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公开(公告)号：US20240312753A1
公开(公告)日：2024-09-19
申请号：US18575257
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： H01J25/50 , G01N23/04 , G01N23/083 , H05H9/00
CPC分类号： H01J25/50 , G01N23/04 , G01N23/083 , H05H9/00 , G01N2223/20
摘要： A radiation inspection system includes: a single ray source having a plurality of accelerating tubes, and the plurality of accelerating tubes respectively generate a plurality of rays having different energies, and beam exit directions of the plurality of accelerating tubes comprise at least two different beam exit directions; a plurality of detectors configured to detect a signal when rays emitted by the single ray source act on the inspected object; and a processor in communication connection with the single ray source and configured to respectively control the plurality of accelerating tubes. A radiation inspection method is also provided.
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公开(公告)号：US20220030132A1
公开(公告)日：2022-01-27
申请号：US17382236
申请日：2021-07-21
发明人： Bicheng LIU , Hao Yu , Weizhen Wang , Guangming Xu , Haojie Chi , Shangmin Sun , Chunguang Zong , Yu Hu
摘要： The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.
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公开(公告)号：US20210025836A1
公开(公告)日：2021-01-28
申请号：US16935415
申请日：2020-07-22
发明人： Zhi ZENG , Xingyu PAN , Xuewu WANG , Junli LI , Ming ZENG , Jianmin LI , Ziran ZHAO , Jianping CHENG , Hao MA , Hui ZHANG , Hao YU , Bicheng LIU
IPC分类号： G01N23/201 , G01N23/02 , G06K9/62
摘要： The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.
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4.发明申请公开(公告)号：US20200309987A1
公开(公告)日：2020-10-01
申请号：US16314093
申请日：2017-09-12
发明人： Guangming XU , Bicheng LIU , Ziran ZHAO , Jianping GU , Qiang LI , Lan ZHANG
IPC分类号： G01V5/00 , G01N23/087 , G01R23/18
摘要： The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue.
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公开(公告)号：US20170329038A1
公开(公告)日：2017-11-16
申请号：US15411348
申请日：2017-01-20
发明人： Kejun KANG , Zhiqiang CHEN , Yuanjing LI , Ziran ZHAO , Junli LI , Xuewu WANG , Yaohong LIU , Zhi ZENG , Jianping GU , Song LIANG , Bicheng LIU , Guangming XU , Yongqiang WANG
IPC分类号： G01V5/00
CPC分类号： G01V5/0016 , G01N2223/205 , G01T1/167 , G01T5/002 , G01T5/02 , G01V5/0025 , G01V5/0075 , G01V5/0091 , G06K9/6267
摘要： The present application relates to a method, apparatus and system for inspecting an object based on a cosmic ray, pertaining to the technical field of radiometric imaging and safety inspection. The method includes: recording a movement trajectory of an inspected object by using a monitoring device; acquiring information of charged particles in the cosmic ray by using a position-sensitive detector, the information of charged particles comprising trajectory information of the charged particles; performing position coincidence for the movement trajectory and the trajectory information to determine the object; performing trajectory remodeling for the charged particles according to the information of charged particles; and identifying a material inside the moving object according to the trajectory remodeling. According to the present disclosure, pedestrians who are walking and moving are inspected by using the cosmic ray, and nuclear materials, drugs and explosive materials and the like carried by human bodies may be detected.
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公开(公告)号：US20240319114A1
公开(公告)日：2024-09-26
申请号：US18574756
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/04 , G01N23/083 , G01N23/10
CPC分类号： G01N23/04 , G01N23/083 , G01N23/10 , G01N2223/204 , G01N2223/50
摘要： An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.
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公开(公告)号：US20240302299A1
公开(公告)日：2024-09-12
申请号：US18575301
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/083 , G01N23/04 , H01J25/50
CPC分类号： G01N23/083 , G01N23/04 , G01N2223/20 , H01J25/50
摘要： An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.
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公开(公告)号：US20240319112A1
公开(公告)日：2024-09-26
申请号：US18575288
申请日：2022-07-01
发明人： Bicheng LIU , Weizhen WANG , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/02
CPC分类号： G01N23/02 , G01N2223/1006 , G01N2223/206 , G01N2223/64
摘要： The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.
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公开(公告)号：US20230288350A1
公开(公告)日：2023-09-14
申请号：US18013555
申请日：2021-07-02
发明人： Zhiqiang CHEN , Yuanjing LI , Shangmin SUN , Chunguang ZONG , Yu HU , Huaping TANG , Bicheng LIU , Weizhen WANG
IPC分类号： G01N23/203
CPC分类号： G01N23/203 , G01N2223/316 , G01N2223/3301 , G01N2223/501
摘要： The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.
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公开(公告)号：US20210364455A1
公开(公告)日：2021-11-25
申请号：US17255968
申请日：2020-01-03
发明人： Jianmin LI , Li ZHANG , Yuanjing LI , Zhiqiang CHEN , Hao YU , Shangmin SUN , Bicheng LIU , Weizhen WANG , Dongyu WANG , Yuan MA , Yu HU , Chunguang ZONG
IPC分类号： G01N23/20008 , G01N23/203
摘要： The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
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