中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

5 records (took 0.014 seconds)

    PROBE CARD
    2.
    发明公开
    PROBE CARD 审中-公开

    公开(公告)号：US20240353445A1

    公开(公告)日：2024-10-24

    申请号：US18761394

    申请日：2024-07-02

    Applicant: NHK Spring Co., Ltd.

    Inventor： Naruhiko Nishiwaki ,  Masahiro Takahashi ,  Kazuya Soma ,  Satoshi Shoji ,  Shuji Takahashi

    IPC: G01R1/073 ,  H01L21/66

    CPC classification number: G01R1/07342 ,  G01R1/07314 ,  H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    Probe card
    3.
    发明授权
    Probe card 有权

    公开(公告)号：US12092660B2

    公开(公告)日：2024-09-17

    申请号：US17909593

    申请日：2021-03-02

    Applicant: NHK Spring Co., Ltd.

    Inventor： Naruhiko Nishiwaki ,  Masahiro Takahashi ,  Kazuya Soma ,  Satoshi Shoji ,  Shuji Takahashi

    IPC: G01R1/073 ,  H01L21/66

    CPC classification number: G01R1/07342 ,  G01R1/07314 ,  H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    Conductive probe for inspection and semiconductor inspection device
    4.
    发明授权
    Conductive probe for inspection and semiconductor inspection device 有权

    公开(公告)号：US10274517B2

    公开(公告)日：2019-04-30

    申请号：US15576605

    申请日：2017-02-01

    Applicant: NHK SPRING CO., LTD.

    Inventor： Kohei Hironaka ,  Kazuya Souma ,  Satoshi Shoji ,  Ryosuke Yamaguchi

    IPC: G01R31/28 ,  G01R1/067 ,  G01R31/26

    Abstract: Provided is a conductive probe having a first end portion and a second end portion opposing the first end portion. The first end portion includes first to fourth linear ridges and first to fifth vertexes, and the first to fourth linear ridges are spaced from one another and arranged to form a cross. The first to fourth vertexes are located on an outer circumference of the first end portion and further arranged between the first linear ridge and the second linear ridge, between the second linear ridge and the third linear ridge, between the third linear ridge and the fourth linear ridge, and between the fourth linear ridge and the first linear ridge, respectively.

Patent Agency Ranking