CONTACT PROBE AND SIGNAL TRANSMISSION METHOD

    公开(公告)号:US20220146552A1

    公开(公告)日:2022-05-12

    申请号:US17437152

    申请日:2020-03-12

    Abstract: A contact probe includes a first plunger, a second plunger, a coil spring, and a pipe; the first plunger includes a first slide portion that slides along the inner periphery of the pipe; the second plunger includes a second slide portion that slides along the inner periphery of the pipe; and the coil spring includes: a first attachment portion that is attached to the first plunger and tightly wound; a second attachment portion that is attached to the second plunger and tightly wound; a coarsely wound portion; a first contact portion including one end connected to the first attachment portion and another end connected to the coarsely wound portion and contacting the pipe; and a second contact portion including one end connected to the coarsely wound portion and another end connected to the second attachment portion and contacting to the pipe.

    Contact probe and signal transmission method

    公开(公告)号:US11940465B2

    公开(公告)日:2024-03-26

    申请号:US17437152

    申请日:2020-03-12

    CPC classification number: G01R1/07307 H01R13/2421 H01R12/714 H01R2201/20

    Abstract: A contact probe includes a first plunger, a second plunger, a coil spring, and a pipe; the first plunger includes a first slide portion that slides along the inner periphery of the pipe; the second plunger includes a second slide portion that slides along the inner periphery of the pipe; and the coil spring includes: a first attachment portion that is attached to the first plunger and tightly wound; a second attachment portion that is attached to the second plunger and tightly wound; a coarsely wound portion; a first contact portion including one end connected to the first attachment portion and another end connected to the coarsely wound portion and contacting the pipe; and a second contact portion including one end connected to the coarsely wound portion and another end connected to the second attachment portion and contacting to the pipe.

    PROBE CARD
    3.
    发明公开
    PROBE CARD 审中-公开

    公开(公告)号:US20240353445A1

    公开(公告)日:2024-10-24

    申请号:US18761394

    申请日:2024-07-02

    CPC classification number: G01R1/07342 G01R1/07314 H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    Probe card
    4.
    发明授权

    公开(公告)号:US12092660B2

    公开(公告)日:2024-09-17

    申请号:US17909593

    申请日:2021-03-02

    CPC classification number: G01R1/07342 G01R1/07314 H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

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