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公开(公告)号：US09459320B2
公开(公告)日：2016-10-04
申请号：US14573573
申请日：2014-12-17
Applicant: ROLLS-ROYCE PLC
Inventor： Vaiyapuri Viswanathan , Chandana Gajanayake , Amit Gupta , Sivakumar Nadarajan
CPC classification number: G01R31/343 , H02H7/065 , H02P9/00 , H02P9/102 , H02P11/00
Abstract: A method for detecting a fault in an exciter circuit, suitable for use in a brushless generator, the exciter circuit including (a) an exciter armature winding, having a plurality of armatures, arranged to generate a multiphase AC signal, each armature of the plurality of armatures providing a respective sub-signal component of the multiphase AC signal, and (b) a rectifier circuit for receiving the sub-signals via the respective armatures, the rectifier circuit comprising a plurality of components arranged to rectify the sub-signals to provide a rectified output signal, wherein the method includes the steps of: acquiring a respective operational sub-value for a first characteristic of each of at least two of the respective sub-signals; deriving an operational value indicative of a relationship between the acquired respective operational sub-values; determining whether a fault has occurred in the exciter circuit on the basis of the derived operational value.
Abstract translation: 一种用于检测适用于无刷发电机的励磁电路中的故障的方法，所述励磁电路包括（a）具有多个电枢的励磁机电枢绕组，所述多个电枢布置成产生多相交流信号，所述多个电枢 提供多相AC信号的相应子信号分量的电枢，以及（b）用于经由相应电枢接收子信号的整流电路，整流电路包括多个组件，其被布置成整流子信号以提供 整流输出信号，其中所述方法包括以下步骤：获取相应子信号中的至少两个中的每一个的第一特性的相应运算子值; 导出指示所获取的各个操作子值之间的关系的操作值; 基于导出的操作值来确定励磁电路中是否发生故障。
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公开(公告)号：US10267860B2
公开(公告)日：2019-04-23
申请号：US14626026
申请日：2015-02-19
Applicant: ROLLS-ROYCE PLC
Inventor： Subash C Athikessavan , Sivakumar Nadarajan , Amit Kumar Gupta , Sanjib K Panda
IPC: G01R31/00 , G01R19/165 , G01R31/34 , G01R31/02 , G01R31/06
Abstract: A method of detecting a fault in an induction machine having one or more windings arranged to draw current at a supply frequency, the method including: performing a process of judging whether a respective sideband of one or more selected harmonics of the supply frequency exists at a predetermined fault frequency in a signal in the one or more windings; and determining that a fault has occurred if the judgement is positive; wherein in the judging process each of the selected harmonics of the supply frequency is a harmonic frequency of the supply frequency other than the supply frequency itself.
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公开(公告)号：US10082531B2
公开(公告)日：2018-09-25
申请号：US15347499
申请日：2016-11-09
Applicant: ROLLS-ROYCE plc
Inventor： Vaiyapuri Viswanathan , Sivakumar Nadarajan , Amit K. Gupta
IPC: G01R31/02 , H02P9/14 , G01R31/34 , H02P29/024
CPC classification number: G01R31/02 , G01R31/34 , H02P9/14 , H02P25/03 , H02P29/0241
Abstract: A rectifier diode failure detection apparatus for an electrical machine (10), the electrical machine (10) comprising an exciter armature winding (28a-c), a rotor main field winding (24) and first and second rectifiers (34a, 34b) arranged in parallel, each rectifier (34a, 34b) comprising at least first and second diodes (38a, 38b), each rectifier being configured to independently supply the rotor main field winding (24) with DC electrical current, the failure detection apparatus comprising:a controller (40) comprising at least two current sensors (42a, 42b), each current sensor (42a, 42b) being configured to measure output current (If1, If2) of a respective one of the rectifiers (34a, 34b), and the controller (40) being configured to determine a harmonic of the measured rectifier output currents; the controller (40) being further configured to determine a ratio of the magnitude of the first rectifier (34a) output current harmonic to the magnitude of the second rectifier (34b) output current harmonic, wherein the controller (40) is configured to determine that a fault has occurred in one of the rectifier diodes (38a, 38b) where the ratio exceeds a threshold value.
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公开(公告)号：US20240192267A1
公开(公告)日：2024-06-13
申请号：US18523528
申请日：2023-11-29
Applicant: ROLLS-ROYCE PLC
Inventor： Mohamed Sathik MOHAMED HALICK , Prasanth Sundararajan , Viswanathan Vaiyapuri , Sivakumar Nadarajan
CPC classification number: G01R31/2849 , G01R31/2642
Abstract: A method of monitoring health of a power semiconductor device includes: determining a steady state loading of the power semiconductor device; when it is determined that the power semiconductor device is under a steady state loading, monitoring a case temperature parameter relating to a temperature of the case of the power semiconductor device over a predetermined period, derive a normalised parameter from the monitored case temperature parameter and determine the health of the power semiconductor device based on the normalised parameter.
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公开(公告)号：US09910083B2
公开(公告)日：2018-03-06
申请号：US14573759
申请日：2014-12-17
Applicant: ROLLS-ROYCE PLC
Inventor： Vaiyapuri Viswanathan , Amit Kumar Gupta , Chandana Jayampathi Gajanayake , Sivakumar Nadarajan
CPC classification number: G01R31/2632 , G01R23/02 , G01R31/343 , G01R31/40 , H02H7/1255 , H02K11/20
Abstract: A method of detecting a diode fault in an AC signal rectifier circuit, the AC signal rectifier circuit including a plurality of diodes, and being arranged to supply a rectified output voltage to a load, wherein the method includes the steps of deriving an operating value indicative of the ratio of the voltage magnitudes of a first harmonic frequency and another harmonic frequency of the rectified output voltage across the load; and determining whether a fault has occurred in one or more diodes on the basis of the derived operating value. The first harmonic frequency is preferably the fundamental harmonic frequency, and/or the another harmonic frequency is preferably the 6th harmonic frequency.
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Patent Agency Ranking
公开(公告)号：US10509078B2
公开(公告)日：2019-12-17
申请号：US14926853
申请日：2015-10-29
Applicant: ROLLS-ROYCE PLC
Inventor： Sivakumar Nadarajan , Shantha Dharmasiri Gamini Jayasinghe , Amit Kumar Gupta , Chandana Jayampathi Gajanayake , Viswanathan Vaiyapuri
IPC: G01R31/40
Abstract: A method of assessing a condition of a multi-phase power system comprises the steps of: acquiring a voltage signal and a current signal for each phase of the multi-phase power system; calculating a product of the voltage signal for each phase of the multi-phase power system with one of the current signals such that the product is between a voltage signal for one phase and a current signal for a different phase for at least two of the products; summing the calculated products; and identifying the possible existence of a fault in the multi-phase power system based on a frequency analysis of the summed calculated products.
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公开(公告)号：US10408879B2
公开(公告)日：2019-09-10
申请号：US15705716
申请日：2017-09-15
Applicant: ROLLS-ROYCE plc
Inventor： Sivakumar Nadarajan , Amit K. Gupta , Vaiyapuri Viswanathan
Abstract: A method for diagnosing a fault condition in an electric machine includes measuring at least one physical parameter generated during operation of the electric machine; analyzing the or each measured parameter in a frequency domain; and determining whether the electric machine has a stator or rotor winding fault based on a comparison of an amplitude of the or each analyzed parameter at a first predetermined frequency and a first threshold amplitude for the first frequency. The at least one physical parameter includes a sound generated by the electric machine.
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公开(公告)号：US10338143B2
公开(公告)日：2019-07-02
申请号：US15653054
申请日：2017-07-18
Applicant: ROLLS-ROYCE plc
Inventor： Chandana J Gajanayake , Sivakumar Nadarajan , Amit K Gupta , Chao Bi , Nay Lin Htun Aung , Jiang Quan
Abstract: A fault condition is diagnosed in an electric machine that includes a rotor and a plurality of permanent magnets. To do so, the rotor is rotated so that each of the plurality of permanent magnets passes a magnetic flux density sensor, and the values of magnetic flux density are measured using the magnetic flux density sensor at a plurality of positions of the rotor. The measured values of magnetic flux density are analyzed and a magnitude of a peak amplitude is compared in a time or frequency domain with a reference value. If the peak amplitude is below the reference value, the electric machine is determined to have a fault condition.
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公开(公告)号：US09998062B2
公开(公告)日：2018-06-12
申请号：US15443991
申请日：2017-02-27
Applicant: ROLLS-ROYCE plc
Inventor： Sivakumar Nadarajan , Ellis F H Chong
IPC: H02H7/08 , H02P29/024 , H02K1/27 , H02K21/24
CPC classification number: H02P29/027 , H02K1/2793 , H02K1/28 , H02K7/10 , H02K21/026 , H02K21/028 , H02K21/029 , H02K21/24 , H02K2213/06 , H02K2213/09
Abstract: An axial flux permanent magnet machine including a pair of axially spaced first components. A second component positioned axially between and equidistant from the first components. Either the pair of first components or the second component is arranged to rotate about a shaft. A translation mechanism coupled to each of the first components. The translation mechanism configured to translate the first components axially away from the second component. Also a method of controlling an axial flux permanent magnet machine.
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公开(公告)号：US20240192263A1
公开(公告)日：2024-06-13
申请号：US18523453
申请日：2023-11-29
Applicant: ROLLS-ROYCE PLC
Inventor： Mohamed Sathik MOHAMED HALICK , Sivakumar Nadarajan , Viswanathan Vaiyapuri , Amit K. Gupta
CPC classification number: G01R31/27 , G01R31/2621
Abstract: A method of monitoring a health state of a power semiconductor device includes: receiving an initial transient voltage parameter relating to transient voltage of the power semiconductor device when turning on, when it is known to be unaged; receiving an initial transient current parameter relating to transient current of the power semiconductor device when turning on, when it is known to be unaged; determining an initial energy parameter, relating to initial turn-on switching energy or power of the power semiconductor device, when it is known to be unaged; receiving an operating transient voltage parameter relating to the transient voltage of the power semiconductor device in operation; receiving an operating transient current parameter relating to the transient current of the power semiconductor device in operation; determining an operating energy parameter; and determining the health state of the power semiconductor device based on the initial energy parameter and the operating energy parameter.
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