公开(公告)号：US20180007301A1

公开(公告)日：2018-01-04

申请号：US15704997

申请日：2017-09-14

Applicant: Renesas Electronics Corporation

Inventor： Kazuhiro UEDA ,  Fukashi MORISHITA

IPC: H04N5/378 ,  H04N5/3745 ,  H04N5/347

CPC classification number: H04N5/378 ,  H04N5/347 ,  H04N5/37457

Abstract: A semiconductor device includes a pixel array including a plurality of pixels arranged in a matrix, each pixel including a first switch and a second switch, a scanning circuit, in a first mode, enabling a first signal to be output from the pixel by setting the first and second switches to “off” in a period before a first timing, enabling a second signal to be output from the pixel by setting only the first switch to “on” for a predetermined period from the first timing, and enabling a third signal to be output from the pixel by setting the first and second switches to “on” for a predetermined period from a second timing after the first timing, and a first AD (Analog/Digital) converter, in a second mode, capable of performing AD conversion by comparing the difference between the second signal and the first signal with a reference signal.

公开(公告)号：US20160248999A1

公开(公告)日：2016-08-25

申请号：US14962744

申请日：2015-12-08

Applicant: Renesas Electronics Corporation

Inventor： Kazuhiro UEDA ,  Fukashi MORISHITA

IPC: H04N5/378 ,  H04N5/372 ,  H04N5/374 ,  H04N5/369

CPC classification number: H04N5/378 ,  H04N5/347 ,  H04N5/37457

Abstract: The present invention is directed to solve a problem that, in an imaging element, complicated control is necessary for reading data for focus detection. A scanning circuit makes a first signal output from a pixel by setting first and second switches to “off” in a period before a first timing, makes a second signal output from the pixel by setting only the first switch to “on” for a predetermined period from the first timing, and makes a third signal output from the pixel by setting the first and second switches to “on” for a predetermined period from a second timing after the first timing. A first AD converter performs AD conversion by comparing the difference between the second signal and the first signal with a reference signal. A second AD converter performs AD conversion by comparing the difference between a third signal and the second signal with the reference signal.

Abstract translation: 本发明旨在解决在成像元件中需要复杂的控制来读取用于焦点检测的数据的问题。 扫描电路通过在第一定时之前的周期内将第一和第二开关设置为“关闭”来从像素输出第一信号，通过将第一开关仅设置为“接通”来预定第二信号，从而从第一定时输出第二信号 并且通过将第一和第二开关从第一定时之后的第二定时设置为“接通”一段预定时间段，从而从像素输出第三信号。 第一AD转换器通过用参考信号比较第二信号和第一信号之间的差来执行AD转换。 第二AD转换器通过将第三信号和第二信号之间的差与参考信号进行比较来执行AD转换。

公开(公告)号：US20150124138A1

公开(公告)日：2015-05-07

申请号：US14518073

申请日：2014-10-20

Applicant: Renesas Electronics Corporation

Inventor： Kazuhiro UEDA ,  Shunsuke OKURA ,  Fukashi MORISHITA

IPC: H04N5/3745 ,  H04N5/376

CPC classification number: H04N5/378 ,  H03M1/00 ,  H03M1/66 ,  H04N5/3575 ,  H04N5/37455 ,  H04N5/376

Abstract: Provided is a solid-state image sensing device that performs an A/D conversion operation at high speed. A sample-and-hold section 12 included in an A/D converter in a CMOS image sensor includes switches S1a and S1b and capacitor C1 that sample and hold a dark signal during each cycle period, switches S2a and S2b and capacitor C2 that sample and hold a bright signal during an odd-numbered cycle period, and switches S3a and S3b and capacitor C3 that sample and hold a bright signal during an even-numbered cycle period. While a bright signal is held with switch S2b placed in a conducting state, the next bright signal can be sampled by placing switch S3a in a conducting state.

Abstract translation: 提供一种以高速执行A / D转换操作的固态图像感测装置。 包括在CMOS图像传感器中的A / D转换器中的采样保持部分12包括开关S1a和S1b以及在每个周期期间采样和保持暗信号的电容器C1，开关S2a和S2b以及电容器C2， 在奇数周期期间保持亮信号，并且在偶数周期期间切换S3a和S3b以及采样并保持亮信号的电容器C3。 当开关S2b置于导通状态下保持亮信号时，可以通过将开关S3a置于导通状态来对下一个亮信号进行采样。