Abstract:
One feature pertains to a true random number generator that utilizes the settling time of a bit cell as an entropy source to generate random digital output values. The bit cell may be a static random access memory bit cell. The bit cell's settling time may be converted into a digital output using an analog to digital converter. A plurality of bit cells may serially couple to one another in a ring formation. The bit cell ring can then be enabled such that each bit cell of the plurality of bit cells achieves a settling value that activates the subsequent bit cell in the ring causing it to in turn reach a settling value, and so on. An output node of one of the bit cells in the ring can then be sampled using a flip-flop to generate a continuous stream of random bits.
Abstract:
One feature pertains to a true random number generator that utilizes the settling time of a bit cell as an entropy source to generate random digital output values. The bit cell may be a static random access memory bit cell. The bit cell's settling time may be converted into a digital output using an analog to digital converter. A plurality of bit cells may serially couple to one another in a ring formation. The bit cell ring can then be enabled such that each bit cell of the plurality of bit cells achieves a settling value that activates the subsequent bit cell in the ring causing it to in turn reach a settling value, and so on. An output node of one of the bit cells in the ring can then be sampled using a flip-flop to generate a continuous stream of random bits.
Abstract:
Aspects of the disclosure are directed to sensing integrated circuit (IC) Back End Of Line (BEOL) process corners. In one aspect, an apparatus for sensing IC BEOL process corners includes a ring oscillator including a plurality of ring oscillator stages configured to generate an output waveform with a frequency state; and a shield net circuit including a plurality of shield net stages corresponding to the plurality of ring oscillator stages, the shield net circuit having a toggle input. And, a method includes generating an output waveform with a frequency state using a ring oscillator that includes a plurality of ring oscillator stages; modifying a plurality of ring oscillator stage time delays through a coupling between a plurality of shield net stages and the plurality of ring oscillator stages; and selecting the frequency state using a toggle input of a shield net circuit which includes the plurality of shield net stages.
Abstract:
In certain aspects, a duty-cycle monitor includes a first oscillator, and a flop having a signal input, a clock input, and an output, wherein the signal input is coupled to an input of the duty-cycle monitor, and the clock input is coupled to the first oscillator. The duty-cycle monitor also includes a first counter having a count input, an enable input, and a count output, wherein the count input of the first counter is coupled to the first oscillator, and the enable input of the first counter is coupled to the output of the flop. The duty-cycle monitor also includes a second counter having a count input, an enable input, and a count output, wherein the count input of the second counter is coupled to the first oscillator, and the enable input of the second counter is coupled to the output of the flop.
Abstract:
A system includes a computer processor including N cores; and a plurality of device aging sensors, wherein each one of the plurality of device aging sensors is disposed within a respective core, the plurality of device aging sensors being configured to communicate core aging information with a core scheduler in the computer processor, wherein the core scheduler is configured to make a first set of M cores available to a thread scheduler and remaining cores of the N cores unavailable to the thread scheduler in a first time period in which the core aging information indicates that aging of the first set of M cores is below a threshold, and wherein the core scheduler is configured to make a second set of M cores available to the thread scheduler and remaining cores of the N cores unavailable to the thread scheduler in a second time period.
Abstract:
An integrated circuit (IC) including a first ring oscillator (RO) including a first set of cascaded stages, wherein each of the first set of cascaded stages comprises a first logic inverter, including: a first set of field effect transistors (FETs) coupled in parallel between a first voltage rail and a first intermediate node, wherein the first set of FETs include a set of gates coupled to an input of the first logic inverter; and a second set of FETs coupled in series between the first intermediate node and a second voltage rail, wherein the second set of FETs includes at least a first FET including a gate coupled to the input of the first logic inverter, and at least a second FET that is diode-connected in accordance with a first mode of operation.
Abstract:
Methods and systems for independently tracking NMOS device process variation and PMOS device process variation are described herein. In one embodiment, a method for tracking process variation includes measuring a frequency of an NMOS-based ring oscillator on a chip, and determining a threshold voltage or switching speed for NMOS transistors on the chip based on the measured frequency of the NMOS-based ring oscillator. The method also includes measuring a frequency of a PMOS-based ring oscillator on the chip, and determining a threshold voltage or switching speed for PMOS transistors on the chip based on the measured frequency of the PMOS-based ring oscillator.
Abstract:
An integrated circuit compensates for circuit aging by measuring the aging with an aging sensor and controlling a supply voltage based on the measured aging. The operating environment for the aging sensor can be set to reduce impacts of non-aging effects on the measured aging. For example, the operating environment can use a temperature inversion voltage. An initial aging measurement value which is the difference between an initial aged measurement and an initial unaged measurement can be stored on the integrated circuit. A core power reduction controller can use the measured aging and the stored initial aging measurement value to update a performance-sensor target value and then perform adaptive voltage scaling using the using the updated performance-sensor target value.