Process for total synthesis of pladienolide B and pladienolide D
    4.
    发明申请
    Process for total synthesis of pladienolide B and pladienolide D 失效
    丙二烯内酯B和普拉二烯内酯D的全合成方法

    公开(公告)号:US20080021226A1

    公开(公告)日:2008-01-24

    申请号:US11580047

    申请日:2006-10-13

    IPC分类号: C07D313/00 C07D303/02

    摘要: [Problems to be Solved]To provide an effective process for total synthesis of pladienolide B and pladienolide D having excellent anti-tumor activity and to provide useful intermediates in the above-described process. [Measure for Solving the Problem]A process for producing a compound represented by Formula (11): wherein P1, P7, P8, P9 and R1 are the same as defined below, characterized by including reacting a compound represented by Formula (12): wherein P7 means a hydrogen atom or a protecting group for hydroxy group; R1 means a hydrogen atom or a hydroxy group, with a compound represented by Formula (13): wherein P1 means a hydrogen atom or a protecting group for hydroxy group; P8 means a hydrogen atom, an acetyl group or a protecting group for hydroxy group; P9 means a hydrogen atom or a protecting group for hydroxy group; or P8 and P9 may form together a group represented by a formula: wherein R5 means a phenyl group which may have a substituent, in the presence of a catalyst.

    摘要翻译: [待解决的问题]为了提供具有优异的抗肿瘤活性的普拉二烯内酯B和普拉二烯内酯D的全合成的有效方法,并且在上述方法中提供有用的中间体。 [解决问题的措施]制备由式(11)表示的化合物的方法:其中P 1,P 2,P 3, ,其中P 9和R 12与下述定义相同,其特征在于包括使由式(12)表示的化合物:其中P 是指氢原子或羟基的保护基; R 1表示氢原子或羟基,与式(13)表示的化合物:其中P 1是氢原子或羟基的保护基; “8”表示氢原子,乙酰基或羟基保护基; “9”表示氢原子或羟基的保护基; 或者P 9和P 9可以一起形成由下式表示的基团:其中R 5表示可以具有取代基的苯基, 在催化剂存在下。

    METHOD OF PRODUCING BONDED WAFER
    10.
    发明申请
    METHOD OF PRODUCING BONDED WAFER 审中-公开
    生产粘结波形的方法

    公开(公告)号:US20100285655A1

    公开(公告)日:2010-11-11

    申请号:US12772840

    申请日:2010-05-03

    申请人: Takashi Sakai

    发明人: Takashi Sakai

    IPC分类号: H01L21/762

    CPC分类号: H01L21/76256

    摘要: In the production of a bonded wafer by bonding a silicon wafer for active layer with an internal oxide film to a silicon wafer for support layer directly or indirectly with an insulating layer to form a silicon wafer composite and removing an upperlayer-side silicon portion and the internal oxide film of the silicon wafer composite to leave only an active layer with a given thickness, the active layer forming step is conducted only by polishing under given conditions.

    摘要翻译: 在通过将绝缘层直接或间接地将用于有源层的硅晶片与内部氧化膜结合到用于支撑层的硅晶片来制造接合晶片以形成硅晶片复合材料并去除上层侧硅部分和 硅晶片复合体的内部氧化物膜仅留下具有给定厚度的活性层,有源层形成步骤仅通过在给定条件下的抛光进行。