SYSTEM AND METHOD FOR SCANNING A COMPONENT
    1.
    发明公开

    公开(公告)号:US20240361218A1

    公开(公告)日:2024-10-31

    申请号:US18647507

    申请日:2024-04-26

    Inventor: Akhil MULLOTH

    CPC classification number: G01N1/42 G01N23/046 G01N2223/3103 G01N2223/63

    Abstract: A method for scanning at least one component includes placing the at least one component inside a storage vessel; filling the storage vessel with a cryogenic material; cooling the at least one component; placing the storage vessel between an x-ray source and a detector of a CT scanner; generating, via the x-ray source, an x-ray cone beam after cooling of the component that passes through the storage vessel while the at least one component is disposed within the storage vessel; receiving the x-ray cone beam at the detector; and generating an x-ray image of the at least one component.

    METHOD FOR SCANNING A PART IN A SCANNING APPARATUS

    公开(公告)号:US20250004149A1

    公开(公告)日:2025-01-02

    申请号:US18754928

    申请日:2024-06-26

    Abstract: A method of scanning a part comprises setting software scanning parameters of a scanning apparatus to produce an image. Setting the software scanning parameters includes setting an output voltage to a maximum output value, for example 450 kV and setting an output current and a magnification so that a power/voxel ratio of the scanning apparatus is in a range of between 2 and 3, for instance, between 2.25 and 2.75. The method further comprises scanning the part.

    METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

    公开(公告)号:US20240219321A1

    公开(公告)日:2024-07-04

    申请号:US18536868

    申请日:2023-12-12

    Inventor: Akhil MULLOTH

    Abstract: There is provided a method for scanning of an object in a scanning apparatus. The method comprises placing the object into a jacket which surrounds the object or a part of the object to be scanned. The volume of the jacket surrounding the object is solid or filled with a filling material. The jacket is disposed on a support of the scanning apparatus, so that the jacket is positioned between an imaging beam emitting element and an imaging beam receiving element oppositely disposed to either side of the support. The support is rotatable relative to the emitting and receiving elements about an axis of rotation to allow creation of an image from projections each taken at a different relative angle of rotation. The method further comprises operating the scanning apparatus at the multiple relative angles of rotation to produce an image of the object.

    METHOD FOR SCANNING OF OBJECTS IN A SCANNING APPARATUS

    公开(公告)号:US20240219320A1

    公开(公告)日:2024-07-04

    申请号:US18536847

    申请日:2023-12-12

    Inventor: Akhil MULLOTH

    CPC classification number: G01N23/046 G01N2223/3306 G01N2223/63

    Abstract: There is provided a method for scanning of objects in a scanning apparatus. The method comprises disposing the objects on a support of the scanning apparatus, so that the objects are positioned between an imaging beam emitting element and an imaging beam receiving element oppositely disposed to either side of the support. The support is rotatable relative to the emitting and receiving elements about an axis of rotation to allow creation of an image from projections each taken at a different relative angle of rotation. The objects are positioned adjacent each other on the support in a configuration that reduces the variation in material thickness penetrated at the multiple relative angles of rotation. The method further comprises operating the scanning apparatus at the multiple relative angles of rotation to produce an image of the objects.

    METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

    公开(公告)号:US20240295509A1

    公开(公告)日:2024-09-05

    申请号:US18441577

    申请日:2024-02-14

    Inventor: Akhil MULLOTH

    Abstract: A method for scanning of an object in a scanning apparatus includes disposing the object and a complementary object on a support of the apparatus, so that the objects are positioned between an imaging beam emitting element and an imaging beam receiving element oppositely disposed to either side of the support. The support is rotatable relative to the emitting and receiving elements about an axis of rotation to allow creation of an image from projections each taken at a different relative angle. A volume of the complementary object is solid or filled with a filling material and the complementary object is configured to reduce the variation in imaging beam attenuation across the objects or the part to be scanned of the object at the multiple relative angles of rotation. The method includes operating the scanning apparatus at the multiple relative angles of rotation to produce an image of the object.

    METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

    公开(公告)号:US20240219319A1

    公开(公告)日:2024-07-04

    申请号:US18536834

    申请日:2023-12-12

    Inventor: Akhil MULLOTH

    CPC classification number: G01N23/046 G01N23/083 G01N2223/33 G01N2223/63

    Abstract: There is provided a method for scanning of an object in a scanning apparatus. The method comprises disposing the object on a support of the scanning apparatus, so that the object is positioned between an imaging beam emitting element and an imaging beam receiving element oppositely disposed to either side of the support. The support is rotatable relative to the emitting and receiving elements about an axis of rotation to allow creation of an image from projections each taken at a different relative angle of rotation. The object is positioned on the support so that a part to be scanned of the object is offset from the axis of rotation. The method further comprises operating the scanning apparatus at the multiple relative angles of rotation to produce an image of the offset object.

    METHOD OF IDENTIFYING NON-CONFORMANCE OF A COMPONENT

    公开(公告)号:US20240202912A1

    公开(公告)日:2024-06-20

    申请号:US18524040

    申请日:2023-11-30

    Inventor: Akhil MULLOTH

    Abstract: There is disclosed a method of identifying non-conformance of a manufactured component, the method comprising: performing a volumetric scan to generate a 3-dimensional (3D) image of a volume of space containing the component, the 3D image comprising a plurality of voxels, each voxel representing a sub-volume within the volume of space and assigned a voxel value relating to properties of the material in the sub-volume; generating a component histogram giving the frequency of each voxel value within the volume of space; and comparing the component histogram to a template histogram, and identifying differences between the component histogram and the template histogram, and based on the comparison, determining whether there is a defect in the component.

    METHOD OF SCANNING A COMPONENT
    9.
    发明公开

    公开(公告)号:US20240201109A1

    公开(公告)日:2024-06-20

    申请号:US18524081

    申请日:2023-11-30

    Inventor: Akhil MULLOTH

    CPC classification number: G01N23/046 G01N23/083 G01N2223/309

    Abstract: The present disclosure provides a method of scanning a component by computed tomography, the method comprising: providing the component having a first density; supporting the component in a scanning orientation using a support bed, the support bed comprising a granular material disposed in a container, the granular material having a second density lower than the first density; wherein supporting the component comprises at least partially embedding the component in the granular material. The method further comprises scanning the component in the scanning orientation by X-ray or gamma ray scanning to produce an image of the component.

    SURFACE OR INTERFACE DEFECT DETECTION
    10.
    发明申请

    公开(公告)号:US20190277778A1

    公开(公告)日:2019-09-12

    申请号:US16270152

    申请日:2019-02-07

    Abstract: A method of detecting defects on a surface or interface of a part is provided. The method includes: providing data from an X-ray scan of the part; processing the scan data to obtain an original 3D or 2D model of a surface or interface topology of the part; and filtering the original 3D or 2D model of the surface or interface topology to identify deviations from the expected surface or interface topology of the part. The identified deviations may be produced by surface or interface defects on the part.

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