-
公开(公告)号:US20160189757A1
公开(公告)日:2016-06-30
申请号:US14938221
申请日:2015-11-11
IPC分类号: G11C7/10 , G11C11/406
CPC分类号: G11C7/1072 , G11C11/406 , G11C11/40618 , G11C16/3431
摘要: In an embodiment, a memory controller may determine that one or more neighboring memory cells associated with a target memory cell in a memory device are to be refreshed. The controller may generate a command associated with refreshing the one or more neighboring memory cells. The controller may transfer the command from the memory controller to the memory device containing the target memory cell. The command may direct the memory device to refresh the neighboring memory cells and/or return one or more addresses associated with the neighboring memory cells.
摘要翻译: 在一个实施例中,存储器控制器可以确定与存储器件中的目标存储器单元相关联的一个或多个相邻存储器单元将被刷新。 控制器可以生成与刷新一个或多个相邻存储器单元相关联的命令。 控制器可以将命令从存储器控制器传送到包含目标存储器单元的存储器件。 命令可以指示存储器设备刷新相邻存储器单元和/或返回与相邻存储器单元相关联的一个或多个地址。
-
公开(公告)号:US20140281203A1
公开(公告)日:2014-09-18
申请号:US13832278
申请日:2013-03-15
IPC分类号: G11C11/406
CPC分类号: G11C7/1072 , G11C11/406 , G11C11/40618 , G11C16/3431
摘要: In an embodiment, a memory controller may determine that one or more neighboring memory cells associated with a target memory cell in a memory device are to be refreshed. The controller may generate a command associated with refreshing the one or more neighboring memory cells. The controller may transfer the command from the memory controller to the memory device containing the target memory cell. The command may direct the memory device to refresh the neighboring memory cells and/or return one or more addresses associated with the neighboring memory cells.
摘要翻译: 在一个实施例中,存储器控制器可以确定与存储器件中的目标存储器单元相关联的一个或多个相邻存储器单元将被刷新。 控制器可以生成与刷新一个或多个相邻存储器单元相关联的命令。 控制器可以将命令从存储器控制器传送到包含目标存储器单元的存储器件。 命令可以指示存储器设备刷新相邻存储器单元和/或返回与相邻存储器单元相关联的一个或多个地址。
-
3.
公开(公告)号:US20120254699A1
公开(公告)日:2012-10-04
申请号:US13078226
申请日:2011-04-01
申请人: PAUL D. RUBY , Hanmant P. Belgal , Yogesh B. Wakchaure , Xin Guo , Scott E. Nelson , Svanhild M. Salmons
发明人: PAUL D. RUBY , Hanmant P. Belgal , Yogesh B. Wakchaure , Xin Guo , Scott E. Nelson , Svanhild M. Salmons
CPC分类号: H03M13/6325 , G06F11/1048 , G11C16/00 , G11C16/0483 , G11C16/3495 , G11C29/021 , G11C29/028 , G11C29/52 , G11C2029/0409 , G11C2029/0411 , H03M13/09 , H03M13/136 , H03M13/1505 , H03M13/1515 , H03M13/152 , H03M13/19
摘要: Embodiments of the invention describe a dynamic read reference voltage for use in reading data from non-volatile memory cells. In embodiments of the invention, the read reference voltage is calibrated as the non-volatile memory device is used. Embodiments of the invention may comprise of logic and or modules to read data from a plurality of non-volatile memory cells using a first read reference voltage level (e.g., an initial read reference voltage level whose value is determined by the non-volatile device manufacturer). An Error Checking and Correction (ECC) algorithm is performed to identify whether errors exist in the data as read using the first read reference voltage level. If errors in the data as read are identified, a pre-determined value is retrieved to adjust the first read reference voltage level to a second read reference voltage level.
摘要翻译: 本发明的实施例描述了用于从非易失性存储器单元读取数据的动态读取参考电压。 在本发明的实施例中,读取的参考电压被校准为使用非易失性存储器件。 本发明的实施例可以包括使用第一读取参考电压电平(例如,初始读取参考电压电平,其值由非易失性器件制造商确定的)从多个非易失性存储器单元读取数据的逻辑和/或模块 )。 执行错误检查和校正(ECC)算法以识别使用第一读取参考电压电平读取的数据中是否存在错误。 如果识别出读取的数据中的错误,则检索预定值以将第一读取参考电压电平调整到第二读取参考电压电平。
-
-