High Frequency Deflection Measurement of IR Absorption
    2.
    发明申请
    High Frequency Deflection Measurement of IR Absorption 有权
    红外吸收的高频偏转测量

    公开(公告)号:US20120167261A1

    公开(公告)日:2012-06-28

    申请号:US13307464

    申请日:2011-11-30

    IPC分类号: G01Q70/08

    摘要: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction, typically absorption with the sample in the region of the tip. The tip may be configured to produce electric field enhancement when illuminated by a radiation source. This enhancement allows for significantly reduced illumination power levels resulting in improved spatial resolution by confining the sample-radiation interaction to the region of field enhancement which is highly localized to the tip.

    摘要翻译: 已经证明了基于AFM的技术,通过使用AFM探针来检测波长相关的IR辐射相互作用(通常在尖端区域中的样品吸收)来在样品表面上进行高度局部化的IR光谱。 尖端可以被配置为当由辐射源照射时产生电场增强。 该增强允许显着降低的照明功率水平,通过将样本 - 辐射相互作用限制在高度定位于尖端的场增强区域上,从而提高了空间分辨率。

    Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer
    4.
    发明授权
    Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer 有权
    在与表面和纳米级红外光谱仪接触的同时降低二次谐波的微型悬臂梁

    公开(公告)号:US08387443B2

    公开(公告)日:2013-03-05

    申请号:US12558150

    申请日:2009-09-11

    IPC分类号: G01B5/28

    CPC分类号: G01Q60/38 G01Q60/32

    摘要: Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.

    摘要翻译: 这里描述了用于感测脉冲力的装置和方法。 所描述的装置和方法中的一些也可用于测量红外吸收和编辑表面的光谱和化学图谱。 还描述了当在接触模式下操作时具有降低的谐波频率的微型悬臂梁。 所描述的微悬臂梁中的一些包括内部谐振器,其构造成当微悬臂操作在接触模式时基本上独立于微悬臂尖端和表面之间的摩擦而振动。 所描述的装置和方法中的许多用于以增强的灵敏度监测脉冲力。

    High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source
    5.
    发明申请
    High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source 有权
    用调制红外光源进行红外吸收的高频偏转测量

    公开(公告)号:US20130036521A1

    公开(公告)日:2013-02-07

    申请号:US13236115

    申请日:2011-09-19

    IPC分类号: G01Q70/08

    CPC分类号: G01Q30/02 G01N21/35 G01Q60/32

    摘要: A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.

    摘要翻译: 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用,而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制,并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。

    Dynamic power control for nanoscale spectroscopy
    6.
    发明授权
    Dynamic power control for nanoscale spectroscopy 有权
    纳米级光谱的动态功率控制

    公开(公告)号:US08646319B2

    公开(公告)日:2014-02-11

    申请号:US12660266

    申请日:2010-02-23

    IPC分类号: G01B5/28 G01N21/84

    CPC分类号: G01Q30/02

    摘要: Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.

    摘要翻译: 动态红外辐射功率控制,用于基于原子力显微镜的纳米级红外光谱系统。 在来自IR源的照射期间,监测由于局部IR样品吸收而导致的AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率,以使吸收率高的位置/波长处的样品过热度最小化,吸收低的位置/波长增加,以保持信噪比。

    Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer
    8.
    发明申请
    Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer 有权
    在与表面和纳米级红外光谱仪接触的同时减少二次谐波的微型悬臂梁

    公开(公告)号:US20110061452A1

    公开(公告)日:2011-03-17

    申请号:US12558150

    申请日:2009-09-11

    IPC分类号: G01B5/28

    CPC分类号: G01Q60/38 G01Q60/32

    摘要: Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.

    摘要翻译: 这里描述了用于感测脉冲力的装置和方法。 所描述的装置和方法中的一些也可用于测量红外吸收和编辑表面的光谱和化学图谱。 还描述了当在接触模式下操作时具有降低的谐波频率的微型悬臂梁。 所描述的微悬臂梁中的一些包括内部谐振器,其构造成当微悬臂操作在接触模式时基本上独立于微悬臂尖端和表面之间的摩擦而振动。 所描述的装置和方法中的许多用于以增强的灵敏度监测脉冲力。

    Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy
    10.
    发明申请
    Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy 审中-公开
    纳米级红外光谱与多频原子力显微镜

    公开(公告)号:US20150034826A1

    公开(公告)日:2015-02-05

    申请号:US13956156

    申请日:2013-07-31

    IPC分类号: G01Q60/30 G01N21/35

    摘要: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.

    摘要翻译: 描述的是使用探针显微镜从样品的亚微米区域获得光谱信息的技术。 本发明使用AFM悬臂在多个频率下的响应基本上减少背景吸收远离感兴趣的亚微米区域的影响。 该创新大大提高了不适用于现有技术的底部照明的样品的自顶向下照射的光谱质量。