摘要:
An x-ray examination apparatus includes an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector has a semiconductor element including one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.
摘要:
A photodiode radiation sensor sensitive to luminous or x-ray radiation, has an inherent capacitance which is charged by the radiation. The charge is read out by a switching diode. The diode is placed in its conductive state by an auxiliary voltage and is switched off after the read-out process. The quantity of charge flowing during the read-out process is measured and used to determine the quantity of incident radiation. To measure relatively small quantities of charge, a voltage is coupled in when the auxiliary voltage is switched on to place the switching diode in a more strongly conducting state so that during the read-out process a larger quantity of charge flows away.
摘要:
A sensor matrix includes light-sensitive and/or X-ray sensitive thin-film sensors (1) comprising two electrodes (2, 6) and a semiconductor layer (5) therebetween. In each sensor (1) there is a separate electrode which serves as the first electrode (2), the semiconductor layer (5) being constructed as a continuous layer which is common to all sensors (1), and which covers all first electrodes (1), the second electrodes (6) being formed, at least for groups of sensors (1), as a continuous layer (6) which covers the semiconductor layer (5) at the area of all first electrodes (2) of the sensors (1) of the relevant group and acts as a second electrode for all sensors of the relevant group.
摘要:
In an arrangement of light-sensitive or X-ray sensitive sensors (S.sub.1,1, . . . , S.sub.2048,2048) arranged in a matrix in rows and columns, which sensors produce charge states in dependence upon the amount of incident radiation and each have an electrical switch, for each sensor row a switching line (33.sub.1, . . . , 33.sub.2048) via which the switches (3) can be activated so that the charge states of the sensors of the activated sensor row are read or reset simultaneously via associated read lines (8, 9, 10), there is provided a reset device (30a, 30b) for resetting the charge states of previously read sensor rows, which device activates at least one of the previously read sensor rows, which activates another of the previously read sensor rows after a predetermined number of clock pulses of a reset clock signal (T.sub.32), and which deactivates each activated sensor row a predetermined number of clock pulses after its activation.
摘要:
A matrix of light-sensitive or x-ray sensitive sensors (S.sub.1,1, . . . S.sub.2000,200) are arranged in rows and columns and generate charges in dependence on the amount of incident radiation. The sensors comprise a respective electric switch (3) and are constructed, like the electric switches (3), of thin-film technology. Each sensor row has a switching line (5, 6, . . . , 7) via which the switches can be activated so that the charges of the relevant activated sensor row are simultaneously output via read lines (8, 9, . . . , 10, . . . ). Transfer means convert the signals read in parallel into a serial output signal; in order to achieve an as favorable as possible noise behavior. An amplifier (11, 12, . . . , 13) is in each read line and is constructed as a silicon crystal and precedes the transfer means. During the read operations, the amplifiers simplify the signals read from the sensors (S.sub.1.1, . . . S.sub.2000,2000) connected to the relevant read line (8, 9, . . . , 10, . . . ).
摘要:
An X-ray examination apparatus includes a sensor matrix (41) with sensors (1) which are arranged in rows and columns and each of which comprises an X-ray sensitive photosensor element (11) and a storage capacitance (12) which is connected parallel thereto. First electrodes of the sensors are connected to a counter-electrode (2) which receives a direct voltage, second electrodes being connected to an electric switch (13) provided for each sensor. For exposure measurement the currents flowing through the counter-electrode (electrodes) (2) and/or the electric switches (13) after the brief closing of the electric switches (13) and before the reading of the charges are used to measure and/or correct the exposure of groups of the sensors during the execution of an X-ray exposure.
摘要:
The invention relates to an X-ray image detector, comprising a plurality of X-ray-sensitive sensors and having the following features:each sensor comprises a collecting electrode and a switching element which connects the collecting electrode to an output lead;a photoconductor layer is provided between the individual collecting electrodes and a bias electrode;the collecting electrodes form, in conjuction with reference electrodes, capacitances which can be charged by charge carriers generated in the photoconductor. The invention improves the effectiveness of such an X-ray image detector in that either the surface area of the collecting electrodes is increased or the electric field is distorted by a semiconductor layer so that the majority of the charge carriers generated in the photoconductor flow to the collecting electrodes.
摘要:
The invention relates to a method of generating X-ray images by means of a photoconductor which is provided on a conductive substrate and whose surface potential can be read by means of probes, and also relates to a device suitable for carrying out the method. In order to avoid image artefacts which could be caused by deviating sensitivities of the probes or by frequency-dependent distortions, after the charging of the photoconductor the substrate potential is varied during a test phase. Test data is generated which correspond to the spatial or temporal variation of the potential on the surface of the photoconductor; from this test data there is formed correction data which is stored in order to correct the image data of a subsequent X-ray exposure.
摘要:
An image detector includes a sensor matrix with a plurality of sensor elements for converting radiation into electrical charges and with several line conductors. The sensor elements are arranged in columns and rows. Separate sensor elements are coupled to at least one of the line conductors. Separate groups of sensor elements in one column and/or in one row of the matrix are coupled to different line conductors and at least one line conductor is coupled to sensor elements of at least two columns or of at least two rows.
摘要:
An x-ray examination apparatus comprises an x-ray image sensor matrix (1) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (2) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (2) is provided with a memory which stores correction values. Further the correction provided with a selection unit (5) for selecting appropriate correction values from the memory (3).