公开(公告)号：US11337316B2

公开(公告)日：2022-05-17

申请号：US16179511

申请日：2018-11-02

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Tatsuo Hasegawa ,  Toshikazu Yamada ,  Ken Matsuoka ,  Ayano Katou

IPC: H05K3/38 ,  H05K3/12 ,  H05K1/09 ,  H05K1/03

Abstract: A laminate that includes a metal layer that is not easily separated from a substrate, a method for producing the laminate, and a method for forming a fine conductive pattern that exhibits high conductivity, are disclosed. The peel strength of a metal layer included in a laminate that includes a polymer layer provided between a substrate and the metal layer is improved by implementing a structure in which the metal that forms the metal layer is chemically bonded to COO that extends from the polymer main chain that forms the polymer layer at the interface between the metal layer and the polymer layer. A fine conductive pattern that exhibits high conductivity can be formed by applying UV light to a pattern area of an insulating film formed on a substrate, and applying an ink prepared by dispersing metal nanoparticles in a solvent to the substrate to effect adhesion and aggregation of the ink in the pattern area, the surface of the metal nanoparticles being protected by an organic molecule layer.

公开(公告)号：US10892065B2

公开(公告)日：2021-01-12

申请号：US15506586

申请日：2015-08-19

Applicant: TANAKA KIKINZOKU KOGYO K.K. ,  NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Satoshi Miyazaki ,  Yuichi Makita ,  Hitoshi Kubo ,  Tatsuo Hasegawa ,  Toshikazu Yamada

IPC: H05K3/10 ,  H01B5/14 ,  B05D7/24 ,  H01B1/22 ,  H05K1/09 ,  H01B1/00 ,  H01B13/00 ,  B05D5/12 ,  B32B15/082 ,  B05D1/32 ,  B05D1/42 ,  B05D3/00 ,  B05D3/06 ,  B05D7/04

Abstract: The present invention provides a method for forming a metal pattern on a pattern formation section set in a part or the whole of a region on a base material, the base material including a fluorine-containing resin layer on a surface including at least the pattern formation section, the method including the step of: forming a functional group on a pattern formation section of the fluorine-containing resin layer by a treatment such as ultraviolet-ray irradiation, then applying to the surface of the base material a metal fine particle dispersion liquid in which metal fine particles protected by an amine compound as a first protective agent and a fatty acid as a second protective agent are dispersed in a solvent, and fixing the metal fine particles on the pattern formation section.

公开(公告)号：US11198698B2

公开(公告)日：2021-12-14

申请号：US16080172

申请日：2017-02-27

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY ,  NIPPON KAYAKU KABUSHIKI KAISHA

Inventor： Shunto Arai ,  Tatsuo Hasegawa ,  Satoru Inoue

IPC: C07D495/04 ,  C07D519/00 ,  H01L51/05 ,  H01L29/786 ,  H01L51/10 ,  H01L51/00

Abstract: In the present invention, a composition comprising two types of thienothiophene compounds selected from the group consisting of the compounds indicated by formulas (1) to (4) (in formulas (1) to (4), either one of R1 and R2 represents an alkyl group, an aromatic hydrocarbon group having an alkyl group or a heterocyclic group having an alkyl group, and the other represents a hydrogen atom, an aromatic hydrocarbon group, a heterocyclic group or a substituent represented by formula (5) (in formula (5), R3 represents an aromatic hydrocarbon group or a heterocyclic group)) can form an organic thin film which is homogeneous over a large area, and an organic semiconductor device including the organic thin film is capable of exhibiting high mobility.

公开(公告)号：US10349049B2

公开(公告)日：2019-07-09

申请号：US15502975

申请日：2015-08-11

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Junya Tsutsumi ,  Satoshi Matsuoka ,  Toshikazu Yamada ,  Tatsuo Hasegawa

IPC: H04N17/00 ,  G01M11/00 ,  G02F1/1368 ,  G09F9/00 ,  H01L29/786 ,  H01L29/808 ,  H01L29/812 ,  H01L27/28 ,  H01L51/00 ,  G02F1/1362 ,  H01L51/05

Abstract: To provide an inspection device and an inspection method which are capable of detecting a disconnection defect in an organic TFT array and/or evaluating a variation in the output properties and response speed of each organic TFT element. There are provided a device and a method of optically measuring the presence or absence of the accumulation of carriers in an organic semiconductor thin film which provides a channel layer of an organic TFT element. A source and a drain in each organic TFT are short-circuited to each other, a voltage is turned on and turned off in a predetermined period between this and a gate, and images before and after application of the voltage are captured in synchronization with the predetermined period while radiating monochromatic light, to obtain a differential image.