Abstract:
A processing device performs dual-rail power equalization for its memory cell array and logic circuitry. The memory cell array is coupled to a first power rail through a first switch to receive a first voltage level. The logic circuitry is coupled to a second power rail through a second switch to receive a second voltage level that is different from the first voltage level. The processing device also includes a power switch coupled to at least the second power rail and operative to be enabled to equalize voltage supplied to the memory cell array and the logic circuitry.
Abstract:
A processing device performs dual-rail power equalization for its memory cell array and logic circuitry. The memory cell array is coupled to a first power rail through a first switch to receive a first voltage level. The logic circuitry is coupled to a second power rail through a second switch to receive a second voltage level that is different from the first voltage level. The processing device also includes a power switch coupled to at least the second power rail and operative to be enabled to equalize voltage supplied to the memory cell array and the logic circuitry.
Abstract:
A semiconductor circuit comprises a first and a second logic circuit, a first and a second decoupling capacitor. The first decoupling capacitor is arranged in a first area around the first logic circuit and the second decoupling capacitor is arranged in a second area around the second logic circuit. Wherein, the first area is larger than the second area, a gate oxide thickness of the first decoupling capacitor is larger than a gate oxide thickness of the second decoupling capacitor, and a distance between the first area and the first logic circuit is shorter than a distance between the second area and the second logic circuit. Further, the first and second decoupling capacitors are designed without trench.
Abstract:
A method for including decoupling capacitors into a semiconductor circuit having at least a logic circuit therein, includes: arranging a first decoupling capacitor and a second decoupling capacitor into a first area and a second area around the logic circuit respectively, wherein a gate oxide thickness of the first decoupling capacitor is different from a gate oxide thickness of the second decoupling capacitor, and a distance between the first area and the first logic circuit is shorter than a distance between the second area and the second logic circuit.
Abstract:
The invention provides a flip-flop. In one embodiment, the flip-flop receives a low swing clock signal, and comprises a first NMOS transistor, a first latch circuit, a second NMOS transistor, and a second latch circuit. The low swing clock signal is inverted to obtain an inverted low swing clock signal. The first NMOS transistor is coupled between a receiving node and a first node, and has a gate coupled to the inverted low swing clock signal. The first latch circuit is coupled between the first node and a second node. The second NMOS transistor is coupled between the second node and a third node. The second latch circuit is coupled between the third node and a fourth node, and generates an output signal on the fourth node.