公开(公告)号：US20240312753A1

公开(公告)日：2024-09-19

申请号：US18575257

申请日：2022-07-01

Applicant: NUCTECH COMPANY LIMITED

Inventor： Weizhen WANG ,  Bicheng LIU ,  Chunguang ZONG ,  Shangmin SUN

IPC: H01J25/50 ,  G01N23/04 ,  G01N23/083 ,  H05H9/00

CPC classification number: H01J25/50 ,  G01N23/04 ,  G01N23/083 ,  H05H9/00 ,  G01N2223/20

Abstract: A radiation inspection system includes: a single ray source having a plurality of accelerating tubes, and the plurality of accelerating tubes respectively generate a plurality of rays having different energies, and beam exit directions of the plurality of accelerating tubes comprise at least two different beam exit directions; a plurality of detectors configured to detect a signal when rays emitted by the single ray source act on the inspected object; and a processor in communication connection with the single ray source and configured to respectively control the plurality of accelerating tubes. A radiation inspection method is also provided.

公开(公告)号：US20220030132A1

公开(公告)日：2022-01-27

申请号：US17382236

申请日：2021-07-21

Applicant: NUCTECH COMPANY LIMITED

Inventor： Bicheng LIU ,  Hao Yu ,  Weizhen Wang ,  Guangming Xu ,  Haojie Chi ,  Shangmin Sun ,  Chunguang Zong ,  Yu Hu

IPC: H04N1/409 ,  H04N1/00 ,  G06T5/00 ,  G06T5/50 ,  G06T7/00 ,  G06T3/40

Abstract: The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.

公开(公告)号：US20240319114A1

公开(公告)日：2024-09-26

申请号：US18574756

申请日：2022-07-01

Applicant: NUCTECH COMPANY LIMITED

Inventor： Weizhen WANG ,  Bicheng LIU ,  Chunguang ZONG ,  Shangmin SUN

IPC: G01N23/04 ,  G01N23/083 ,  G01N23/10

CPC classification number: G01N23/04 ,  G01N23/083 ,  G01N23/10 ,  G01N2223/204 ,  G01N2223/50

Abstract: An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.

公开(公告)号：US20240302299A1

公开(公告)日：2024-09-12

申请号：US18575301

申请日：2022-07-01

Applicant: NUCTECH COMPANY LIMITED

Inventor： Weizhen WANG ,  Bicheng LIU ,  Chunguang ZONG ,  Shangmin SUN

IPC: G01N23/083 ,  G01N23/04 ,  H01J25/50

CPC classification number: G01N23/083 ,  G01N23/04 ,  G01N2223/20 ,  H01J25/50

Abstract: An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.

公开(公告)号：US20240319112A1

公开(公告)日：2024-09-26

申请号：US18575288

申请日：2022-07-01

Applicant: NUCTECH COMPANY LIMITED

Inventor： Bicheng LIU ,  Weizhen WANG ,  Chunguang ZONG ,  Shangmin SUN

IPC: G01N23/02

CPC classification number: G01N23/02 ,  G01N2223/1006 ,  G01N2223/206 ,  G01N2223/64

Abstract: The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.

公开(公告)号：US20230288350A1

公开(公告)日：2023-09-14

申请号：US18013555

申请日：2021-07-02

Applicant: NUCTECH COMPANY LIMITED

Inventor： Zhiqiang CHEN ,  Yuanjing LI ,  Shangmin SUN ,  Chunguang ZONG ,  Yu HU ,  Huaping TANG ,  Bicheng LIU ,  Weizhen WANG

IPC: G01N23/203

CPC classification number: G01N23/203 ,  G01N2223/316 ,  G01N2223/3301 ,  G01N2223/501

Abstract: The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

公开(公告)号：US20210364455A1

公开(公告)日：2021-11-25

申请号：US17255968

申请日：2020-01-03

Applicant: TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED ,  NUCTECH (BEIJING) COMPANY LIMITED

Inventor： Jianmin LI ,  Li ZHANG ,  Yuanjing LI ,  Zhiqiang CHEN ,  Hao YU ,  Shangmin SUN ,  Bicheng LIU ,  Weizhen WANG ,  Dongyu WANG ,  Yuan MA ,  Yu HU ,  Chunguang ZONG

IPC: G01N23/20008 ,  G01N23/203

Abstract: The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

公开(公告)号：US20180153493A1

公开(公告)日：2018-06-07

申请号：US15720502

申请日：2017-09-29

Applicant: NUCTECH COMPANY LIMITED

Inventor： Guangming XU ,  Bicheng LIU ,  Ziran ZHAO ,  Lan ZHANG ,  Jianping GU

IPC: A61B6/00 ,  A61B6/02

CPC classification number: A61B6/482 ,  A61B6/02 ,  A61B6/06 ,  A61B6/4014 ,  A61B6/4241 ,  G01V5/0041

Abstract: The present disclosure provides a method for recognizing an article using a multi-energy spectrum X-ray imaging system and a multi-energy spectrum X-ray imaging system. The method comprises: recognizing an application scenario and/or priori information of the article; selecting a parameter mode suitable for the article from a plurality of parameter modes stored in the multi-energy spectrum X-ray imaging system based on the recognized application scenario and/or priori information; and recognizing the article using the selected parameter mode, wherein the plurality of parameter modes are obtained by optimizing system parameters of the multi-energy spectrum X-ray imaging system under a specific condition using a training sample library for various articles.

公开(公告)号：US20250035569A1

公开(公告)日：2025-01-30

申请号：US18715229

申请日：2022-12-26

Applicant: NUCTECH (BEIJING) COMPANY LIMITED ,  NUCTECH COMPANY LIMITED

Inventor： Yuanjing LI ,  Shangmin SUN ,  Chunguang ZONG ,  Tao SONG ,  Lei LIU ,  Yuan MA ,  Weifeng YU ,  Bicheng LIU

IPC: G01N23/10 ,  G01N23/04 ,  G01N23/083 ,  G01P3/64

Abstract: A security inspection device, a security inspection system and a security inspection method are provided, the device includes: a support frame defining an inspection channel; a first X-ray accelerator provided at a position of a top portion of the support frame and the position is offset from a centerline of the inspection channel, where the first X-ray accelerator is configured to radiate a first X-ray towards the inspection channel to inspect an object; a second X-ray accelerator configured to radiate a second X-ray to the inspection channel to inspect the object; and a detector apparatus, including: detector modules provided on the support frame and facing the first X-ray accelerator and the second X-ray accelerator, the detector modules receive the first X-ray and/or the second X-ray to form a transmission image of the object; the first X-ray, the second X-ray, and the detector modules are located in the same plane.

公开(公告)号：US20240411045A1

公开(公告)日：2024-12-12

申请号：US18716943

申请日：2022-12-16

Applicant: NUCTECH (BEIJING) COMPANY LIMITED ,  NUCTECH COMPANY LIMITED

Inventor： Shangmin SUN ,  Chunguang ZONG ,  Xuejing YANG ,  Xuping FAN ,  Quanwei SONG ,  Junping SHI ,  Hui MENG ,  Yang YANG ,  Weifeng YU ,  Ying LI ,  Dongyu WANG ,  Lei LIU ,  Bicheng LIU ,  Haojie CHI

IPC: G01V5/22 ,  G01N23/04

Abstract: A mobile radiation inspection apparatus includes a vehicle body, a traveling mechanism, a boom assembly, a first imaging device, and a second imaging device. The boom assembly is mounted on the vehicle body and is configured to switch between an inspection state and a transportation state. The first imaging device includes a first ray source and a first ray detector both mounted on the boom assembly. The first ray source is positioned at the top of an inspection channel. The second imaging device includes a second ray source and a second ray detector. The second ray detector cooperates with the second ray source to detect rays emitted by the second ray source, and the second ray source is positioned on a side surface of the inspection channel. The mobile radiation inspection apparatus implements multi-angle and multi-mode scanning.