Abstract:
Examples are disclosed for using or designing Chien search circuitry to locate errors for error correction code (ECC) encoded data. In some examples, an error locator polynomial (ELP) may be received that indicates a number of possible error locations for ECC encoded data. Chien search circuitry may be designed such that error locations are found based on the received ELP within one or more passes through the search circuitry. The design of the Chien search circuitry to accommodate both an average expected number of error locations for received ELPs and a worst case number of error locations for received ELPs. Other examples are described and claimed.
Abstract:
Examples are disclosed for using or designing Chien search circuitry to locate errors for error correction code (ECC) encoded data. In some examples, an error locator polynomial (ELP) may be received that indicates a number of possible error locations for ECC encoded data. Chien search circuitry may be designed such that error locations are found based on the received ELP within one or more passes through the search circuitry. The design of the Chien search circuitry to accommodate both an average expected number of error locations for received ELPs and a worst case number of error locations for received ELPs. Other examples are described and claimed.
Abstract:
Examples are disclosed for assessing pass/fail status of non-volatile memory. In some examples, information may be received to indicate a block having memory pages associated with non-volatile memory cells. The information may indicate at least some of the memory pages have bit errors in excess of an error correction code (ECC) ability to correct. For these examples, the block may be selected for read testing. Read testing may include programming the memory pages with a known pattern and waiting a period of time. Following the period of time each memory page may be read and if a resulting pattern read matches the known pattern programmed to each memory page, the memory page passes. The block may be taken offline if the number of passing memory pages is below a pass threshold number. Other examples are described and claimed.
Abstract:
Improved power management techniques for computer-readable storage devices are described. In one embodiment, for example, an apparatus may comprise a plurality of logical storage devices and a controller to manage operations of the plurality of logical storage devices, the controller comprising a configuration component to configure a global power consumption threshold defining an overall power consumption budget for the plurality of logical storage devices, a tracking component to maintain a global power consumption tally comprising an estimated total power consumption level for the plurality of logical storage devices, and an arbitration component to resolve an operation request based on the global power consumption threshold and the global power consumption tally. Other embodiments are described and claimed.
Abstract:
Examples are disclosed for assessing pass/fail status of non-volatile memory. In some examples, information may be received to indicate a block having memory pages associated with non-volatile memory cells. The information may indicate at least some of the memory pages have bit errors in excess of an error correction code (ECC) ability to correct. For these examples, the block may be selected for read testing. Read testing may include programming the memory pages with a known pattern and waiting a period of time. Following the period of time each memory page may be read and if a resulting pattern read matches the known pattern programmed to each memory page, the memory page passes. The block may be taken offline if the number of passing memory pages is below a pass threshold number. Other examples are described and claimed.
Abstract:
Improved power management techniques for computer-readable storage devices are described. In one embodiment, for example, an apparatus may comprise a plurality of logical storage devices and a controller to manage operations of the plurality of logical storage devices, the controller comprising a configuration component to configure a global power consumption threshold defining an overall power consumption budget for the plurality of logical storage devices, a tracking component to maintain a global power consumption tally comprising an estimated total power consumption level for the plurality of logical storage devices, and an arbitration component to resolve an operation request based on the global power consumption threshold and the global power consumption tally. Other embodiments are described and claimed.