公开(公告)号：US10545093B2

公开(公告)日：2020-01-28

申请号：US14246008

申请日：2014-04-04

Applicant: Massachusetts Institute of Technology

Inventor： Timothy M. Swager ,  Joseph M. Azzarelli ,  Kathleen R. White

IPC: G01N21/78 ,  G01N21/76 ,  G01N33/00 ,  G01N31/00 ,  G01N27/00 ,  G01N21/00 ,  G01N7/00

Abstract: A detector can detect an analyte including a carbon-carbon multiple bond moiety and capable of undergoing Diels-Alder reaction with a heteroaromatic compound having an extrudable group. The detector can detect, differentiate, and quantify ethylene.

公开(公告)号：US09459222B2

公开(公告)日：2016-10-04

申请号：US13800169

申请日：2013-03-13

Applicant: Massachusetts Institute of Technology

Inventor： Timothy M. Swager ,  Katherine A. Mirica ,  Joseph M. Azzarelli ,  Jonathan G. Weis ,  Jan Schnorr ,  Birgit Esser

IPC: G01N27/00 ,  G01N27/04 ,  G01N27/07 ,  G01N27/12

CPC classification number: G01N27/12 ,  Y10T29/49002

Abstract: Methods described herein may be useful in the fabrication and/or screening of devices (e.g., sensors, circuits, etc.) including conductive materials. In some embodiments, a conductive material is formed on a substrate using mechanical abrasion. The methods described herein may be useful in fabricating sensors, circuits, tags for remotely-monitored sensors or human/object labeling and tracking, among other devices. In some cases, devices for determining analytes are also provided.

Abstract translation: 本文所述的方法可用于制造和/或筛选包括导电材料的装置（例如，传感器，电路等）。 在一些实施例中，使用机械磨损在基板上形成导电材料。 本文描述的方法可用于制造用于远程监视的传感器的传感器，电路，标签，或者人/物体标记和跟踪以及其它设备。 在某些情况下，还提供了用于确定分析物的装置。

公开(公告)号：US11543358B2

公开(公告)日：2023-01-03

申请号：US16773922

申请日：2020-01-27

Applicant: Massachusetts Institute of Technology

Inventor： Timothy M. Swager ,  Joseph M. Azzarelli ,  Kathleen R. White

IPC: G01N21/78 ,  G01N21/77

Abstract: A detector can detect an analyte including a carbon-carbon multiple bond moiety and capable of undergoing Diels-Alder reaction with a heteroaromatic compound having an extrudable group. The detector can detect, differentiate, and quantify ethylene.

公开(公告)号：US20130330231A1

公开(公告)日：2013-12-12

申请号：US13800169

申请日：2013-03-13

Applicant: Massachusetts Institute of Technology

Inventor： Timothy M. Swager ,  Katherine A. Mirica ,  Joseph M. Azzarelli ,  Jonathan G. Weis ,  Jan Schnorr ,  Brigit Esser

IPC: G01N27/12

CPC classification number: G01N27/12 ,  Y10T29/49002

Abstract: Methods described herein may be useful in the fabrication and/or screening of devices (e.g., sensors, circuits, etc.) including conductive materials. In some embodiments, a conductive material is formed on a substrate using mechanical abrasion. The methods described herein may be useful in fabricating sensors, circuits, tags for remotely-monitored sensors or human/object labeling and tracking, among other devices. In some cases, devices for determining analytes are also provided.

Abstract translation: 本文所述的方法可用于制造和/或筛选包括导电材料的装置（例如，传感器，电路等）。 在一些实施例中，使用机械磨损在基板上形成导电材料。 本文描述的方法可用于制造用于远程监视的传感器的传感器，电路，标签，或者人/物体标记和跟踪以及其它设备。 在某些情况下，还提供了用于确定分析物的装置。