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    CT INSPECTION SYSTEM AND CT IMAGING METHOD
    1.
    发明申请
    CT INSPECTION SYSTEM AND CT IMAGING METHOD 审中-公开

    公开(公告)号：US20190204242A1

    公开(公告)日：2019-07-04

    申请号：US16234621

    申请日：2018-12-28

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    发明人： Xiulin NI ,  Jianmin LI ,  Haitian TAN ,  Yulan LI ,  Weifeng YU ,  Yuanjing LI ,  Hejun ZHOU ,  Zhiqiang CHEN ,  Chunguang ZONG ,  Li ZHANG

    IPC分类号： G01N23/046 ,  G01V5/00

    CPC分类号： G01N23/046 ,  G01N2223/401 ,  G01V5/005

    摘要： The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.

    FORK-ARM LIFT TRACTOR
    3.
    发明申请
    FORK-ARM LIFT TRACTOR 审中-公开

    公开(公告)号：US20190193691A1

    公开(公告)日：2019-06-27

    申请号：US16233398

    申请日：2018-12-27

    申请人： TSINGHUA UNIVERSITY ,  Nuctech Company Limited

    发明人： Yuan HE ,  Jianmin LI ,  Hongqi LI ,  Yulan LI ,  Qiangqiang WANG ,  Yuanjing LI ,  Zhiqiang CHEN ,  Li ZHANG

    IPC分类号： B60S13/00

    CPC分类号： B60S13/00 ,  B60S5/00 ,  B62D49/02 ,  B62D49/0692

    摘要： A fork-arm lift tractor includes a vehicle body, a supporting plate disposed above the vehicle body, a lifting device for driving the supporting plate to be lifted, a front and rear fork-arm assemblies, a front and rear fork-arm drive assemblies. The front fork-arm assembly includes two front fork-arms rotatably disposed at the supporting plate. The rear fork-arm assembly includes two rear fork-arms rotatably disposed at the supporting plate, and the front and rear fork-arms may be deployed or retracted from both sides of the supporting plate. The front fork-arm driving assembly includes a front transmission part, and a front power device disposed at the supporting plate and may drive the front transmission part to move horizontally linearly so as to rotate the two front fork-arms. The rear fork-arm driving assembly has almost the same structure of the front fork-arm driving assembly and is used to rotate the two rear fork-arms.

    METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR
    4.
    发明申请
    METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR 有权
    用于处理半导体检测器信号的方法和装置

    公开(公告)号：US20160018537A1

    公开(公告)日：2016-01-21

    申请号：US14800635

    申请日：2015-07-15

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    发明人： Lan ZHANG ,  Yulan LI ,  Yuanjing LI ,  Jianqiang FU ,  Yingshuai DU ,  Wei ZHANG ,  Xuming MA ,  Jun LI

    IPC分类号： G01T1/24 ,  H04N5/32

    CPC分类号： G01T1/247 ,  G01T1/241 ,  H04N5/32

    摘要： The present invention provides a method and apparatus for processing signals of a semiconductor detector, including: acquiring a relationship of a time difference between anode and cathode signals of the semiconductor detector with an anode signal amplitude; obtaining an optimal data screening interval according to the relationship of the time difference between anode and cathode signals of the semiconductor detector with the anode signal amplitude, wherein the optimal data screening interval is an interval where the time difference between the anode and cathode signals is greater than 50 ns; and screening and processing the collected data according to the optimal data screening interval when the semiconductor detector collects data. The present invention better overcomes the inherent crystal defects of the detector, reduces the effect of background noise, increases the energy resolution of the cadmium zinc telluride detector under room temperature, and improves the peak-to-compton ratio.

    摘要翻译： 本发明提供了一种用于处理半导体检测器的信号的方法和装置，包括：用阳极信号振幅获取半导体检测器的阳极和阴极信号之间的时间差的关系; 根据半导体检测器的阳极和阴极信号的时间差与阳极信号幅度的关系获得最佳数据筛选间隔，其中最佳数据筛选间隔是阳极和阴极信号之间的时间差较大的间隔 超过50 ns; 并且当半导体检测器收集数据时，根据最佳数据筛选间隔筛选和处理收集的数据。 本发明更好地克服了检测器的固有晶体缺陷，降低了背景噪声的影响，提高了碲化锌碲化镉检测器在室温下的能量分辨率，提高了峰 - 峰比。

    HIGH PURITY GERMANIUM DETECTOR
    5.
    发明申请
    HIGH PURITY GERMANIUM DETECTOR 有权

    公开(公告)号：US20210223416A1

    公开(公告)日：2021-07-22

    申请号：US16314048

    申请日：2018-12-11

    申请人： Tsinghua University ,  Nuctech Company Limited

    发明人： Yulan LI ,  Hong LI ,  Jianping CHANG ,  Zhi ZHANG ,  Jianmin LI

    IPC分类号： G01T1/24 ,  C30B29/08 ,  G01T1/36

    摘要： The present disclosure provides a high purity germanium detector. The high purity germanium detector includes: an array of high purity germanium crystal units including two or more high purity germanium crystal units, wherein, each of the two or more high purity germanium crystal units comprises a partial electrode on a side surface and/or a first top surface, and the electrodes on the side surfaces and/or the first top surfaces of the two or more high purity germanium crystal units are electrically connected together to form a first contact electrode of the high purity germanium detector; and each of the high purity germanium crystal units comprises a respective second contact electrode therein, such that the high purity germanium detector comprises two or more second contact electrodes.

    CT INSPECTION SYSTEM AND CT IMAGING METHOD
    6.
    发明申请
    CT INSPECTION SYSTEM AND CT IMAGING METHOD 审中-公开

    公开(公告)号：US20190204243A1

    公开(公告)日：2019-07-04

    申请号：US16234625

    申请日：2018-12-28

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    发明人： Kejun KANG ,  Jianmin LI ,  Xiulin NI ,  Yulan LI ,  Yuanjing LI ,  Zhiqiang CHEN ,  Li ZHANG ,  Liang LI ,  Xiang ZOU ,  Weifeng YU ,  Hejun ZHOU ,  Chunguang ZONG

    IPC分类号： G01N23/046

    CPC分类号： G01N23/046 ,  G01N2223/33 ,  G01V5/005

    摘要： The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device.

    SLOW NEUTRON CONVERSION BODY AND SLOW NEUTRON DETECTOR
    7.
    发明申请
    SLOW NEUTRON CONVERSION BODY AND SLOW NEUTRON DETECTOR 审中-公开

    公开(公告)号：US20170184735A1

    公开(公告)日：2017-06-29

    申请号：US15280106

    申请日：2016-09-29

    申请人： TSINGHUA UNIVERSITY ,  Nuctech Company Limited

    发明人： Yigang YANG ,  Yuanjing LI ,  Zhujun FANG ,  Yulan LI

    IPC分类号： G01T3/00

    CPC分类号： G01T3/008 ,  G01T3/00

    摘要： The present application, pertaining to the field of slow neutron detection, relates to a slow neutron converter and a slow neutron detector. The slow neutron converter includes a substrate, the substrate including a plurality of holes extending along a first direction and insulating walls between the plurality of holes, wherein the plurality of holes are through holes. The slow neutron converter further includes a boron layer at least covering an exposed surface of the plurality of holes. The slow neutron converter and the slow neutron detector having the slow neutron converter according to the present disclosure are capable of maintaining a high slow neutron detection efficiency. In addition, the manufacturing complexity and manufacturing cost of the detector are reduced, and thus the effective, convenient and low-cost slow neutron detection is achieved.

    VEHICLE-MOUNTED INSPECTION SYSTEM
    8.
    发明申请
    VEHICLE-MOUNTED INSPECTION SYSTEM 有权
    车辆安装检查系统

    公开(公告)号：US20160061989A1

    公开(公告)日：2016-03-03

    申请号：US14841991

    申请日：2015-09-01

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    发明人： Kejun KANG ,  Jingyu GU ,  Zhiqiang CHEN ,  Jianmin LI ,  Yuanjing LI ,  Yulan LI ,  Dongyu WANG

    IPC分类号： G01V5/00

    CPC分类号： G01V5/0066 ,  G01V5/0016

    摘要： A vehicle-mounted inspection system comprises: a chassis; a rotation mechanism disposed on the chassis; a first ray emission device connected to the rotation mechanism and configured to emit a ray; a first detection device connected to the rotation mechanism and configured to receive the ray emitted by the first ray emission device; and a second ray emission device connected to the rotation mechanism and configured to emit a ray. The rotation mechanism is configured to rotate the first ray emission device, the first detection device and the second ray emission device substantially around an upright axis between a retracted position and an operating position.

    摘要翻译： 车载检查系统包括：底盘; 设置在所述底盘上的旋转机构; 连接到所述旋转机构并被配置为发射光线的第一射线发射装置; 连接到所述旋转机构并被配置为接收由所述第一射线发射装置发射的射线的第一检测装置; 以及连接到所述旋转机构并被配置为发射光线的第二射线发射装置。 旋转机构构造成使第一射线发射装置，第一检测装置和第二射线发射装置基本上在缩回位置和操作位置之间的直立轴线周围旋转。