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1.发明授权公开(公告)号：US10732890B2
公开(公告)日：2020-08-04
申请号：US15913168
申请日：2018-03-06
Applicant: Micron Technology, Inc.
Inventor： Mustafa N. Kaynak , Sampath K. Ratnam , Zixiang Loh , Nagendra Prasad Ganesh Rao , Larry J. Koudele , Vamsi Pavan Rayaprolu , Patrick R. Khayat , Shane Nowell
Abstract: A temperature related to a memory device is identified. It is determined whether the temperature related to the memory device satisfies a threshold temperature condition. Responsive to detecting that the temperature related to the memory device satisfies the threshold temperature condition, a parameter for a programming operation is adjusted from a first value to a second value to store data at the memory device.
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公开(公告)号：US20240385926A1
公开(公告)日：2024-11-21
申请号：US18661526
申请日：2024-05-10
Applicant: Micron Technology, Inc.
Inventor： Steven Michael Kientz , Hyungseok Kim , Zixiang Loh , Patrick R. Khayat , Jun Wan
Abstract: A system having a processing device operatively coupled with a memory device to perform the following operations: responsive to detecting a triggering event, measuring a temperature of the memory device to obtain a suspend temperature value, enabling a suspend temperature flag to indicate that temperature input for a step of an error handling operation is based on the suspend temperature value. Updating an operating temperature with the suspend temperature value. Determining, using a data structure which maps temperatures to read level offsets, a read level offset for the step of the error handling operation, based on the operating temperature. Causing the step of the error handling operation to be performed on a set of cells using a read level value based on the read level offset and a base read level, an disabling the suspend temperature flag.
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3.发明公开公开(公告)号：US20240036973A1
公开(公告)日：2024-02-01
申请号：US17877637
申请日：2022-07-29
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Vamsi Pavan Rayaprolu , Dung Viet Nguyen , Zixiang Loh , Sampath K. Ratnam , Patrick R. Khayat , Thomas Herbert Lentz
IPC: G06F11/10
CPC classification number: G06F11/1044
Abstract: A request to access data programmed to a memory sub-system is received. A determination is made of whether memory cells of the memory sub-system that store the programmed data satisfy one or more cell degradation criteria. In response to a determination that the memory cells satisfy the one or more cell degradation criteria, an error correction operation to access the data is performed in accordance with the request.
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4.发明授权公开(公告)号：US12007838B2
公开(公告)日：2024-06-11
申请号：US17877637
申请日：2022-07-29
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Vamsi Pavan Rayaprolu , Dung Viet Nguyen , Zixiang Loh , Sampath K Ratnam , Patrick R. Khayat , Thomas Herbert Lentz
CPC classification number: G06F11/1044
Abstract: A request to access data programmed to a memory sub-system is received. A determination is made of whether memory cells of the memory sub-system that store the programmed data satisfy one or more cell degradation criteria. In response to a determination that the memory cells satisfy the one or more cell degradation criteria, an error correction operation to access the data is performed in accordance with the request.
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Patent Agency Ranking
5.发明授权公开(公告)号：US11429309B2
公开(公告)日：2022-08-30
申请号：US16930064
申请日：2020-07-15
Applicant: Micron Technology, Inc.
Inventor： Mustafa N Kaynak , Sampath K Ratnam , Zixiang Loh , Nagendra Prasad Ganesh Rao , Larry K Koudele , Vamsi Pavan Rayaprolu , Patrick R Khayat , Shane Nowell
Abstract: A processing device, operatively coupled with a memory device, is configured to identify a temperature related to a memory device of a plurality of memory devices; to determine, whether the temperature satisfies a threshold temperature condition; responsive to detecting that the temperature related to the memory device satisfies the threshold temperature condition, to identify an entry associated with the memory device from a plurality of entries in a data structure, wherein each entry of the plurality of entries corresponds to one of the plurality of memory devices; to determine a parameter value associated with the memory device from the entry, wherein the parameter value is for a programming operation to store data at the memory device; to adjust the parameter value associated with the memory device to generate an adjusted parameter value; and to store the adjusted parameter value in the entry of the data structure.
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公开(公告)号：US20250014654A1
公开(公告)日：2025-01-09
申请号：US18758496
申请日：2024-06-28
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Patrick R. Khayat , Hyungseok Kim , Steven Michael Kientz , Zixiang Loh , Jun Wan
Abstract: A system includes a memory device; and a processing device, operatively coupled to the memory device, the processing device to perform operations including: receiving a request to perform a read operation, the request identifying a set of memory cells in a portion of a memory device; determining a first temperature of the set of memory cells, wherein the first temperature is associated with a first error handing operation of an error handling flow directed to the set of memory cells; determining an offset value to be applied to a temperature compensation coefficient of a parameter of a set of parameters associated with the set of memory cells, wherein the offset value is associated with a temperature range comprising the first temperature; determining a second temperature of the set of memory cells, wherein the second temperature is associated with a second error handling operation following the first error handing operation of the error handling flow directed to the set of memory cells; and responsive to determining that the second temperature falls in the temperature range comprising the first temperature, adjusting, based on the offset value, a temperature compensation value used in the second error handling operation.
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7.发明申请公开(公告)号：US20200348881A1
公开(公告)日：2020-11-05
申请号：US16930064
申请日：2020-07-15
Applicant: Micron Technology, Inc.
Inventor： Mustafa N Kaynak , Sampath K. Ratnam , Zixiang Loh , Nagendra Prasad Ganesh Rao , Larry K. Koudele , Vamsi Pavan Rayaprolu , Patrick R. Khayat , Shane Nowell
Abstract: A processing device, operatively coupled with a memory device, is configured to identify a temperature related to a memory device of a plurality of memory devices; to determine, whether the temperature satisfies a threshold temperature condition; responsive to detecting that the temperature related to the memory device satisfies the threshold temperature condition, to identify an entry associated with the memory device from a plurality of entries in a data structure, wherein each entry of the plurality of entries corresponds to one of the plurality of memory devices; to determine a parameter value associated with the memory device from the entry, wherein the parameter value is for a programming operation to store data at the memory device; to adjust the parameter value associated with the memory device to generate an adjusted parameter value; and to store the adjusted parameter value in the entry of the data structure.
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8.发明公开公开(公告)号：US20240296092A1
公开(公告)日：2024-09-05
申请号：US18655091
申请日：2024-05-03
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Vamsi Pavan Rayaprolu , Dung Viet Nguyen , Zixiang Loh , Sampath K. Ratnam , Patrick R. Khayat , Thomas Herbert Lentz
IPC: G06F11/10
CPC classification number: G06F11/1044
Abstract: A request to access data programmed to a memory sub-system is received. A determination is made of whether a memory device that stores the data referenced by the request satisfies a weak memory device criterion in view of a quality rating for the device. In response to a determination that the memory device satisfies the weak memory device criterion, an error correction operation to access the data is performed in accordance with the request.
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9.发明申请公开(公告)号：US20190278510A1
公开(公告)日：2019-09-12
申请号：US15913168
申请日：2018-03-06
Applicant: Micron Technology, Inc.
Inventor： Mustafa N. Kaynak , Sampath K. Ratnam , Zixiang Loh , Nagendra Prasad Ganesh Rao , Larry J. Koudele , Vamsi Pavan Rayaprolu , Patrick R. Khayat , Shane Nowell
Abstract: A temperature related to a memory device is identified. It is determined whether the temperature related to the memory device satisfies a threshold temperature condition. Responsive to detecting that the temperature related to the memory device satisfies the threshold temperature condition, a parameter for a programming operation is adjusted from a first value to a second value to store data at the memory device.
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