公开(公告)号：US10509078B2

公开(公告)日：2019-12-17

申请号：US14926853

申请日：2015-10-29

Applicant: ROLLS-ROYCE PLC

Inventor： Sivakumar Nadarajan ,  Shantha Dharmasiri Gamini Jayasinghe ,  Amit Kumar Gupta ,  Chandana Jayampathi Gajanayake ,  Viswanathan Vaiyapuri

IPC: G01R31/40

Abstract: A method of assessing a condition of a multi-phase power system comprises the steps of: acquiring a voltage signal and a current signal for each phase of the multi-phase power system; calculating a product of the voltage signal for each phase of the multi-phase power system with one of the current signals such that the product is between a voltage signal for one phase and a current signal for a different phase for at least two of the products; summing the calculated products; and identifying the possible existence of a fault in the multi-phase power system based on a frequency analysis of the summed calculated products.

公开(公告)号：US20240192263A1

公开(公告)日：2024-06-13

申请号：US18523453

申请日：2023-11-29

Applicant: ROLLS-ROYCE PLC

Inventor： Mohamed Sathik MOHAMED HALICK ,  Sivakumar Nadarajan ,  Viswanathan Vaiyapuri ,  Amit K. Gupta

IPC: G01R31/27 ,  G01R31/26

CPC classification number: G01R31/27 ,  G01R31/2621

Abstract: A method of monitoring a health state of a power semiconductor device includes: receiving an initial transient voltage parameter relating to transient voltage of the power semiconductor device when turning on, when it is known to be unaged; receiving an initial transient current parameter relating to transient current of the power semiconductor device when turning on, when it is known to be unaged; determining an initial energy parameter, relating to initial turn-on switching energy or power of the power semiconductor device, when it is known to be unaged; receiving an operating transient voltage parameter relating to the transient voltage of the power semiconductor device in operation; receiving an operating transient current parameter relating to the transient current of the power semiconductor device in operation; determining an operating energy parameter; and determining the health state of the power semiconductor device based on the initial energy parameter and the operating energy parameter.

公开(公告)号：US20240192267A1

公开(公告)日：2024-06-13

申请号：US18523528

申请日：2023-11-29

Applicant: ROLLS-ROYCE PLC

Inventor： Mohamed Sathik MOHAMED HALICK ,  Prasanth Sundararajan ,  Viswanathan Vaiyapuri ,  Sivakumar Nadarajan

IPC: G01R31/28 ,  G01R31/26

CPC classification number: G01R31/2849 ,  G01R31/2642

Abstract: A method of monitoring health of a power semiconductor device includes: determining a steady state loading of the power semiconductor device; when it is determined that the power semiconductor device is under a steady state loading, monitoring a case temperature parameter relating to a temperature of the case of the power semiconductor device over a predetermined period, derive a normalised parameter from the monitored case temperature parameter and determine the health of the power semiconductor device based on the normalised parameter.