Abstract:
Techniques for resolving a metastable state in a synchronizer are described herein. In one embodiment, a circuit for resolving a metastable state in a synchronizer comprises a signal delay circuit coupled to a node of the synchronizer, wherein the signal delay circuit is configured to delay a data signal at the node to produce a delayed data signal, and a transmission circuit coupled to the signal delay circuit, wherein the transmission circuit is configured to couple the delayed data signal to the node after a delay from a first edge of a clock signal.
Abstract:
An integrated circuit element is disclosed having a memory device; a P-type semiconductor region including a first semiconductor device from a first memory port circuit coupled to the memory device and configured to enable access to the memory device when the first semiconductor device is activated; an N-type semiconductor region including a second semiconductor device from a second memory port circuit coupled to the memory device and configured to enable access to the memory device when the second semiconductor device is activated; and a plurality of signal lines distributed over the P-type and N-type semiconductor regions including a first memory port selection line coupled to allow the first semiconductor device to be activated; a second memory port selection line coupled to allow the second semiconductor device to be activated; and a clock signal line placed between the first memory port selection line and the second memory port selection line.
Abstract:
Techniques for resolving a metastable state in a synchronizer are described herein. In one embodiment, a circuit for resolving a metastable state in a synchronizer comprises a signal delay circuit coupled to a node of the synchronizer, wherein the signal delay circuit is configured to delay a data signal at the node to produce a delayed data signal, and a transmission circuit coupled to the signal delay circuit, wherein the transmission circuit is configured to couple the delayed data signal to the node after a delay from a first edge of a clock signal.
Abstract:
Aspects of the disclosure are directed to sensing integrated circuit (IC) Back End Of Line (BEOL) process corners. In one aspect, an apparatus for sensing IC BEOL process corners includes a ring oscillator including a plurality of ring oscillator stages configured to generate an output waveform with a frequency state; and a shield net circuit including a plurality of shield net stages corresponding to the plurality of ring oscillator stages, the shield net circuit having a toggle input. And, a method includes generating an output waveform with a frequency state using a ring oscillator that includes a plurality of ring oscillator stages; modifying a plurality of ring oscillator stage time delays through a coupling between a plurality of shield net stages and the plurality of ring oscillator stages; and selecting the frequency state using a toggle input of a shield net circuit which includes the plurality of shield net stages.