Memory controller and memory access control method

    公开(公告)号:US12001691B2

    公开(公告)日:2024-06-04

    申请号:US17702624

    申请日:2022-03-23

    Inventor: Kazuhito Tanaka

    Abstract: A memory controller controls access to a Synchronous Dynamic Random Access Memory (SDRAM) including banks. The memory controller includes: a receiver that receives a memory access request from an access master; a selector that selects one of a first issue mode and a second issue mode each related to command issuing; and an issuer that issues a command sequence to the SDRAM in response to the memory access request, in accordance with the one of the first issue mode and the second issue mode which is selected by the selector. The first issue mode is a mode in which an activation command for activating a bank among the banks is issued in continuous clock cycles without dividing the activation command, the activation command being included in the command sequence. The second issue mode is a mode in which the activation command is divided and issued in non-continuous clock cycles.

    Semiconductor memory device, memory controller, and error notification method

    公开(公告)号:US11468961B2

    公开(公告)日:2022-10-11

    申请号:US16921255

    申请日:2020-07-06

    Abstract: A semiconductor memory device includes a data bus terminal group for outputting read data to an external device or inputting write data from an external device, a first terminal from or into which 1-bit data is output or input, a DBI circuit that executes a Data Bus Inversion (DBI) function, an error detection circuit that detects an internal error, and an information superimposing circuit that superimposes predetermined output information onto the 1-bit data to be output from the first terminal and the read data to be output from the data bus terminal group. The predetermined output information includes first output information indicating whether or not an output bit pattern of the data bus terminal group is inverted, and second output information indicating whether or not an internal error has been detected by the error detection circuit.

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