公开(公告)号：US20240096438A1

公开(公告)日：2024-03-21

申请号：US18169610

申请日：2023-02-15

Applicant: Micron Technology, Inc.

Inventor： Amitava Majumdar ,  Greg S. Hendrix ,  Anandhavel Nagendrakumar ,  Krunal Patel ,  Kirthi Shenoy ,  Danilo Caraccio ,  Ankush Lal ,  Frank F. Ross ,  Adam D. Gailey

IPC: G11C29/52 ,  G11C29/00

CPC classification number: G11C29/52 ,  G11C29/76 ,  G11C29/789

Abstract: In a memory controller system, a system and method to identify memory errors which may require soft package repair or hard package repair to rows of DRAM memory. When data is written to a row of DRAM, the data is immediately and automatically read back and scanned for bit errors. If bit errors are identified, the data is corrected and written back to the same memory location. The memory location is re-read. If bit errors are again identified, the memory location is marked for soft or hard repair. If, upon rereading the memory location, additional bit errors are identified, a historical record of memory errors is reviewed to determine if bit errors have occurred previously at the same memory location. If yes, the memory location is again marked for a soft post package repair or a hard post package repair.

公开(公告)号：US20240096439A1

公开(公告)日：2024-03-21

申请号：US18169635

申请日：2023-02-15

Applicant: Micron Technology, Inc.

Inventor： Amitava Majumdar ,  Greg S. Hendrix ,  Anandhavel Nagendrakumar ,  Krunal Patel ,  Kirthi Shenoy ,  Danilo Caraccio ,  Ankush Lal ,  Frank F. Ross ,  Adam D. Gailey

IPC: G11C29/00 ,  G11C29/52

CPC classification number: G11C29/76 ,  G11C29/52

Abstract: In a compute express link (CXL) memory controller system, a system and method to identify memory errors which may require soft package repair or hard package repair to rows of DRAM memory. When data is written to a row of DRAM, the data is immediately and automatically read back and scanned for bit errors. If bit errors are identified, steps are taken to determine if the memory location requires no repair, soft repair, or hard repair. The data is corrected and written back to a new memory location which is memory-mapped to the original location, thus effecting the soft- or hard-repair. The present system and method does not repair the entire row of memory, but only repairs the specific die(s) that exhibit memory error in the row.

公开(公告)号：US20240095120A1

公开(公告)日：2024-03-21

申请号：US18169621

申请日：2023-02-15

Applicant: Micron Technology, Inc.

Inventor： Amitava Majumdar ,  Greg S. Hendrix ,  Anandhavel Nagendrakumar ,  Krunal Patel ,  Kirthi Shenoy ,  Danilo Caraccio ,  Ankush Lal ,  Frank F. Ross ,  Adam D. Gailey

IPC: G06F11/10

CPC classification number: G06F11/1048

Abstract: In a memory controller system, a system and method to identify memory errors which may require soft package repair or hard package repair to rows of DRAM memory. When data is written to a row of DRAM, the data is immediately and automatically read back and scanned for bit errors. If bit errors are identified, the data is corrected and written back to the same memory location. The memory location is re-read. If bit errors are again identified, the memory location is marked for soft or hard repair. If, upon rereading the memory location, additional bit errors are identified, a historical record of memory errors is reviewed to determine if bit errors have occurred previously at the same memory location. If yes, the memory location is again marked for a soft post package repair or a hard post package repair.

公开(公告)号：US10937517B1

公开(公告)日：2021-03-02

申请号：US16685186

申请日：2019-11-15

Applicant: Micron Technology, Inc.

Inventor： Eric J. Rich-Plotkin ,  Christopher G. Wieduwilt ,  Boon Hor Lam ,  Greg S. Hendrix ,  Shawn M. Hilde ,  Jiyun Li ,  Dennis G. Montierth

IPC: G11C7/00 ,  G11C29/30 ,  G11C29/12 ,  G11C29/02 ,  H03M13/29 ,  G11C11/56 ,  G11C29/44

Abstract: An exemplary memory includes a memory cell array configured to store a plurality of data bits each associated with a respective column plane, and an input/output circuit including a compression circuit configured to provide error data based on a comparison between a bit of the plurality of data bits received from the memory cell array and an expected value and based on a respective column plane of the memory cell array with which the bit is associated. The compression circuit is further configured to encode a column plane error code based on the error data for provision to a data terminal.