film layer can be obtained, and the intensity of the light beam reflected in total internal reflection at the interface is detected, the light beam is caused to intermittently impinge upon the dielectric block.

摘要翻译： 在利用全内反射的衰减现象的测量方法中，使得光束被引入具有与样品接触的膜层的介电块，使得在内部反射条件的界面处满足全内反射条件 可以获得介质块和膜层以及光束到介质块和膜层的界面的各种入射角度，并且检测在界面处的全内反射中反射的光束的强度， 导致光束间歇地撞击介质块。

公开(公告)号：US06885454B2

公开(公告)日：2005-04-26

申请号：US10108258

申请日：2002-03-28

申请人： Masayuki Naya ,  Nobufumi Mori ,  Toshihito Kimura ,  Hitoshi Shimizu ,  Shu Sato

发明人： Masayuki Naya ,  Nobufumi Mori ,  Toshihito Kimura ,  Hitoshi Shimizu ,  Shu Sato

IPC分类号： G01N21/55 ,  G01N21/41 ,  G02B17/00 ,  G02B26/08 ,  H04J14/08

CPC分类号： G01N21/553

摘要： A measuring apparatus is disclosed which includes a measuring unit equipped with a dielectric block and a thin film layer; an incidence system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer; and a photodetector for receiving the light beam totally reflected at the interface. The measuring unit is measured a plurality of times, and a change in the state of attenuated total reflection during the plurality of measurements is detected. The sensor further includes a tilt measurement section for measuring the longitudinal tilt of the interface which changes the incidence angles during the plurality of measurements, and a calculating section for obtaining a measured value in which errors due to the longitudinal tilt have been corrected.

摘要翻译： 公开了一种测量装置，其包括配备有介质块和薄膜层的测量单元; 用于使光束进入介质块的入射系统使得在介电块和薄膜层之间的界面处满足全内反射条件; 以及用于接收在界面处全反射的光束的光电检测器。 测量测量单元多次，并且检测在多个测量期间衰减的全反射状态的变化。 传感器还包括用于测量在多个测量期间改变入射角的界面的纵向倾斜的倾斜测量部分，以及用于获得校正了由于纵向倾斜引起的误差的测量值的计算部分。

公开(公告)号：US08044344B2

公开(公告)日：2011-10-25

申请号：US12409146

申请日：2009-03-23

申请人： Masayuki Naya ,  Yuichi Tomaru ,  Naoki Murakami

发明人： Masayuki Naya ,  Yuichi Tomaru ,  Naoki Murakami

IPC分类号： B01D59/44

CPC分类号： H01J49/164

摘要： A mass spectroscope includes a mass analysis device having a surface provided with metallic members capable of exciting plasmons when irradiated by laser light, the mass analysis device allowing an analyte to be attached to the surface, a light radiation unit for irradiating the surface of the mass analysis device with laser light to ionize the analyte attached to the surface and desorb the analyte from the surface, and a detection unit for detecting a mass of the analyte ionized and desorbed from the surface of the mass analysis device from a time of flight of the analyte. The light radiation unit includes a polarization adjusting mechanism for adjusting a polarization direction of the laser light.

摘要翻译： 质谱仪包括质量分析装置，其具有设置有能够激发等离子体激元的金属构件的表面，所述金属构件能够在被激光照射时激发等离子体，所述质量分析装置使分析物附着在所述表面上，所述质量分析装置用于照射所述质量的表面 分析装置，其具有激光以电离附着在表面上的分析物并从表面解吸分析物;以及检测单元，用于检测从质量分析装置的表面离子化和解吸的分析物质量， 分析物。 光辐射单元包括用于调节激光的偏振方向的偏振调节机构。

公开(公告)号：US07812957B2

公开(公告)日：2010-10-12

申请号：US12360740

申请日：2009-01-27

申请人： Takeharu Tani ,  Masayuki Naya

发明人： Takeharu Tani ,  Masayuki Naya

IPC分类号： G01N21/55

CPC分类号： G01N21/553

摘要： A measurement apparatus includes a dielectric block, a thin film layer formed on the dielectric block and brought into contact with a sample, a light source for generating a light beam, an optical incident system for causing the light beam to enter the dielectric block so that the light beam is totally reflected at the interface between the dielectric block and the thin film, and a two-dimensional light detection means for detecting the intensity of the light beam totally reflected at the interface. A predetermined pattern is formed within a region irradiated with the light beam on the dielectric block. The measurement apparatus includes a correction means for correcting an output from the two-dimensional light detection means, based on the pattern, so that an object on the face of the dielectric block is similar to the object detected by the two-dimensional detection means.

摘要翻译： 测量装置包括介质块，形成在介质块上并与样品接触的薄膜层，用于产生光束的光源，用于使光束进入介质块的光入射系统，使得 所述光束在所述介质块和所述薄膜之间的界面处被全反射，以及二维光检测装置，用于检测在所述界面处全反射的光束的强度。 在介质块上用光束照射的区域内形成预定图案。 测量装置包括校正装置，用于根据图案校正来自二维光检测装置的输出，使得介质块的表面上的物体类似于由二维检测装置检测的物体。

公开(公告)号：US20090273780A1

公开(公告)日：2009-11-05

申请号：US12434147

申请日：2009-05-01

申请人： Yuichi Tomaru ,  Naoki Murakami ,  Masayuki Naya

发明人： Yuichi Tomaru ,  Naoki Murakami ,  Masayuki Naya

IPC分类号： G01J3/44

CPC分类号： G01N21/658

摘要： A Raman spectrum detecting method includes a liquid sample contacting step of placing a liquid sample containing a reference substance and a specimen in contact with a detection surface, the reference substance generating a known Raman spectrum having at least one peak therein that is different from peaks in a Raman spectrum generated by the specimen; a scattered light detecting step of irradiating the detection surface in contact with the liquid sample with an excitation light and detecting Raman scattered light occurring from the liquid sample; and a normalizing step of extracting a Raman spectrum signal of the reference substance and a Raman spectrum signal of the specimen from the signal detected in the scattered light detecting step and normalizing a signal intensity of the Raman spectrum signal of the specimen according to an intensity of the Raman spectrum signal of the reference substance.

摘要翻译： 拉曼光谱检测方法包括液体样品接触步骤，其将含有参考物质和样品的液体样品放置在与检测表面接触的位置，所述参考物质产生已知的拉曼光谱，其具有与其中的峰不同的至少一个峰 样品产生的拉曼光谱; 散射光检测步骤，用激发光照射与液体样品接触的检测表面，并检测从液体样品发生的拉曼散射光; 以及归一化步骤，从根据在散射光检测步骤中检测到的信号中提取参考物质的拉曼光谱信号和样品的拉曼光谱信号，并根据样品的拉曼光谱信号的强度对样品的拉曼光谱信号的信号强度进行归一化 参考物质的拉曼光谱信号。

公开(公告)号：US20090252002A1

公开(公告)日：2009-10-08

申请号：US12457328

申请日：2009-06-08

申请人： Kiichi Ueyanagi ,  Masayuki Naya ,  Yuichi Tomaru

发明人： Kiichi Ueyanagi ,  Masayuki Naya ,  Yuichi Tomaru

IPC分类号： G11B11/00

CPC分类号： G11B7/1387

摘要： A near-field light-emitting element includes a transparent medium having a plane of incidence into which a laser beam enters, and a light-condensing plane on which the laser beam having entered the plane of incidence is concentrated, and a metal body provided on the light-condensing plane of the transparent medium having a first surface contacting the light-condensing plane, a second surface opposing the first surface, and an aperture which is formed to penetrate through the first and second surfaces at a position where the laser beam is concentrated and which emits a near-field light obtained from the laser beam. The metal body is arranged apart from a center of the aperture by a predetermined distance to connect together the first and second surfaces, and has a plasmon reflection plane that reflects toward the aperture a surface plasmon excited on the first and second surfaces by the laser beam concentrated at the aperture.

摘要翻译： 近场发光元件包括具有激光束入射的入射面的透明介质和进入入射平面的激光束集中的聚光面，以及设置在其上的金属体 所述透明介质的聚光面具有与所述聚光面接触的第一表面，与所述第一表面相对的第二表面，以及形成为穿过所述第一表面和所述第二表面的孔， 并且发射从激光束获得的近场光。 金属体与孔径的中心隔开预定的距离，以将第一和第二表面连接在一起，并且具有等离子体反射面，该等离子体反射面通过激光​​束向孔径反射在第一和第二表面上激发的表面等离子体激元 集中在光圈。

公开(公告)号：US20060194151A1

公开(公告)日：2006-08-31

申请号：US11327521

申请日：2006-01-09

申请人： Yoshio Inagaki ,  Masayuki Naya

发明人： Yoshio Inagaki ,  Masayuki Naya

IPC分类号： G11B7/24

CPC分类号： B82Y10/00 ,  G11B7/00455 ,  G11B7/0052 ,  G11B7/1384 ,  G11B7/244 ,  G11B7/247 ,  G11B7/259 ,  G11B7/2595 ,  G11B2007/24624

摘要： A recording medium comprises a substrate and a recording layer overlaid on the substrate. The recording layer comprises a material, which has properties such that, when recording light having a predetermined wavelength λ1 is irradiated to the material, the material is capable of being caused to change into a fluorescent material and such that, when excitation light having a wavelength λ2 is then irradiated to the thus formed fluorescent material, the fluorescent material is capable of being caused to produce fluorescence. The wavelength λ1 of the recording light and the wavelength λ2 of the excitation light may be identical or different. The substrate may be constituted of a material having properties such that, when the excitation light is irradiated to the material, the material does not produce fluorescence having a wavelength identical with the wavelength of the fluorescence produced by the fluorescent material.

摘要翻译： 记录介质包括衬底和覆盖在衬底上的记录层。 记录层包括一种材料，其具有这样的特性，即当记录具有预定波长λ1的光被照射到材料时，该材料能够变成荧光材料，并且使得当具有 然后将波长λ2照射到如此形成的荧光材料上，荧光材料能够产生荧光。 记录光的波长λ1和激发光的波长λ2可以相同或不同。 衬底可以由具有这样的特性的材料构成，即当激发光照射到材料时，材料不产生具有与由荧光材料产生的荧光的波长相同的波长的荧光。

公开(公告)号：US07058001B2

公开(公告)日：2006-06-06

申请号：US09793721

申请日：2001-02-27

申请人： Yoshio Inagaki ,  Masayuki Naya

发明人： Yoshio Inagaki ,  Masayuki Naya

IPC分类号： G11B7/24

CPC分类号： B82Y10/00 ,  G11B7/00455 ,  G11B7/0052 ,  G11B7/1384 ,  G11B7/244 ,  G11B7/247 ,  G11B7/259 ,  G11B7/2595 ,  G11B2007/24624

摘要： A recording medium comprises a substrate and a recording layer overlaid on the substrate. The recording layer comprises a material, which has properties such that, when recording light having a predetermined wavelength λ1 is irradiated to the material, the material is capable of being caused to change into a fluorescent material and such that, when excitation light having a wavelength λ2 is then irradiated to the thus formed fluorescent material, the fluorescent material is capable of being caused to produce fluorescence. The wavelength λ1 of the recording light and the wavelength λ2 of the excitation light may be identical or different. The substrate may be constituted of a material having properties such that, when the excitation light is irradiated to the material, the material does not produce fluorescence having a wavelength identical with the wavelength of the fluorescence produced by the fluorescent material.

公开(公告)号：US07057731B2

公开(公告)日：2006-06-06

申请号：US10669651

申请日：2003-09-25

申请人： Masayuki Naya

发明人： Masayuki Naya

IPC分类号： G01N21/55

CPC分类号： G01N21/553

摘要： A small-sized measuring apparatus having a stray light suppressing capability for detecting the distribution of optical intensities on the cross section of a light beam having a predetermined wavelength contained in a light beam reflected from a measuring surface by entering a collimated light beam having a large cross sectional area into the measuring surface. A collimated light beam having a sufficient cross sectional area is entered into the interface between a dielectric block and a thin metal film formed on the dielectric block at an angle that satisfies the conditions of total reflection. A light beam having a predetermined wavelength is selected from the light beam totally reflected at the interface to detect the distribution of optical intensities for the selected light beam by the wavelength selecting section capable of eliminating stray light.

摘要翻译： 一种小尺寸测量装置，具有用于检测由测量表面反射的光束中包含的具有预定波长的光束的横截面上的光强度分布的入射到具有大尺寸的准直光束的杂散光抑制能力 横截面积进入测量面。 具有足够横截面面积的准直光束以满足全反射条件的角度进入介质块和形成在介质块上的薄金属膜之间的界面。 从在界面处全反射的光束中选择具有预定波长的光束，以检测能够消除杂散光的波长选择部分对所选择的光束的光强度的分布。

公开(公告)号：US07027159B2

公开(公告)日：2006-04-11

申请号：US10328165

申请日：2002-12-26

申请人： Masayuki Naya

发明人： Masayuki Naya

IPC分类号： G01N21/55

CPC分类号： G01N21/05 ,  G01N21/553 ,  G01N33/54373

摘要： A sensor utilizing an evanescent wave and comprising a light source for emitting a light beam and a measuring chip formed into the shape of a well. The measuring chip has a dielectric block and a thin film layer formed on one surface of the dielectric block. The sensor also includes an optical system for making the light beam enter the dielectric block at angles of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer. The sensor further includes a sample supply-discharge unit which is detachably installed within the measuring chip. The sample supply-discharge unit is used for continuously supplying the sample onto the surface of the thin film layer and continuously discharging the supplied sample from the surface of the thin film layer.