摘要:
A link simulation tool for simulating high-speed communications link systems is provided. Communications links may include link subsystems such as transmit (TX) circuitry, receive (TX) circuitry, oscillator circuits that provide reference clock signals to the TX and RX circuitry, and channels that link the TX and RX circuitry. The link simulation tool may model each of the subsystems using behavioral models. The behavioral models may include characteristic functions such as transfer functions, probability density functions, and eye characteristics. The link simulation tool may have a link analysis engine that is capable of performing two-dimensional (two-variable) convolution operations and in applying dual-domain (frequency-time) transformations on the characteristic functions provided by the behavioral models to simulate the performance of the link system. The link simulation tool may have an input screen that allows a user to specify desired link parameters and a data display screen that display simulated results.
摘要:
A link simulation tool for simulating high-speed communications link systems is provided. Communications links may include link subsystems such as transmit (TX) circuitry, receive (TX) circuitry, oscillator circuits that provide reference clock signals to the TX and RX circuitry, and channels that link the TX and RX circuitry. The link simulation tool may model each of the subsystems using behavioral models. The behavioral models may include characteristic functions such as transfer functions, probability density functions, and eye characteristics. The link simulation tool may have a link analysis engine that is capable of performing two-dimensional (two-variable) convolution operations and in applying dual-domain (frequency-time) transformations on the characteristic functions provided by the behavioral models to simulate the performance of the link system. The link simulation tool may have an input screen that allows a user to specify desired link parameters and a data display screen that display simulated results.
摘要:
An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.
摘要:
An IC that includes an eye viewer and a BER checker coupled to the eye viewer, where the BER checker receives a serial data signal from the eye viewer, is provided. In one implementation, the BER checker receives the serial data signal from the eye viewer without the serial data signal passing through a deserializer. In one implementation, the BER checker compares the serial data signal against a reference data signal to determine the BER for the serial data signal. In one implementation, the IC includes an IC core coupled to the eye viewer and the BER checker, where the BER checker is outside the IC core. In one implementation, the BER checker is a dedicated BER checker. In one implementation, the BER checker includes an exclusive OR gate, a programmable delay circuit coupled to the exclusive OR gate, and an error counter coupled to the exclusive OR gate.
摘要:
An integrated circuit (“IC”) may include circuitry for use in testing a serial data signal. The IC may include circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. The IC may also include circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. The IC may provide output signals indicative of results of its operations. The IC can operate in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.
摘要:
An IC that includes a jitter generator, where the jitter generator is integral with the IC and generates non-intrinsic jitter, is provided. In one implementation, the non-intrinsic jitter is used to measure a characteristic of the IC. In one implementation, the non-intrinsic jitter is used to test jitter tolerance of the IC. In yet another implementation, the non-intrinsic jitter is used to test another IC coupled to the IC that includes the jitter generator.
摘要:
One embodiment relates to a receiver circuit for multi-level amplitude signaling which includes at least three amplitude levels for each symbol period. The receiver circuit includes a peak detector, a reference voltage generator, and a comparator circuit. The peak detector is arranged to detect a peak voltage of the multi-level amplitude signal, and the reference voltage generator uses the peak voltage to generate multiple reference voltages. The comparator circuit uses the multiple reference voltages to detect an amplitude level of the multi-level amplitude signal. Other embodiments and features are also disclosed.
摘要:
An IC that includes an eye viewer and a BER checker coupled to the eye viewer, where the BER checker receives a serial data signal from the eye viewer, is provided. In one implementation, the BER checker receives the serial data signal from the eye viewer without the serial data signal passing through a deserializer. In one implementation, the BER checker compares the serial data signal against a reference data signal to determine the BER for the serial data signal. In one implementation, the IC includes an IC core coupled to the eye viewer and the BER checker, where the BER checker is outside the IC core. In one implementation, the BER checker is a dedicated BER checker. In one implementation, the BER checker includes an exclusive OR gate, a programmable delay circuit coupled to the exclusive OR gate, and an error counter coupled to the exclusive OR gate.
摘要:
Signal detection circuitry for a serial interface oversamples the input—i.e., samples the input multiple times per clock cycle—so that the likelihood of missing a signal is reduced. Sampling may be done with a regenerative latch which has a large bandwidth and can latch a signal at high speed. The amplitude threshold for detection may be programmable, particularly in a programmable device. Thus, between the use of a regenerative latch which is likely to catch any signal that might be present, and the use of oversampling to avoid the problem of sampling at the wrong time, the likelihood of failing to detect a signal is greatly diminished. Logic, such as a state machine, may be used to determine whether the samples captured s do or do not represent a signal. That logic may be programmable, allowing a user to set various parameters for signal detection.
摘要:
A programmable logic device integrated circuit (“PLD”) includes high-speed serial interface (“HSSI”) circuitry in addition to programmable logic circuitry. The HSSI circuitry includes multiple channels of nominal data-handling circuitry (typically including clock and data recovery (“CDR”) circuitry), and at least one channel of nominal clock management unit (“CMU”) circuitry (typically including phase-locked loop (“PLL”) circuitry or the like). To increase the flexibility with which the channels can be used, the nominal data-handling channels are equipped to alternatively perform CMU-type functions, and the nominal CMU channel is equipped to alternatively perform data-handling functions.