Abstract:
A security inspection device, a security inspection system and a security inspection method are provided, the device includes: a support frame defining an inspection channel; a first X-ray accelerator provided at a position of a top portion of the support frame and the position is offset from a centerline of the inspection channel, where the first X-ray accelerator is configured to radiate a first X-ray towards the inspection channel to inspect an object; a second X-ray accelerator configured to radiate a second X-ray to the inspection channel to inspect the object; and a detector apparatus, including: detector modules provided on the support frame and facing the first X-ray accelerator and the second X-ray accelerator, the detector modules receive the first X-ray and/or the second X-ray to form a transmission image of the object; the first X-ray, the second X-ray, and the detector modules are located in the same plane.
Abstract:
A mobile radiation inspection apparatus includes a vehicle body, a traveling mechanism, a boom assembly, a first imaging device, and a second imaging device. The boom assembly is mounted on the vehicle body and is configured to switch between an inspection state and a transportation state. The first imaging device includes a first ray source and a first ray detector both mounted on the boom assembly. The first ray source is positioned at the top of an inspection channel. The second imaging device includes a second ray source and a second ray detector. The second ray detector cooperates with the second ray source to detect rays emitted by the second ray source, and the second ray source is positioned on a side surface of the inspection channel. The mobile radiation inspection apparatus implements multi-angle and multi-mode scanning.
Abstract:
The present disclosure discloses a vehicle-mounted type back scattering inspection system. The vehicle-mounted type back scattering inspection system includes a carriage and a back scattering imaging device, the scanning range of the back scattering imaging device is variable. As the scanning range of the back scattering imaging device of the present disclosure is variably set, the inspection range of the back scattering imaging device can be expanded.
Abstract:
The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.
Abstract:
The present disclosure provides a radiation inspection system, including a container respectively provided with an entrance and an exit on opposite side walls thereof; and a radiation scanning imaging device disposed in the container and having an inspection channel. The radiation scanning imaging device includes a ray source, the ray source includes ray generators, and ray generators are configured to emit ray beams at different angles, so that the radiation scanning imaging device performs radiation scanning inspection on an object to be inspected passing through the inspection channel from the entrance to the exit.
Abstract:
The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.
Abstract:
The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
Abstract:
The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.
Abstract:
The present invention provides a standing wave electron linear accelerator comprising a modulator and a magnetron for producing radio frequency microwaves; a plurality of accelerating tubes for accelerating electrons; a microwave transmission system for feeding the microwaves into the plurality of accelerating tubes; a plurality of electron guns for emitting electron beams into the plurality of accelerating tubes; a plurality of targets impinged by the electrons from a plurality of accelerating tubes to form continuous spectrums of X-rays; a plurality of shielding devices for shielding the continuous spectrums of X-rays generated by the targets; and a microwave distributor disposed adjacent to the end of the microwave transmission system, wherein the microwave distributor has a microwave inlet and a plurality of microwave outlets for distributing the microwaves in the microwave transmission system into the accelerating tubes.
Abstract:
An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.