Quartz orientation for guided SAW devices

    公开(公告)号:US11742826B2

    公开(公告)日:2023-08-29

    申请号:US17530650

    申请日:2021-11-19

    申请人: Qorvo US, Inc.

    IPC分类号: H03H9/02 H03H3/10

    摘要: Guided Surface Acoustic Wave (SAW) devices with improved quartz orientations are disclosed. A guided SAW device includes a quartz carrier substrate, a piezoelectric layer on a surface of the quartz carrier substrate, and at least one interdigitated transducer on a surface of the piezoelectric layer opposite the quartz carrier substrate. The quartz carrier substrate includes an orientation that provides improved performance parameters for the SAW device, including electromechanical coupling factor, resonator quality factor, temperature coefficient of frequency, and delta temperature coefficient of frequency.

    Quartz orientation for guided SAW devices

    公开(公告)号:US11206007B2

    公开(公告)日:2021-12-21

    申请号:US16037259

    申请日:2018-07-17

    申请人: Qorvo US, Inc.

    IPC分类号: H03H9/02 H03H3/10

    摘要: Guided Surface Acoustic Wave (SAW) devices with improved quartz orientations are disclosed. A guided SAW device includes a quartz carrier substrate, a piezoelectric layer on a surface of the quartz carrier substrate, and at least one interdigitated transducer on a surface of the piezoelectric layer opposite the quartz carrier substrate. The quartz carrier substrate includes an orientation that provides improved performance parameters for the SAW device, including electromechanical coupling factor, resonator quality factor, temperature coefficient of frequency, and delta temperature coefficient of frequency.

    Wave apodization for guided SAW resonators

    公开(公告)号:US12107562B2

    公开(公告)日:2024-10-01

    申请号:US17521316

    申请日:2021-11-08

    申请人: Qorvo US, Inc.

    发明人: Shogo Inoue Hao Dong

    IPC分类号: H03H9/13 H03H9/145

    CPC分类号: H03H9/13 H03H9/14502

    摘要: An acoustic resonator includes a piezoelectric layer on a substrate and an interdigital electrode structure on the piezoelectric layer. The interdigital electrode structure includes a first bus bar, a second bus bar, a first set of electrode fingers, and a second set of electrode fingers. The first bus bar and the second bus bar extend parallel to one another along a length of the interdigital electrode structure. The first set of electrode fingers are coupled to the first bus bar and extend to a first apodization edge. The second set of electrode fingers are coupled to the second bus bar and extend to a second apodization edge. The first set of electrode fingers and the second set of electrode fingers are interleaved. At least one of the first apodization edge and the second apodization edge provides a wave pattern along the length of the interdigital electrode structure.

    High quality factor transducers for surface acoustic wave devices

    公开(公告)号:US12052011B2

    公开(公告)日:2024-07-30

    申请号:US17527375

    申请日:2021-11-16

    申请人: Qorvo US, Inc.

    摘要: The present disclosure relates to acoustic wave devices, and particularly to high quality factor (Q) transducers for surface acoustic wave (SAW) devices. An exemplary SAW device includes an interdigital transducer (IDT) between two reflective gratings to form a resonator. The resonator operates through shear horizontal mode acoustic waves, and therefore suppression of transverse modes (parallel to electrode fingers of the IDT) is desired. A piston mode can be formed in the resonator to suppress transverse modes, which may also increase energy leakage and result in a lower Q. A higher Q is achieved by adding a fast region at an end of one or more of the electrode fingers of the IDT.

    Guided SAW device
    6.
    发明授权

    公开(公告)号:US11750170B2

    公开(公告)日:2023-09-05

    申请号:US16952409

    申请日:2020-11-19

    申请人: Qorvo US, Inc.

    IPC分类号: H03H9/02 H03H9/145 H03H9/64

    摘要: A guided surface acoustic wave (SAW) device includes a substrate, a piezoelectric layer on the substrate, and a transducer on the piezoelectric layer. The substrate is silicon, and has a crystalline orientation defined by a first Euler angle (ϕ), a second Euler angle (θ), and a third Euler angle (ψ). The first Euler angle (ϕ), the second Euler angle (θ), and the third Euler angle (ψ) are chosen such that a velocity of wave propagation within the substrate is less than 6,000 m/s.

    METHODS FOR FABRICATION OF BONDED WAFERS AND SURFACE ACOUSTIC WAVE DEVICES USING SAME

    公开(公告)号:US20220352862A1

    公开(公告)日:2022-11-03

    申请号:US17857715

    申请日:2022-07-05

    申请人: Qorvo US, Inc.

    摘要: A method of fabricating a bonded wafer with low carrier lifetime in silicon comprises providing a silicon substrate having opposing top and bottom surfaces, modifying a top portion of the silicon substrate to reduce carrier lifetime in the top portion relative to the carrier lifetime in portions of the silicon substrate other than the top portion, bonding a piezoelectric layer having opposing top and bottom surfaces separated by a distance T over the top surface of the silicon substrate, and providing a pair of electrodes having fingers that are inter-digitally dispersed on a top surface of the piezoelectric layer, the electrodes comprising a portion of a Surface Acoustic Wave (SAW) device. The modifying and bonding steps may be performed in any order. The modified top portion of the silicon substrate prevents the creation of a parasitic conductance within that portion during operation of the SAW device.

    HIGH QUALITY FACTOR TRANSDUCERS FOR SURFACE ACOUSTIC WAVE DEVICES

    公开(公告)号:US20220149813A1

    公开(公告)日:2022-05-12

    申请号:US17527375

    申请日:2021-11-16

    申请人: Qorvo US, Inc.

    摘要: The present disclosure relates to acoustic wave devices, and particularly to high quality factor (Q) transducers for surface acoustic wave (SAW) devices. An exemplary SAW device includes an interdigital transducer (IDT) between two reflective gratings to form a resonator. The resonator operates through shear horizontal mode acoustic waves, and therefore suppression of transverse modes (parallel to electrode fingers of the IDT) is desired. A piston mode can be formed in the resonator to suppress transverse modes, which may also increase energy leakage and result in a lower Q. A higher Q is achieved by adding a fast region at an end of one or more of the electrode fingers of the IDT.

    WAVE APODIZATION FOR GUIDED SAW RESONATORS

    公开(公告)号:US20220140808A1

    公开(公告)日:2022-05-05

    申请号:US17521316

    申请日:2021-11-08

    申请人: Qorvo US, Inc.

    发明人: Shogo Inoue Hao Dong

    IPC分类号: H03H9/13 H03H9/145

    摘要: An acoustic resonator includes a piezoelectric layer on a substrate and an interdigital electrode structure on the piezoelectric layer. The interdigital electrode structure includes a first bus bar, a second bus bar, a first set of electrode fingers, and a second set of electrode fingers. The first bus bar and the second bus bar extend parallel to one another along a length of the interdigital electrode structure. The first set of electrode fingers are coupled to the first bus bar and extend to a first apodization edge. The second set of electrode fingers are coupled to the second bus bar and extend to a second apodization edge. The first set of electrode fingers and the second set of electrode fingers are interleaved. At least one of the first apodization edge and the second apodization edge provides a wave pattern along the length of the interdigital electrode structure.

    Bonded wafers and surface acoustic wave devices using same

    公开(公告)号:US10574203B2

    公开(公告)日:2020-02-25

    申请号:US15087225

    申请日:2016-03-31

    申请人: QORVO US, INC.

    摘要: A bonded wafer with low carrier lifetime in silicon comprises a silicon substrate having opposing top and bottom surfaces; a piezoelectric layer bonded over the top surface of the silicon substrate and having opposing top and bottom surfaces separated by a distance T; and a pair of electrodes having fingers that are inter-digitally dispersed on the top surface of the piezoelectric layer in a pattern having a center-to-center distance D between adjacent fingers of the same electrode, the electrodes comprising a portion of a Surface Acoustic Wave (SAW) device. A structure of the silicon in a top portion of the silicon substrate has been modified to reduce carrier lifetime and prevent the creation of a parasitic conductance within the top portion of the silicon substrate during operation of the SAW device.