-
公开(公告)号：US20240348088A1
公开(公告)日：2024-10-17
申请号：US18611466
申请日：2024-03-20
CPC分类号： H02J13/00034 , G01R31/088 , G01R31/2836 , H02H3/042 , H02J13/00002
摘要： A system for estimating faulted area in an electric distribution system. The system includes a database storing input data, a fault detection module to estimate, based on the input data, if a new faulted area estimation process is required, a condition estimation module to estimate condition of metered protective devices, un-metered protective devices, and metered devices (PMDs), an upstream to downstream module to assess condition of each metered protective device, un-metered protective device, and metered device (PMD), starting from a feeder circuit breaker towards feeder downstream, to estimate a tripped protective device and a last metered device upstream of a fault, and a downstream to upstream module configured to assess outaged electric loads or elements towards network upstream to find the common interrupting protective device.
-
公开(公告)号：US11946968B2
公开(公告)日：2024-04-02
申请号：US17293855
申请日：2019-09-19
发明人： Timo Sairiala , Sami Gerdt , Markku Valtonen
CPC分类号： G01R31/2834 , G01R31/2825 , G01R31/2829 , G01R31/2836 , H04M1/24 , H04R29/001 , H04M2250/12
摘要： According to an aspect, there is provided a method for self-diagnosing a mobile device comprising at least one or more actuators, one or more sensors and a display. The method comprises, first, feeding a pre-defined control signal to a first actuator of the mobile device and measuring, in response to the feeding, a first electric signal using a first sensor of the one or more sensors. Then, the first electric signal is compared to one or more reference signals associated with the first actuator and the pre-defined control signal. If the first electric signal fails to match the one or more reference signals according to one or more pre-defined criteria, a negative diagnosis is indicated to a user of the mobile device using one or more of a display of the mobile device and one or more actuators of the mobile device.
-
公开(公告)号：US11852674B2
公开(公告)日：2023-12-26
申请号：US17896336
申请日：2022-08-26
发明人： Cheng Wu , Shuqing Duan , Jinde Gao
CPC分类号： G01R31/2836 , H05K1/0268 , H05K3/00
摘要： The present application discloses a method for locating an open circuit failure point of a test structure, which includes the following steps: step 1: providing a sample formed with a test structure, a first metal layer pattern and a second metal layer pattern of the test structure forming a series resistor structure through each via; step 2: performing a first active voltage contrast test to the sample to show an open circuit point and making a first scratch mark at an adjacent position of the open circuit point; step 3: forming a coating mark at the first scratch mark on the sample; step 4: performing a second active voltage contrast test to the sample to show the open circuit point and locating a relative position of the open circuit point by using a position of the coating mark as a reference position.
-
公开(公告)号：US20180254252A1
公开(公告)日：2018-09-06
申请号：US15759211
申请日：2015-10-15
发明人： Kazuyuki NAKAGAWA , Keita TSUCHIYA , Yoshiaki SATO , Shinji BABA
IPC分类号： H01L23/64 , H01L23/00 , H01L23/16 , H01L23/367 , H01L23/498 , H01L21/48 , H01L21/66
CPC分类号： H01L23/642 , G01R31/2836 , H01G2/06 , H01G4/38 , H01G4/40 , H01L21/4853 , H01L21/4857 , H01L21/4871 , H01L22/12 , H01L23/12 , H01L23/16 , H01L23/36 , H01L23/3675 , H01L23/49822 , H01L23/49838 , H01L23/50 , H01L24/16 , H01L25/00 , H01L2224/16227 , H01L2224/73204 , H01L2224/73253 , H01L2924/15311 , H01L2924/16195 , H01L2924/19041 , H01L2924/19103 , H01L2924/19105 , H01L2924/3511 , H05K1/0231 , H05K1/185 , H05K3/46
摘要： A semiconductor device includes a wiring substrate including a first surface and a second surface opposite to the first surface, a semiconductor chip including a plurality of chip electrodes and mounted over the wiring substrate, a first capacitor arranged at a position overlapping with the semiconductor chip in plan view and incorporated in the wiring substrate, and a second capacitor arranged between the first capacitor and a peripheral portion of the wiring substrate in plan view. Also, the second capacitor is inserted in series connection into a signal transmission path through which an electric signal is input to or output from the semiconductor chip.
-
公开(公告)号：US20180059173A1
公开(公告)日：2018-03-01
申请号：US15251133
申请日：2016-08-30
发明人： Chen Xu
IPC分类号： G01R31/28
CPC分类号： G01R31/2856 , G01R31/2812 , G01R31/2836
摘要： We disclose a circuit board that hosts at least first and second types of resistance sensors. The resistance of each sensor of the first type tends to increase, and the resistance of each sensor of the second type tends to decrease if the sensor is exposed to an aggressive environment. The circuit board also hosts a control circuit that operates to monitor respective resistances of the various resistance sensors and to process the digital values representing the resistances to estimate the working condition of one or more other electrical circuits located on the circuit board and/or in relatively close proximity to the circuit board in the corresponding equipment cabinet. The control circuit further operates to transmit out an appropriate alarm message if the estimated working condition is deemed unsatisfactory.
-
公开(公告)号：US09823294B1
公开(公告)日：2017-11-21
申请号：US14278957
申请日：2014-05-15
IPC分类号： G01R31/28
CPC分类号： G01R31/2836 , G01R31/3004 , G11C29/021 , G11C29/56
摘要： A negative voltage testing including a monitoring and triggering circuit coupled to a supply voltage rail of a device under test (DUT) and a switching circuit coupled to the monitoring and triggering circuit. The monitoring and triggering circuit is configured to cause the switching circuit to provide a first negative voltage to the supply voltage rail when a supply voltage on the supply voltage rail decays below a predetermined level during a first test of the DUT.
-
公开(公告)号：US20170219637A1
公开(公告)日：2017-08-03
申请号：US15489367
申请日：2017-04-17
发明人： Ronald Byron Kabler , Robert Leon Lutes , Alain Charles Briancon , Curtis Scott Crawford , Christopher Allen Giacoponello , Jerald Frederic Johnson , Victor Andres Jara-Olivares , Marc Anthony Epard , Steven Jeffrey Goldberg , John Berns Lancaster
CPC分类号： G01R21/06 , G01D4/008 , G01R21/00 , G01R31/2825 , G01R31/2836 , G01R31/2837 , G01R35/005 , G06Q50/06 , Y04S20/36 , Y04S20/38
摘要： The operation of electrical appliances receiving electrical power from an electrical system may be indirectly monitored using monitoring units engaged with outlets on branch circuits of the electrical system. Electrical systems providing power to appliances to be monitored in accordance with the present invention may comprise split phase alternating current systems, tri-phase systems, or any other type of electrical system. Known loads may be applied to calibrate the monitoring system. The monitoring system may measure the power consumption of appliances operating on the electrical system and/or detect possible fault conditions. The application of a known load to each phase of the electrical system for calibration permits different portions of the electrical system to be isolated and, therefor, provides improved accuracy in monitoring power consumption and detection of potential fault conditions.
-
公开(公告)号：US20160091558A1
公开(公告)日：2016-03-31
申请号：US14890648
申请日：2014-04-28
申请人： ROBERT BOSCH GMBH
IPC分类号： G01R31/28 , G01R31/40 , H03K17/687
CPC分类号： G01R31/2836 , G01R31/40 , H03K17/06 , H03K17/08 , H03K17/18 , H03K17/687
摘要： A device (100) for activating an electrical consumer (105) includes a controllable current source (140) for providing a control current, a switching unit (115) for controlling a consumer current as a function of the control current, and a sampling unit (145) for determining a time delay between an activation of the current source (140) and the enabling or interruption of the current flow by the switching unit (115). Furthermore, a processing unit (135) is provided, which is configured to determine that the current source (140) is defective if the time delay lies outside a predetermined range.
摘要翻译： 用于激活消费者（105）的设备（100）包括用于提供控制电流的可控电流源（140），用于控制作为控制电流的函数的消费者电流的开关单元（115）和采样单元 （145），用于确定所述电流源（140）的激活与由所述切换单元（115）启动或中断所述电流之间的时间延迟。 此外，提供处理单元（135），其被配置为如果时间延迟在预定范围之外，则确定电流源（140）有缺陷。
-
公开(公告)号：US20150323588A1
公开(公告)日：2015-11-12
申请号：US14273915
申请日：2014-05-09
发明人： Jia Peng , Fun Kok Chow , Chee Heng Wong , Kwee Chong Chang
CPC分类号： H02M3/33523 , G01R31/2836 , H02H3/24 , H02M3/33507 , H02M2001/0003 , H05B33/0815 , H05B37/00
摘要： An isolation device having first and second semiconductor is disclosed. The first semiconductor die may be adapted to transmit a first signal to the second semiconductor die that is electrically isolated. The first semiconductor die may have a transmitter coupled to a modulator that modulates the first signal. The second semiconductor die may have a receiver having a counter and a control circuit. The control circuit may be adapted to determine an indication of the first signal by using the counter. In addition, an isolation system and a DC-DC feedback regulation control system having such control circuit are disclosed. Likewise, a method for conveying a first signal across an isolation barrier is disclosed. The method may comprise counting a received signal based on internal clock and determining an indication of the first signal from the counter's count value.
摘要翻译： 公开了一种具有第一和第二半导体的隔离装置。 第一半导体管芯可以适于将第一信号传输到电隔离的第二半导体管芯。 第一半导体管芯可以具有耦合到调制器的调制器的发射器，该调制器调制第一信号。 第二半导体管芯可以具有具有计数器和控制电路的接收器。 控制电路可以适于通过使用计数器来确定第一信号的指示。 此外，公开了具有这种控制电路的隔离系统和DC-DC反馈调节控制系统。 同样地，公开了一种跨越隔离屏障传送第一信号的方法。 该方法可以包括基于内部时钟对接收信号进行计数，并根据计数器的计数值确定第一信号的指示。
-
公开(公告)号：US20150198656A1
公开(公告)日：2015-07-16
申请号：US14155612
申请日：2014-01-15
申请人： The Boeing Company
发明人： Gavin D. Holland , David L. Allen
CPC分类号： G01R31/2836 , G01S7/4017 , G01S2013/0245 , H01Q3/267 , H01Q21/0025 , H03F3/21 , H03F2200/462 , H03F2200/465 , H03F2200/468
摘要： Failure in a self-healing array may be handled by: detecting a failing element of the self-healing array by monitoring characteristics of the failing element; auto-correcting a failing element of the self-healing array by adjusting characteristics of the failing element to compensate for a portion of the failing element which is failing; or correcting performance of the self-healing array when one or more elements of the self-healing array fail by detecting and modeling an impact of the one or more elements of the self-healing array which failed on the performance of the self-healing array.
摘要翻译： 自愈阵列的故障可以通过以下方式来处理：通过监视故障元件的特性来检测自愈阵列的故障元件; 通过调整故障元件的特性来自动校正自愈阵列的故障元件，以补偿故障元件的一部分失效; 或者通过检测和建模失败的自修复阵列的一个或多个元件对自修复阵列的性能的影响而使自修复阵列的一个或多个元件失败时，修正自修复阵列的性能 。
-
-
-
-
-
-
-
-
-
搜索结果
172 条记录 (耗时 0.025 秒)
