SYSTEMS AND METHODS FOR PROGRAMMABLE FABRIC DESIGN COMPILATION

    公开(公告)号:US20220335189A1

    公开(公告)日:2022-10-20

    申请号:US17856799

    申请日:2022-07-01

    IPC分类号: G06F30/343

    摘要: Systems or methods of the present disclosure may provide a compilation design method that uses cloud computing resources and/or distributed computing resources to compile initial user designs. The initial user design for the programmable logic device may be partitioned into multiple designs for compilation based on periphery logic and core fabric logic. The compilation design method implements partition-level time budgeting and constraint generation using full device timing analysis. The final placed and routed netlist and bitstream SOF is generated by merging the placed and routed netlist and bitstream SOF of individual partition designs.

    Progressive circuit evaluation for circuit optimization
    3.
    发明授权
    Progressive circuit evaluation for circuit optimization 有权
    电路优化的进步电路评估

    公开(公告)号:US08621408B2

    公开(公告)日:2013-12-31

    申请号:US13438602

    申请日:2012-04-03

    IPC分类号: G06F17/50

    CPC分类号: G06F17/505 G06F2217/84

    摘要: Systems and techniques for optimizing a circuit design are described. Some embodiments reduce the number of gates in the library (e.g., by dynamically pruning the library) which are considered for optimization. Some embodiments create a linear delay model, and use the linear delay model instead of a non-linear delay model to substantially reduce the amount of computation required to check whether or not a particular replacement gate improves one or more metrics of the circuit design. Some embodiments determine an order for processing the gates in the library or for processing input pins of a gate to facilitate early rejection of a candidate gate in the library of gates. In some embodiments, the evaluation of the impact of a candidate gate transformation is done progressively and level-by-level only up to the point where the gate transformation degrades one or more metrics.

    摘要翻译: 描述了用于优化电路设计的系统和技术。 一些实施例减少库中的门数(例如,通过动态修剪库),这被考虑用于优化。 一些实施例创建线性延迟模型,并且使用线性延迟模型而不是非线性延迟模型来基本上减少检查特定替换门是否改善电路设计的一个或多个度量所需的计算量。 一些实施例确定用于处理库中的门或用于处理门的输入引脚的顺序,以便于早期拒绝门库中的候选门。 在一些实施例中,候选门转换的影响的评估逐渐地逐级地逐级地进行,直到门转换降级一个或多个度量为止。

    PROGRESSIVE CIRCUIT EVALUATION FOR CIRCUIT OPTIMIZATION
    4.
    发明申请
    PROGRESSIVE CIRCUIT EVALUATION FOR CIRCUIT OPTIMIZATION 有权
    电路优化的渐进式电路评估

    公开(公告)号:US20130145336A1

    公开(公告)日:2013-06-06

    申请号:US13438602

    申请日:2012-04-03

    IPC分类号: G06F17/50

    CPC分类号: G06F17/505 G06F2217/84

    摘要: Systems and techniques for optimizing a circuit design are described. Some embodiments reduce the number of gates in the library (e.g., by dynamically pruning the library) which are considered for optimization. Some embodiments create a linear delay model, and use the linear delay model instead of a non-linear delay model to substantially reduce the amount of computation required to check whether or not a particular replacement gate improves one or more metrics of the circuit design. Some embodiments determine an order for processing the gates in the library or for processing input pins of a gate to facilitate early rejection of a candidate gate in the library of gates. In some embodiments, the evaluation of the impact of a candidate gate transformation is done progressively and level-by-level only up to the point where the gate transformation degrades one or more metrics.

    摘要翻译: 描述了用于优化电路设计的系统和技术。 一些实施例减少库中的门数(例如,通过动态修剪库),这被考虑用于优化。 一些实施例创建线性延迟模型,并且使用线性延迟模型而不是非线性延迟模型来基本上减少检查特定替换门是否改善电路设计的一个或多个度量所需的计算量。 一些实施例确定用于处理库中的门或用于处理门的输入引脚的顺序,以便于早期拒绝门库中的候选门。 在一些实施例中,候选门转换的影响的评估逐渐地逐级地逐级地进行,直到门转换降级一个或多个度量为止。

    Zone-based optimization framework for performing timing and design rule optimization
    5.
    发明授权
    Zone-based optimization framework for performing timing and design rule optimization 有权
    基于区域的优化框架,用于执行定时和设计规则优化

    公开(公告)号:US08418116B2

    公开(公告)日:2013-04-09

    申请号:US12697168

    申请日:2010-01-29

    IPC分类号: G06F17/50

    摘要: Some embodiments of the present invention provide techniques and systems for efficiently optimizing a circuit design for one or more multi-mode multi-corner (MCMM) scenarios. A system can select an optimizing transformation for a logic gate, which if applied to the logic gate, does not degrade a timing metric in a local context of the logic gate. Next, the system can determine whether applying the optimizing transformation to the logic gate degrades the timing metric in a zone around the logic gate. If so, the system can reject the optimizing transformation. Otherwise, the system can determine whether applying the optimizing transformation to the logic gate degrades the timing metric in the circuit design. If so, the system can reject the optimizing transformation. Otherwise, the system can accept the optimizing transformation.

    摘要翻译: 本发明的一些实施例提供用于有效地优化一个或多个多模式多角(MCMM)场景的电路设计的技术和系统。 系统可以选择用于逻辑门的优化变换,其如果应用于逻辑门,则不降低逻辑门的本地上下文中的定时度量。 接下来,系统可以确定将优化变换应用于逻辑门是否会降低逻辑门周围区域中的定时度量。 如果是这样,系统可以拒绝优化转换。 否则,系统可以确定将优化变换应用于逻辑门是否会降低电路设计中的定时度量。 如果是这样,系统可以拒绝优化转换。 否则,系统可以接受优化转换。

    Method and apparatus for determining a robustness metric for a circuit design
    6.
    发明授权
    Method and apparatus for determining a robustness metric for a circuit design 有权
    用于确定电路设计的鲁棒性度量的方法和装置

    公开(公告)号:US08239800B2

    公开(公告)日:2012-08-07

    申请号:US12697088

    申请日:2010-01-29

    IPC分类号: G06F17/50 G06F9/455

    CPC分类号: G06F17/50

    摘要: Some embodiments provide techniques and systems for determining a change indicator for an endpoint, a pathgroup, a design, and/or a flow. The system can determine base critical path delays and base slacks for the endpoints in a base implementation of the circuit design. The system can then determine the new critical path delays and new slacks for the endpoints in a new implementation of the circuit design. Next, the system determines slack differences for the endpoints using the new slacks and the base slacks. Finally, for each endpoint, the system can determine an endpoint change indicator using the associated slack difference, the base critical path delay, and the new critical path delay. A pathgroup change indicator can be determined using endpoint change indicators. A design change indicator can be determined using pathgroup change indicators or scenario change indicators. A design flow change indicator can be determined using design change indicators.

    摘要翻译: 一些实施例提供用于确定端点,路径组,设计和/或流的改变指示符的技术和系统。 该系统可以在电路设计的基本实现中确定端点的基本关键路径延迟和基础间隙。 然后,系统可以在电路设计的新实现中确定端点的新的关键路径延迟和新的松弛。 接下来,系统使用新的松弛和基座松弛来确定端点的松弛差异。 最后,对于每个端点,系统可以使用相关的松弛差,基本关键路径延迟和新的关键路径延迟来确定端点变化指示符。 可以使用端点更改指示器来确定路径组更改指示符。 可以使用路径组变更指标或情景变化指标来确定设计变更指标。 可以使用设计变更指标来确定设计流量变化指标。

    HYPER-CONCURRENT MULTI-SCENARIO OPTIMIZATION
    7.
    发明申请
    HYPER-CONCURRENT MULTI-SCENARIO OPTIMIZATION 有权
    超多场多场景优化

    公开(公告)号:US20120030642A1

    公开(公告)日:2012-02-02

    申请号:US12845545

    申请日:2010-07-28

    IPC分类号: G06F17/50

    摘要: Some embodiments of the present invention provide techniques and systems for performing aggressive and dynamic scenario reduction during different phases of optimization, e.g., during delay, area, leakage and DRC (design rule check) optimization. Specifically, essential scenarios at gates and timing end-points can be identified and then used during the dynamic scenario reduction process. In some embodiments, margin values associated with various constraints can be used to determine the set of essential scenarios to account for constrained objects that are near critical in addition to the constrained objects that are the worst violators. In some embodiments, at any point during the optimization process, only the set of essential scenarios are kept active, thereby substantially reducing runtime and memory requirements without compromising on the quality of results.

    摘要翻译: 本发明的一些实施例提供了用于在优化的不同阶段(例如在延迟,区域,泄漏和DRC(设计规则检查)优化期间)执行积极和动态场景减少的技术和系统。 具体来说,可以识别门和定时终点的基本情景,然后在动态场景减少过程中使用。 在一些实施例中,与各种约束相关联的边界值可用于确定除了受限制的对象之外的接近关键的约束对象的基本场景的集合,这些约束对象是最严重的违规者。 在一些实施例中,在优化过程中的任何时刻,只有一组基本场景保持活动,从而大大减少运行时和存储器的需求,而不会影响结果的质量。

    GLOBAL TIMING MODELING WITHIN A LOCAL CONTEXT
    8.
    发明申请
    GLOBAL TIMING MODELING WITHIN A LOCAL CONTEXT 有权
    在本地语境下的全局时序建模

    公开(公告)号:US20110289464A1

    公开(公告)日:2011-11-24

    申请号:US12783915

    申请日:2010-05-20

    IPC分类号: G06F17/50

    摘要: Some embodiments of the present invention provide techniques and systems for determining and using margin values. An arrival time at an output pin of a logic gate can be determined. Next, required times at the output pin of the logic gate can be determined. Each required time can be associated with a timing end-point in a path-group, affected by that pin. The system can then determine a first set of slack values at the output pin of the logic gate by computing a difference between the required times and the arrival time. Next, the system can determine a set of margin values at the output pin of the logic gate by computing a difference between the first set of slack values and a second set of slack values at the timing end-points in the path-groups. Next, the system can use the set of margin values to optimize the logic gate.

    摘要翻译: 本发明的一些实施例提供了用于确定和使用边缘值的技术和系统。 可以确定逻辑门的输出引脚的到达时间。 接下来,可以确定逻辑门的输出引脚所需的时间。 每个所需的时间可以与路径组中的定时终点相关联,受该引脚的影响。 然后,系统可以通过计算所需时间和到达时间之间的差异来确定逻辑门的输出引脚处的第一组松弛值。 接下来,系统可以通过计算在路径组中的定时终点处的第一组松弛值和第二组松弛值之间的差来确定逻辑门的输出引脚处的一组余量值。 接下来,系统可以使用一组余量值来优化逻辑门。

    Method for identifying untestable and redundant faults in sequential
logic circuits.
    9.
    发明授权
    Method for identifying untestable and redundant faults in sequential logic circuits. 失效
    在顺序逻辑电路中识别不可测和冗余故障的方法。

    公开(公告)号:US5559811A

    公开(公告)日:1996-09-24

    申请号:US599289

    申请日:1996-02-09

    摘要: A method of identifying redundant and untestable faults in a sequential logic circuit. A lead in the circuit is selected and the circuit is analyzed to determine which faults would be hypothetically undetectable at a given time frame if the selected circuit lead were unable to assume a logic 0 at a starting time frame, and which faults would be hypothetically undetectable at the given time frame if the selected circuit lead were unable to assume a logic 1 at the starting time frame. Faults that would be undetectable at the given time frame in both hypothetical cases are identified as redundant and untestable faults. This analysis may be repeated for each of a plurality of time frames in a range of time frames which includes the starting time frame. Faults whose detection would not be possible if the selected lead were unable to assume a given value at the starting time frame may be determined based on a sequential implication procedure comprising the propagation of uncontrollability indicators and the backward propagation of unobservability indicators. An uncontrollability indicator for the given (0 or 1) value is assigned to the selected circuit lead and is propagated through the circuit and/or through a range of time frames according to a predetermined set of propagation rules. Unobservability indicators are generated in the circuit at various time frames based on the uncontrollability indicators, and these unobservability indicators are then propagated backward through the circuit and/or backward through the range of time frames, also in accordance with a predetermined set of propagation rules. The hypothetically undetectable faults are then determined based on the resultant indicators and their corresponding circuit leads and associated time frames.

    摘要翻译: 一种在顺序逻辑电路中识别冗余和不可测故障的方法。 选择电路中的引线,并分析电路,以确定在给定时间帧,如果所选择的电路引线在起始时间段内不能采用逻辑0,哪些故障在假设上是不可检测的,哪些故障将被假设为不可检测的 如果所选择的电路引线在起始时间段内不能采用逻辑1,则在给定的时间帧。 在两种假设情况下,在给定时间框架内将无法检测到的故障被认为是冗余和不可测试的故障。 可以在包括起始时间帧的时间范围内的多个时间帧中的每一个重复该分析。 可以根据包括不可控性指标的传播和不可观察性指示器的反向传播的顺序暗示​​过程来确定如果所选择的引线在起始时间帧不能采用给定值,则检测不可能的故障。 给定(0或1)值的不可控性指示符被分配给所选择的电路引线,并且根据预定的一组传播规则通过电路和/或通过一段时间帧传播。 基于不可控性指示器,在不同时间帧在电路中产生不可观察性指示符,并且这些不可观察性指示符随后也通过电路向后传播和/或在后面的时间范围内,也根据预定的一组传播规则。 然后基于所得到的指示符及其对应的电路引线和相关时间帧来确定假设不可检测的故障。