Positive type photoresist composition
    2.
    发明授权
    Positive type photoresist composition 失效
    正型光致抗蚀剂组合物

    公开(公告)号:US5340688A

    公开(公告)日:1994-08-23

    申请号:US15578

    申请日:1993-02-10

    CPC分类号: G03F7/022

    摘要: Disclosed is a novel positive type photoresist composition comprising a 1,2-naphthoquinonediazido-5-(and/or -4-)sulfonic ester of a member selected from the group consisting of the polyhydroxy compounds represented by the following formula (I), (II) or (III) and an alkali-soluble resin: ##STR1## wherein the variables of Formula I are defined in the specification; ##STR2## wherein the variables of Formula II are defined in the specification; ##STR3## wherein the variables of Formula III are defined in the specification.

    摘要翻译: 公开了一种新型的正型光致抗蚀剂组合物,其包含选自由下式(I)表示的多羟基化合物,(I),(I)表示的多羟基化合物的组分的1,2-萘醌二叠氮基-5-(和/或-4-)磺酸酯, II)或(III)和碱溶性树脂:其中式I的变量在说明书中定义; (II)其中式II的变量在说明书中定义; (III)其中式III的变量在本说明书中定义。

    Light-sensitive composition
    3.
    发明授权
    Light-sensitive composition 失效
    感光组合物

    公开(公告)号:US5707777A

    公开(公告)日:1998-01-13

    申请号:US466136

    申请日:1995-06-06

    摘要: A positive-working light-sensitive composition which comprises: (a) 0.5 to 80% by weight of a compound which has at least one group capable of being decomposed by an acid and whose solubility in an alkaline developer is increased by an acid; (b) 0.01 to 20% by weight of a disulfone compound represented by the following formula (I); R.sup.1 --SO.sub.2 --SO.sub.2 --R.sup.2 (I) wherein R.sup.1 and R.sup.2 may be the same or different and represent a substituted or unsubstituted alkyl, alkenyl or aryl group; and (c) 5 to 99.49% by weight of a resin insoluble in water and soluble in an alkaline water, wherein the compound of the component (a) has a molecular weight of not more than 2,000 and a boiling point of not less than 150.degree. C. and wherein a film of the composition having a thickness of 1 .mu.m has an optical density determined at 248 nm of not more than 1.4 before exposure to light and the optical density of the composition determined at 248 nm is reduced by exposure to light of 248 nm.

    摘要翻译: 一种正性感光性组合物,其包含:(a)0.5〜80重量%的具有至少一个能够被酸分解并且在碱性显影剂中的溶解度由酸增加的化合物; (b)0.01〜20重量%的由下式(I)表示的二砜化合物; R1-SO2-SO2-R2(Ⅰ)其中R1和R2可以相同或不同,表示取代或未取代的烷基, 烯基或芳基; 和(c)5〜99.49重量%的不溶于水且可溶于碱性水的树脂,其中组分(a)的化合物的分子量不大于2,000,沸点不小于150 并且其中具有1μm厚度的组合物的膜在暴露于光之前在248nm处确定为不大于1.4的光密度,并且通过暴露于248nm下测定的组合物的光密度降低 248nm的光。

    Light-sensitive positive working composition containing a pisolfone
compound
    4.
    发明授权
    Light-sensitive positive working composition containing a pisolfone compound 失效
    含有酚醛化合物的敏感正性工作组合物

    公开(公告)号:US5110709A

    公开(公告)日:1992-05-05

    申请号:US680733

    申请日:1991-04-05

    IPC分类号: G03F7/039 H01L21/027

    CPC分类号: G03F7/039

    摘要: A positive working light-sensitive composition which comprises:(a) 10 to 95% by weight of a compound which has at least one acid-decomposable group and whose solubility in an alkaline developer increases by the action of an acid,(b) 0.01 to 20% by weight of a disulfone compound represented by the formula (I):R.sup.1 --SO.sub.2 --SO.sub.2 --R.sup.2 (I) wherein R.sup.1 and R.sup.2 may be same or different and represent substituted or unsubstituted alkyl groups, substituted or unsubstituted alkenyl groups or substituted or unsubstituted aryl groups, and(c) 3 to 85% by weight of a water-insoluble but alkaline water-soluble resin, wherein the optical density at 248 nm of 1 .mu.m thick coating of the composition is not more than 1.4 and the optical density at 248 nm of the coating exposed to light of 248 nm is less than the optical density of the coating before exposed to light.The light-sensitive composition is highly responsive to light of Deep-UV regions and excellent in image resolution.

    摘要翻译: 一种正性工作感光性组合物,其包含:(a)10至95重量%的具有至少一个酸可分解基团并且其在碱性显影剂中的溶解度随着酸的作用而增加的化合物,(b)0.01 至20重量%的由式(I)表示的二砜化合物:R 1 -SO 2 -SO 2 -R 2(I)其中R 1和R 2可以相同或不同,表示取代或未取代的烷基,取代或未取代的烯基或 取代或未取代的芳基,和(c)3-85重量%的不溶于水的碱性水溶性树脂,其中组合物的1μm厚涂层的248nm处的光密度不大于1.4, 曝光于248nm的涂层的248nm处的光密度小于曝光前的涂层的光密度。 感光组合物对深UV区域的光敏感性高,图像分辨率优异。

    Light-sensitive composition
    5.
    发明授权
    Light-sensitive composition 失效
    感光组合物

    公开(公告)号:US5576143A

    公开(公告)日:1996-11-19

    申请号:US985262

    申请日:1992-12-03

    IPC分类号: G03F7/004 G03C1/492

    CPC分类号: G03F7/0045 Y10S430/156

    摘要: A positive type or negative type light-sensitive composition providing high sensitivity and high resolution in the manufacture of a semiconductor device, and contains:(a) a compound which has at least one group capable of decomposing by acid and a solubility that is increased in an alkaline developing solution,(b) a compound which generates acid by an irradiation with actinic rays or radiation,(c) a compound which generates a base at 50.degree. C. or higher, and(d) a resin which is insoluble in water and soluble in an alkaline aqueous solution.

    摘要翻译: 在半导体器件的制造中提供高灵敏度和高分辨率的正型或负型光敏组合物,其包含:(a)具有至少一个能够被酸分解的基团和溶解度增加的化合物 碱性显影液,(b)通过光化射线或辐射照射产生酸的化合物,(c)在50℃以上产生碱的化合物,和(d)不溶于水的树脂 并溶于碱性水溶液。

    Positive quinonediazide photoresist composition containing select
hydroxyphenol additive
    6.
    发明授权
    Positive quinonediazide photoresist composition containing select hydroxyphenol additive 失效
    含有选择性羟基苯酚添加剂的正醌二叠氮化物光致抗蚀剂组合物

    公开(公告)号:US5318875A

    公开(公告)日:1994-06-07

    申请号:US15921

    申请日:1993-02-10

    摘要: A positive photoresist composition includes an alkali-soluble resin, a quinonediazide compound and a compound selected from the group consisting of compounds represented by formulae (I), (II) and (III): ##STR1## wherein R.sub.1 to R.sub.27, which may be the same or different, each represents a hydrogen atom, hydroxyl group, halogen atom, alkyl group, alkoxy group, nitro group, alkenyl group, aryl group, aralkyl group, alkoxycarbonyl group, arylcarbonyl group, acyloxy group, acyl group, aryloxy group or aralkoxy group; ##STR2## wherein R.sub.31 represents an organic group, single bond, ##STR3## R.sub.32 represents a hydrogen atom, monovalent organic group or ##STR4## R.sub.33 to R.sub.37, which may be the same or different, and in which not all four groups for each of R.sub.33 to R.sub.37 may be the same at the same time, each represents a hydrogen atom, hydroxyl group, halogen atom, alkyl group, alkoxy group or alkenyl group, with the proviso that at least one of R.sub.33 to R.sub.35 is a hydroxyl group; X represents a divalent organic group; and m represents an integer 0 or 1; ##STR5## wherein R.sub.41 to R.sub.44, which may be the same or different and in which not all four groups for each of R.sub.41 to R.sub.44 may be the same at the same time, each represents a hydrogen atom, hydroxyl group, halogen atom, alkyl group, alkoxy group or alkenyl group; R.sub.45 and R.sub.46 each represents a hydrogen atom, alkyl group or ##STR6## a and c each represents an integer 0 or 1; and b represents an integer from 1 to 4.

    摘要翻译: 正型光致抗蚀剂组合物包括碱溶性树脂,醌二叠氮化合物和选自由式(I),(II)和(III)表示的化合物的化合物:其中R 1至R 27, 可以相同或不同,分别表示氢原子,羟基,卤素原子,烷基,烷氧基,硝基,烯基,芳基,芳烷基,烷氧基羰基,芳基羰基,酰氧基,酰基, 芳氧基或芳烷氧基; (II)其中R31表示有机基团,单键,R32表示氢原子,一价有机基团或R33至R37,其可以相同或不同,并且其中并不全部为四 R 33〜R 37各自可以相同,各自表示氢原子,羟基,卤素原子,烷基,烷氧基或烯基,条件是R 33〜R 35中的至少一个为 羟基; X表示二价有机基团; m表示0或1的整数; (III)其中R41〜R44可以相同或不同,并且其中R41至R44中的每一个不是全部四个基团可以同时相同,各自表示氢原子,羟基,卤素 原子,烷基,烷氧基或烯基; R 45和R 46各自表示氢原子,烷基或者a和c各自表示0或1的整数; b表示1〜4的整数。

    Positive-type photoresist composition
    7.
    发明授权
    Positive-type photoresist composition 失效
    正型光致抗蚀剂组合物

    公开(公告)号:US5248582A

    公开(公告)日:1993-09-28

    申请号:US987562

    申请日:1992-12-08

    IPC分类号: G03F7/022

    CPC分类号: G03F7/022

    摘要: A positive type photoresist composition which comprises an alkali soluble novolak resin and at least one light-sensitive material represented by the following general formulae (I) to (IV) to provide a resist pattern with high resolution, high reproduction fidelity, desirable sectional shape, wide latitude of development, high heat resistance and high storage stability: ##STR1## (wherein X represents --CO--, or --SO.sub.2 --; p represents an integer from 2 to 4; R's may be the same or different, each being --H, --OH, a substituted or unsubstituted alkyl group, a substituted or unsubstituted alkoxy group, a substituted or unsubstituted aryl group, a substituted or unsubstituted aralkyl group, a substituted or unsubstituted acyl group, a substituted or unsubstituted acyloxy group, ##STR2## provided that R always contains at least one of ##STR3## ; R.sub.1 represents ##STR4## a substituted or unsubstituted di- to tetra-valent alkyl group, or a substituted or unsubstituted di- to tetra-valent aromatic group; and l, m and n Represent O or an integer of from 1 to 3, provided that at least one of them is not zero).

    摘要翻译: 一种正型光致抗蚀剂组合物,其包含碱溶性酚醛清漆树脂和由以下通式(I)至(IV)表示的至少一种感光材料,以提供具有高分辨率,高再现保真度,期望的截面形状的抗蚀剂图案, 宽范围的发展,高耐热性和高储存稳定性:其中X表示-CO-或-SO 2 - ;其中X表示-CO-或-SO 2 - ; p表示2至4的整数; R可以相同或不同,各自为-H,-OH,取代或未取代的烷基,取代或未取代的烷氧基,取代或未取代的芳基,取代或未取代的 芳烷基,取代或未取代的酰基,取代或未取代的酰氧基,条件是R总是包含至少一个; R 1表示取代或未取代的二价至四价的烷基 ,或替代或未授权 抽出二价至四价芳基; 和l,m和n表示O或1至3的整数,条件是它们中的至少一个不为零)。

    Positive type photoresist composition comprising as a photosensitive
ingredient a derivative of a triphenylmethane condensed with an
o-quinone diazide
    8.
    发明授权
    Positive type photoresist composition comprising as a photosensitive ingredient a derivative of a triphenylmethane condensed with an o-quinone diazide 失效
    正型光致抗蚀剂组合物,其包含与邻醌重氮化物缩合的三苯甲烷的衍生物作为感光成分

    公开(公告)号:US5153096A

    公开(公告)日:1992-10-06

    申请号:US670513

    申请日:1991-03-18

    IPC分类号: G03C1/72 G03F7/022 H01L21/027

    CPC分类号: G03F7/022

    摘要: A positive type photoresist composition comprising at least one light-sensitive material, as defined herein, and an alkali-soluble novolak resin, has a high resolving power, particularly when used in semiconductor devices, accurately reproduces mask dimensions over a wide photomask line width range, from a resist pattern in a cross-sectional form having a high aspect ratio in a pattern having a line width of no greater than 1 .mu.m, has a wide developing latitude and excellent heat resistance.

    摘要翻译: 包含如本文所定义的至少一种感光材料和碱溶性酚醛清漆树脂的正型光致抗蚀剂组合物具有高分辨能力,特别是当用于半导体器件时,在宽的光掩模线宽度范围内精确地再现掩模尺寸 从具有不大于1μm的线宽的图案的具有高纵横比的横截面形式的抗蚀剂图案具有宽的显影宽度和优异的耐热性。