公开(公告)号：US5696591A

公开(公告)日：1997-12-09

申请号：US583345

申请日：1996-01-05

申请人： Robert B. Bilhorn ,  Paul Jacques Guiguizian

发明人： Robert B. Bilhorn ,  Paul Jacques Guiguizian

IPC分类号： G01N21/89 ,  G01N21/84 ,  G01N21/00 ,  H04N7/18 ,  H04N9/47

CPC分类号： G06T7/0004 ,  G01N21/8903 ,  G06T2207/30124

摘要： An optical inspection apparatus detects faults in a material coated on a moving web. Multiple cameras are positioned in an array across the width of the web transverse to the direction of the moving web. Each camera comprises a electronic camera and digital signal processor. An illumination source is preferably positioned to illuminate one side of the web. The camera array is positioned on the opposite side of the web aligned with the illumination source. The cameras in the array image the moving web along colas and collect image data from the web. The image is digitized and processed in real-time by averaging each column of image data to produce a profile of light intensity transmitted across the web width from which faults occurring in the longitudinal direction are detected in a host computer.

摘要翻译： 光学检查装置检测涂覆在移动幅材上的材料中的故障。 多个照相机沿着横向于移动幅材的方向的幅材的宽度定位在阵列中。 每个相机包括电子照相机和数字信号处理器。 照明源优选地定位成照亮幅材的一侧。 照相机阵列位于与照明源对准的纸幅的相对侧上。 阵列中的摄像机将可移动的网络图像化，并从网络上收集图像数据。 通过对每列图像数据进行平均来对图像进行数字化和处理，以产生在主机计算机中检测到在纵向方向上发生的故障的纸幅宽度上传输的光强度分布。

公开(公告)号：US07952073B2

公开(公告)日：2011-05-31

申请号：US12184995

申请日：2008-08-01

申请人： Robert B. Bilhorn ,  Mark H. Ellisman

发明人： Robert B. Bilhorn ,  Mark H. Ellisman

IPC分类号： G21K7/00

CPC分类号： H01J37/244 ,  H01J37/26 ,  H01J2237/043 ,  H01J2237/15 ,  H01J2237/2441 ,  H01J2237/2443 ,  H01J2237/24455 ,  H01J2237/2447

摘要： An apparatus for use with an electron beam for imaging a sample. The apparatus has a down-conversion detector configured to detect an electron microscopy signal generated by the electron beam incident on the sample, a direct bombardment detector adjacent to the down-conversion detector and configured to detect the electron microscopy signal, and a mechanism selectively exposing the down-conversion detector and the direct bombardment detector to the electron microscopy signal. A method using the apparatus is also provided.

摘要翻译： 一种用于电子束用于成像样品的装置。 该装置具有下变换检测器，其被配置为检测由入射在样品上的电子束产生的电子显微镜信号，与下变频检测器相邻的直接轰击检测器，并且被配置为检测电子显微镜信号，以及选择性地暴露 下转换检测器和直接轰击检测器到电子显微镜信号。 还提供了使用该装置的方法。

公开(公告)号：US5548120A

公开(公告)日：1996-08-20

申请号：US339052

申请日：1994-11-14

申请人： H. Galen Parker ,  Robert B. Bilhorn ,  Martin C. Kaplan ,  Russell J. Palum

发明人： H. Galen Parker ,  Robert B. Bilhorn ,  Martin C. Kaplan ,  Russell J. Palum

IPC分类号： G01N21/84 ,  G01N21/89 ,  G01N21/892 ,  G03C1/74 ,  F21V7/00 ,  F21V7/04

CPC分类号： G01N21/8916 ,  G01N21/8901 ,  G01N2021/8908

摘要： A highly uniform infrared illumination source for illuminating a stripe of a moving sensitized web for line scan imaging of imperfections in the coating on the web by a CCD imaging camera. A light integrator having an elongated housing formed with side and end walls defines a linear light integrating cavity having diffusely reflecting interior wall surfaces. An elongated array of infrared LEDs is spaced along the side wall for emitting light into the cavity for integration within the cavity. A longitudinally extending slit is formed in the side wall through which a diffuse, linear light beam exits the elongated slit having a varying longitudinal intensity profile. The intensity of the light emitted by the LEDs is modulated in an intensity pattern that alters the varying longitudinal intensity profile of the linear light beam to provide a desired longitudinal intensity profile of the stripe of diffuse illumination. Preferably, the intensity modulation renders more uniform the longitudinal intensity profile of the linear light beam illuminating the web as viewed by the imaging camera. The desired light intensity profile along the length of the emitted light beam is achieved by clustering the LEDs with LED drive circuits operated at different drive currents as a function of a set point control signal appropriate to the characteristics of the imaging camera and a transmitted light intensity feedback signal to maintain the intensity pattern of the LEDs and the uniform intensity profile as viewed by the imaging camera regardless of the optical density of the web.

摘要翻译： 一种高度均匀的红外照明光源，用于照射移动敏化纤维网的条纹，用于通过CCD成像相机对卷材上的涂层中的缺陷进行线扫描成像。 具有形成有侧壁和端壁的细长壳体的光积分器限定具有漫反射内壁表面的线性光积分腔。 红外LED的细长阵列沿着侧壁间隔开，用于将光发射到空腔中以在腔内积分。 在侧壁中形成纵向延伸的狭缝，通过该侧壁，漫射的线性光束通过该狭缝从具有变化的纵向强度分布的细长狭缝离开。 由LED发射的光的强度以改变线性光束的变化的纵向强度分布的强度图案调制，以提供漫射照明条的期望的纵向强度分布。 优选地，强度调制使由成像照相机观察到的照射纤维网的线性光束的纵向强度分布更均匀。 沿着发射光束的长度的期望的光强度分布通过将LED与以不同驱动电流操作的LED驱动电路聚类来实现，该LED驱动电路作为适合于成像相机的特性的设定点控制信号和透射光强度 反馈信号以维持LED的强度图案和由成像摄像机观察的均匀强度分布，而与幅材的光密度无关。

公开(公告)号：US20100237252A1

公开(公告)日：2010-09-23

申请号：US12408586

申请日：2009-03-20

申请人： Liang Jin ,  Robert B. Bilhorn ,  Xuong Nguyen-Huu

发明人： Liang Jin ,  Robert B. Bilhorn ,  Xuong Nguyen-Huu

IPC分类号： G01T1/24

CPC分类号： H01J37/244 ,  H01J37/26 ,  H01J2237/2441 ,  H01J2237/24455 ,  H01J2237/24495 ,  H01L27/14659 ,  H04N5/32 ,  H04N5/3205

摘要： A method of high-energy particle imaging by individual particle counting with an active pixel direct bombardment detector. The method includes the step of providing an active pixel direct bombardment detector including an array of pixels. Each pixel is characterized by a reset time constant. The method further includes sampling the pixel voltage of each pixel at a first time. The method further includes applying a pixel reset voltage to each pixel for a reset time interval less than the reset time constant. The method further includes sampling the pixel voltage of each pixel at a second time. The method further includes computing a difference between the sampled pixel voltages at the first and second times. The sampling and the applying of the reset voltage may be periodic. A direct bombardment detector is also provided.

摘要翻译： 用有源像素直接轰击检测器通过单个粒子计数的高能粒子成像的方法。 该方法包括提供包括像素阵列的有源像素直接轰击检测器的步骤。 每个像素的特征在于复位时间常数。 该方法还包括在第一时间对每个像素的像素电压进行采样。 该方法还包括在小于复位时间常数的复位时间间隔中对每个像素应用像素复位电压。 该方法还包括在第二时间对每个像素的像素电压进行采样。 该方法还包括计算第一次和第二次采样的像素电压之间的差异。 复位电压的采样和施加可以是周期性的。 还提供直接轰击检测器。

公开(公告)号：US07851764B2

公开(公告)日：2010-12-14

申请号：US12408586

申请日：2009-03-20

申请人： Liang Jin ,  Robert B. Bilhorn ,  Xuong Nguyen-Huu

发明人： Liang Jin ,  Robert B. Bilhorn ,  Xuong Nguyen-Huu

IPC分类号： G01T1/24

CPC分类号： H01J37/244 ,  H01J37/26 ,  H01J2237/2441 ,  H01J2237/24455 ,  H01J2237/24495 ,  H01L27/14659 ,  H04N5/32 ,  H04N5/3205

摘要： A method of high-energy particle imaging by individual particle counting with an active pixel direct bombardment detector. The method includes the step of providing an active pixel direct bombardment detector including an array of pixels. Each pixel is characterized by a reset time constant. The method further includes sampling the pixel voltage of each pixel at a first time. The method further includes applying a pixel reset voltage to each pixel for a reset time interval less than the reset time constant. The method further includes sampling the pixel voltage of each pixel at a second time. The method further includes computing a difference between the sampled pixel voltages at the first and second times. The sampling and the applying of the reset voltage may be periodic. A direct bombardment detector is also provided.

摘要翻译： 用有源像素直接轰击检测器通过单个粒子计数的高能粒子成像的方法。 该方法包括提供包括像素阵列的有源像素直接轰击检测器的步骤。 每个像素的特征在于复位时间常数。 该方法还包括在第一时间对每个像素的像素电压进行采样。 该方法还包括在小于复位时间常数的复位时间间隔中对每个像素应用像素复位电压。 该方法还包括在第二时间对每个像素的像素电压进行采样。 该方法还包括计算第一次和第二次采样的像素电压之间的差异。 复位电压的采样和施加可以是周期性的。 还提供直接轰击检测器。

公开(公告)号：US20100025579A1

公开(公告)日：2010-02-04

申请号：US12184995

申请日：2008-08-01

申请人： Robert B. Bilhorn

发明人： Robert B. Bilhorn

IPC分类号： G01N23/00

CPC分类号： H01J37/244 ,  H01J37/26 ,  H01J2237/043 ,  H01J2237/15 ,  H01J2237/2441 ,  H01J2237/2443 ,  H01J2237/24455 ,  H01J2237/2447

摘要： An apparatus for use with an electron beam for imaging a sample. The apparatus has a down-conversion detector configured to detect an electron microscopy signal generated by the electron beam incident on the sample, a direct bombardment detector adjacent to the down-conversion detector and configured to detect the electron microscopy signal, and a mechanism selectively exposing the down-conversion detector and the direct bombardment detector to the electron microscopy signal. A method using the apparatus is also provided.

摘要翻译： 一种用于电子束用于成像样品的装置。 该装置具有下变换检测器，其被配置为检测由入射在样品上的电子束产生的电子显微镜信号，与下变频检测器相邻的直接轰击检测器，并且被配置为检测电子显微镜信号，以及选择性地暴露 下转换检测器和直接轰击检测器到电子显微镜信号。 还提供了使用该装置的方法。

公开(公告)号：US06424093B1

公开(公告)日：2002-07-23

申请号：US09684193

申请日：2000-10-06

申请人： Jose M. Mir ,  Lee W. Tutt ,  Robert B. Bilhorn ,  Myron W. Culver

发明人： Jose M. Mir ,  Lee W. Tutt ,  Robert B. Bilhorn ,  Myron W. Culver

IPC分类号： G09G312

CPC分类号： H01L27/3239 ,  G09F9/30 ,  G09F13/22 ,  H01L27/3211 ,  H01L51/5012 ,  H01L51/5203

摘要： An organic electroluminescent display device that displays a preformed image includes spaced anode and cathode electrodes, organic electrically conductive hole transport layer and electron transport layer disposed between the anode and cathode electrodes, and a preformed image layer formed between the organic electrically conductive hole transport layer and electron transport layers such layer having a region that is preformed to have at least one preformed image such that when a voltage is applied across the anode and cathode electrodes which will cause a preformed image to be displayed. Voltages are applied across the anode and cathode electrodes of the organic electroluminescent display device causes the emission of light for viewing the preformed image.

摘要翻译： 显示预成形图像的有机电致发光显示装置包括间隔开的阳极和阴极电极，设置在阳极和阴极之间的有机导电空穴传输层和电子传输层，以及形成在有机导电空穴传输层和 电子传输层，其具有预成形为具有至少一个预成形图像的区域，使得当跨越阳极和阴极电极施加电压时，将导致预成形图像显示。 电压施加在有机电致发光显示装置的阳极和阴极电极之间，导致发射光以观察预成形图像。

公开(公告)号：US5173748A

公开(公告)日：1992-12-22

申请号：US803232

申请日：1991-12-05

申请人： Robert B. Bilhorn

发明人： Robert B. Bilhorn

IPC分类号： G01J3/28

CPC分类号： G01J3/2803 ,  G01J2003/2893

摘要： A spectrometer using a CCD array in the time-delay integration mode is claimed. The spectrometer comprises a CCD having a plurality of charged-coupled devices disposed along a scan dimension which terminates at an output end of the CCD. Each device produces an electronic charge in response to electromagnetic radiation incident thereon. A monochromator, optically aligned with the CCD, has a diffraction grating which generates a plurality of spectral beams from an external source of electromagnetic radiation. The diffraction grating is movably mounted to sequentially scan the plurality of spectral beams. A control unit, coupled to the monochromator, controls the scanning operation of the diffraction grating and determines a scan rate for the spectral beams. The spectral beams are scanned along the scan dimension of the CCD during the scanning operation. A clock source, coupled to the CCD, sequentially shifts the electronic charge from one charge-coupled device to another along the scan dimension of the CCD at a shift rate substantially equal to the scan rate of the spectral beams. A serial shift register, coupled to the output, end of the CCD, accumulates the electronic charge as it is shifted to the output end of the CCD. An output amplifier, coupled to the shift register, produces a video signal from the electronic charge accumulated in the serial shift register. Each produced video signal represents an intensity value for a respective spectral beams.

摘要翻译： 要求使用在时间延迟积分模式中使用CCD阵列的光谱仪。 光谱仪包括具有沿着扫描尺寸设置的多个电荷耦合器件的CCD，其终止于CCD的输出端。 每个设备响应于入射到其上的电磁辐射产生电子电荷。 与CCD光学对准的单色仪具有从外部电磁辐射源产生多个光束的衍射光栅。 衍射光栅可移动地安装以顺序地扫描多个光谱束。 耦合到单色仪的控制单元控制衍射光栅的扫描操作并确定光谱束的扫描速率。 在扫描操作期间，沿CCD的扫描尺寸扫描光束。 耦合到CCD的时钟源以基本上等于分光束的扫描速率的移位速率沿着CCD的扫描尺寸顺序地将电荷从一个电荷耦合器件移位到另一个。 耦合到CCD的输出端的串行移位寄存器，当它移动到CCD的输出端时，累积电子电荷。 耦合到移位寄存器的输出放大器从累积在串行移位寄存器中的电子电荷产生视频信号。 每个产生的视频信号表示各个光谱束的强度值。