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    Method of forming thin camera
    1.
    发明授权
    Method of forming thin camera 失效
    薄相机形成方法

    公开(公告)号：US08325266B2

    公开(公告)日：2012-12-04

    申请号：US12181173

    申请日：2008-07-28

    Applicant: Michael R. Feldman ,  Robert TeKolste

    Inventor： Michael R. Feldman ,  Robert TeKolste

    IPC: H04N5/225 ,  G02B27/10

    CPC classification number: H04N5/335 ,  H04N5/3415

    Abstract: A thin camera having sub-pixel resolution includes an array of micro-cameras. Each micro-camera includes a lens, a plurality of sensors of size p, and a plurality of macro-pixels of size d having a feature of size q. The feature size q smaller than p and provides a resolution for the micro-camera greater than p. The smallest feature in the micro-cameras determines the resolution of the thin camera. Each macro-pixel may have any array of m features of size q, where q=d/m. Additional micro-cameras may be included to increase power.

    Abstract translation: 具有子像素分辨率的薄型相机包括微型相机阵列。 每个微型摄像机包括透镜，大小为p的多个传感器，以及大小为d的多个具有尺寸为q的特征的宏观像素。 特征尺寸q小于p，并为微型摄像机提供大于p的分辨率。 微型相机中最小的功能决定了薄型相机的分辨率。 每个宏像素可以具有任何尺寸为q的m个特征的阵列，其中q = d / m。 可以包括附加的微型摄像机以增加功率。

    Thin camera having sub-pixel resolution
    2.
    发明授权
    Thin camera having sub-pixel resolution 有权
    薄相机具有子像素分辨率

    公开(公告)号：US07405761B2

    公开(公告)日：2008-07-29

    申请号：US10763396

    申请日：2004-01-26

    Applicant: Michael R. Feldman ,  Robert Te Kolste

    Inventor： Michael R. Feldman ,  Robert Te Kolste

    IPC: H04N5/225

    CPC classification number: H04N5/335 ,  H04N5/3415

    Abstract: A thin camera having sub-pixel resolution includes an array of micro-cameras. Each micro-camera includes a lens, a plurality of sensors of size p, and a plurality of macro-pixels of size d having a feature of size q. The feature size q smaller than p and provides a resolution for the micro-camera greater than p. The smallest feature in the micro-cameras determines the resolution of the thin camera. Each macro-pixel may have any array of m features of size q, where q=d/m. Additional micro-cameras may be included to increase power.

    Abstract translation: 具有子像素分辨率的薄型相机包括微型相机阵列。 每个微型摄像机包括透镜，大小为p的多个传感器，以及大小为d的多个具有尺寸为q的特征的宏观像素。 特征尺寸q小于p，并为微型摄像机提供大于p的分辨率。 微型相机中最小的功能决定了薄型相机的分辨率。 每个宏像素可以具有任何尺寸为q的m个特征的阵列，其中q = d / m。 可以包括附加的微型摄像机以增加功率。

    Diffractive vertical cavity surface emitting laser power monitor and system
    6.
    发明授权
    Diffractive vertical cavity surface emitting laser power monitor and system 有权
    衍射垂直腔表面发射激光功率监视器和系统

    公开(公告)号：US06314223B1

    公开(公告)日：2001-11-06

    申请号：US09386280

    申请日：1999-08-31

    Applicant: Robert Te Kolste ,  Alan D. Kathman ,  Erik G. Johnson ,  Michael R. Feldman

    Inventor： Robert Te Kolste ,  Alan D. Kathman ,  Erik G. Johnson ,  Michael R. Feldman

    IPC: G02B676

    CPC classification number: H01S5/02296 ,  G02B6/4201 ,  G02B6/4206 ,  G02B6/424 ,  G02B6/4245 ,  G02B6/4251 ,  G02B6/4255 ,  G02B6/4259 ,  G02B6/4263 ,  G02B6/4286 ,  H01S5/0683 ,  H01S5/183

    Abstract: A power monitor for a light emitter emitting from a single face creates a monitor beam by deflecting a portion of the application beam and further manipulating the monitor beam to allow more efficient use of the monitor beam. For example, the monitor beam may be collimated to allow an increase in spacing between the light emitter and a detector for sensing the monitor beam. Alternatively or additionally, the monitor beam may be focused to allow use of a smaller detector and of a smaller percentage of the application beam. The diffractive element deflecting the beam may be either transmissive or reflective. The additionally manipulation of the monitor beam may be provided by the same diffractive element which deflects the beam, which is particularly useful when the diffractive element is reflective, and/or by additional optical elements.

    Abstract translation: 用于从单个面发射的发光体的功率监视器通过偏转施加光束的一部分而产生监视器光束，并进一步操纵监视器光束以允许更有效地使用监视器光束。 例如，监视器光束可以被准直，以允许光发射器和用于感测监视器光束的检测器之间的间隔的增加。 或者或另外，监视器光束可以被聚焦以允许使用较小的检测器和较小百分比的施加光束。 偏转光束的衍射元件可以是透射的或反射的。 监视器光束的附加操作可以由偏转光束的相同的衍射元件提供，当衍射元件是反射的时，该光束是特别有用的，和/或通过附加的光学元件。

    Passively aligned integrated optical head including light source, detector, and optical element and methods of forming same
    10.
    发明授权
    Passively aligned integrated optical head including light source, detector, and optical element and methods of forming same 失效
    包括光源，检测器和光学元件的被动对准的集成光学头及其形成方法

    公开(公告)号：US5771218A

    公开(公告)日：1998-06-23

    申请号：US727837

    申请日：1996-09-27

    Applicant: Michael R. Feldman ,  Alan D. Kathman

    Inventor： Michael R. Feldman ,  Alan D. Kathman

    IPC: G02B6/12 ,  G02B6/42 ,  G02B6/43 ,  G11B7/12 ,  G11B7/135 ,  G11B7/22 ,  H01L31/12 ,  H01S5/00 ,  G11B7/00

    CPC classification number: G11B7/1372 ,  G02B6/4231 ,  G02B6/4232 ,  G11B7/123 ,  G11B7/1353 ,  G11B7/1374 ,  G11B7/22 ,  G02B2006/12102 ,  G02B2006/12107 ,  G02B6/4214 ,  G02B6/4224 ,  G02B6/4238 ,  G02B6/4239 ,  G02B6/43 ,  H01S5/005

    Abstract: An integrated optical head, such as, for a disk drive, preferably includes an optically transparent substrate. The substrate has a diffractive optical element formed on one face and a plurality of electrical contact pads exposed on the other face. A light source is positioned to emit light through the substrate, through the diffractive optical element, and toward data storage media. The light source includes a plurality of electrical contact pads corresponding to the plurality of electrical contact pads exposed on the face of the substrate. An optical detector is positioned to detect light reflected from the data storage media, through the diffractive optical element, and through the substrate. The optical detector includes a plurality of exposed electrical contact pads corresponding to the plurality of electrical contact pads exposed on the face of the substrate. The substrate and the light source and optical detector are passively aligned using solder bumps between pairs of contact pads. A mechanical passive alignment arrangement is also disclosed.

    Abstract translation: 诸如用于磁盘驱动器的集成光学头优选地包括光学透明的基板。 衬底具有形成在一个面上的衍射光学元件和暴露在另一个面上的多个电接触焊盘。 光源被定位成通过基底，通过衍射光学元件和数据存储介质发光。 光源包括对应于暴露在基板的表面上的多个电接触焊盘的多个电接触焊盘。 光学检测器被定位成通过衍射光学元件和通过基底来检测从数据存储介质反射的光。 光学检测器包括对应于暴露在基板的表面上的多个电接触焊盘的多个暴露的电接触焊盘。 基板和光源和光学检测器被使用在成对的接触焊盘之间的焊料凸块被动对准。 还公开了一种机械被动对准装置。

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