摘要:
A method, an apparatus, and a computer program are provided for sequentially determining parity of stored data. Because of the inherent instabilities that exist in most memory arrays, data corruption can be a substantial problem. Parity checking and other techniques are typically employed to counteract the problem. However, with parity checking and other techniques, there are tradeoffs. Time required to perform the parity check, for example, can cause system latencies. Therefore, to reduce latencies, a trusted register can be included into a memory system to allow for immediate access to one piece of trusted data. By being able to read one piece of trusted data, the system can overlap the parity checking and delivery of a location of data with the reading of the next location of data from the memory array. Hence, a full cycle of latency can be eliminated without the reduction of the clock frequency.
摘要:
A method and apparatus are provided for protecting electronic fuse (eFuse) information. A current balancing circuit is provided that maintains a constant current demand on the eFuse voltage supply that is sufficient to blow an eFuse. Normally the constant current is applied to a semiconductor core. When an eFuse is being blown, the constant current is diverted away from the core to the eFuse and as the eFuse blows, the constant current is again dumped to the semiconductor core. Thus, a change in current due to the transient of the eFuse being blown is not detectable and the information that an eFuse has been blown is kept secure.
摘要:
A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets.A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.
摘要:
A virtual electronic fuse (VEF) apparatus and methodology are disclosed that permit the state of an electronic fuse to change from an un-blown state to a blown state and then back to a virtual un-blown state. In one embodiment, the electronic fuse may change from the virtual un-blown state back again to a virtual blown state. The fuse apparatus includes multiple VEFs, each VEF exhibiting a respective address. The fuse apparatus also includes an address pool including multiple address pool locations. A fuse programmer stores an address of one of the VEFs in one or more address pool locations to indicate one or more state changes for a particular VEF. The fuse programmer may also store different VEF addresses in different address pool locations to indicate state changes for different VEFs.
摘要:
A method and implementing system are provided for determining and retaining an identification number relevant to an electronic system component and/or component configuration. In an exemplary embodiment, existing pull-up resistors within a computer system are connected in a manner to enable associated circuitry to determine a pre-assigned identification number for the computer system. The identification number is stored in an identification number register and accessible for providing the identification number in response to a requests from other devices within the system.
摘要:
A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets.A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.
摘要:
An apparatus, a method, and a computer program product are provided for identifying signals in analogue electrical systems. The ID select signals that control the timing of this signal identification circuit comprise sequential numbers that count up and identify a corresponding signal. The signals to be identified are located on a group of input/output (I/O) pins. One multiplexer (first) selects a specific I/O pin in response to the ID select signals. An isolated voltage source is connected to this multiplexer and provides the selected signal to another multiplexer (second). The second multiplexer switches from this isolated voltage source to ground potential in response to the ID select signals. The isolated voltage source floats at the DC level of the selected I/O driver pin. Therefore, by connecting to the selected signal's I/O pin and the output of the second multiplexer, the selected signal can be identified and then probed.
摘要:
In one aspect of the invention, a method for testing includes interposing a tester between first and second logic. The first logic and second logic have respective first and second output drivers. The tester operates in test cycles to detect dynamic contention responsive to a signal asserted by the first driver during one of the test cycles and a signal asserted by the second driver during an immediately succeeding one of the test cycles. Static contention is detected responsive to a signal asserted by the first driver during one of the test cycles and a signal asserted by the second driver during the same one of the test cycles.
摘要:
An apparatus and method for memory bus tuning are implemented. A plurality of drivers having a plurality of selectable drive levels are coupled to a memory bus. The memory bus is connected to a memory device which may have a variable amount of memory, which may be in the form of dual-in-line memory modules (DIMM). A drive level is selected in response to a determination of the amount of memory included in the memory device. A register operable for receiving a data value corresponding to the amount of memory is coupled to the drivers, the drive level being selected thereby.
摘要:
A method of passing transmissions through an error-correction code (ECC) block in a communications path of a computer system. The communications path interconnects a first component of the computer system (such as a random-access memory (RAM) device) and a second component of the computer system (such as a central processing unit (CPU)) using a first granularity, and a third component (such as a read-only memory (ROM) device) is further connected to the communications path such that the third component may transmit data to the second component using a second granularity which is smaller than the first granularity. The data from the third component passes through the ECC block by merging data from the third component with predefined data to present a merged data word to the ECC circuit, wherein the merged data word has the first granularity. The first granularity may be, e.g., 72 bits, while the second granularity is 8 bits. The undriven check bits and undriven data bits are preferably forced to the predefined state using a plurality of respective pull-up resistors.